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Apparatus for inspecting light emitting diode package and inspecting method using the same

  • US 8,890,533 B2
  • Filed: 12/01/2010
  • Issued: 11/18/2014
  • Est. Priority Date: 12/01/2009
  • Status: Active Grant
First Claim
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1. An apparatus for inspecting a light emitting diode (LED) package, the apparatus comprising:

  • an inspection unit configured to inspect a plurality of LEDs through a visual inspection to determine whether or not the plurality of LEDs are defective; and

    a defective product rejection unit including a punching pin and a discharge hole, the defective product rejection unit being configured to cause the punching pin to punch a defective LED determined to be defective on the basis of inspection results from the inspection unit among the plurality of LEDs supplied from the inspection unit and discard the defective LED punched by the punching pin into the discharge hole,wherein the plurality of LEDs are arranged in a plurality of rows and a plurality of columns to configure an LED aggregate connected in the form of an array, andthe defective product rejection unit comprises;

    a punching head driven to ascend or descend;

    a plurality of punching pins arranged to correspond to the positions of the plurality of LEDs arranged in unit areas of the LED aggregate supplied by a certain number of rows in a column direction of the array, installed on the punching head so as to be driven to ascend or descend, and maintained to be selectively protruded over the defective LED among the plurality of LEDs in the unit areas when the punching head performs a punching operation; and

    a punching support supporting the LED aggregate at a lower side of the plurality of punching pins and including the plurality of discharge holes into which the punching pins lowered while being maintained in the protruded state are inserted to discharge the defective LED punched by the punching pin.

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