Efficient modulated imaging

• US 8,892,192 B2
• Filed: 11/07/2013
• Issued: 11/18/2014
• Est. Priority Date: 11/07/2012
• Status: Active Grant

• Current Assignee: Modulated Imaging, Inc.
• Original Assignee: Modulated Imaging, Inc.
• Inventors: Cuccia, David, Mazhar, Amaan
• Primary Examiner(s): MEHTA, PARIKHA SOLANKI
• Application Number:
  US14/074,368
• Publication Number:
  US 20140128744A1
• Time in Patent Office: 376 Days
• Field of Search: None
• US Class Current: 600/476
• CPC Class Codes: A61B 5/0064 Body surface scanning
• CPC Class Codes: A61B 5/0071 by measuring fluorescence emission
• CPC Class Codes: A61B 5/0077 Devices for viewing the surface of the body, e.g. camera, magnifying lens

Abstract

An apparatus for turbid sample measurement comprising a plurality of light sources for illuminating a turbid sample target area with non-spatial structured light, a projection system for illuminating the turbid sample target area with spatial structured light, a sensor for collecting light from the turbid sample target area, and a processor to analyze the data captured by the sensor to yield scattering and absorption coefficients of the turbid sample. A method comprises illuminating the sample with spatial structured light, collecting light reflected from the sample at a number of wavelengths, illuminating the sample with non-spatial structured light, collecting light reflected from the sample at a number of wavelengths, and combining the measurements of the collected light to obtain the optical properties of the sample and/or the concentration of absorbing or fluorescent molecules. The wavelengths of the spatial and non-spatial light sources are preferably different.

Claims

1. An apparatus for the measurement of a turbid sample comprising

an illumination apparatus having a plurality of light sources configured to illuminate a target area of a turbid sample with planar light at a plurality of wavelengths,

a projection system configured to illuminate said target area of turbid sample with structured light at a plurality of wavelengths, wherein the illumination apparatus and the projection system have different optical projection paths,

a sensor configured to collect a plurality of wavelengths of planar light and a plurality of wavelengths of structured light remitted from the target area of the turbid sample, and

a processor configured to analyze data of the remitted planar and structured light collected by the sensor to determine the scattering and absorption coefficients of the turbid sample, wherein the plurality of wavelengths of the remitted planar light differ from the plurality of wavelengths of the remitted structured light.

2. An apparatus as in claim 1, wherein the plurality of light sources configured to illuminate the target area of the turbid sample with planar light are positioned about a periphery of a base of the illumination apparatus.

3. An apparatus as in claim 1, wherein the illumination apparatus comprises a light ring assembly.

4. An apparatus as in claim 3, wherein the light ring assembly includes a ring body with sockets formed about a periphery of the ring body, wherein the light sources are removably mounted within the sockets.

5. An apparatus as in claim 4, wherein the light sources comprise LED modules.

6. An apparatus as in claim 1, wherein the sensor is a camera.

7. An apparatus as in claim 1, wherein the sensor is positioned off axis to the illumination apparatus and the projection system.

8. An apparatus as in claim 1, wherein the light sources include a beam homogenizer.

9. An apparatus as in claim 1, wherein the beam homogenizer is an integrating rod.

10. An apparatus as in claim 1, wherein the projection system comprises a number of switchable light sources.

11. An apparatus as in claim 10, wherein the switchable light sources include LEDs having different wavelengths.

12. An apparatus as in claim 1, wherein the illumination apparatus is positioned off axis to the projection system.

13. A method for the measurement of a turbid sample comprising the steps of

illuminating a turbid sample with structured light,

collecting light reflected from the turbid sample to obtain remitted structured light of the turbid sample at a plurality of wavelengths, λ

_j,

illuminating the turbid sample with planar light,

collecting light reflected from the turbid sample to obtain remitted planar light of the sample at a plurality of wavelengths, λ

_k, wherein the plurality of wavelengths λ

_k of the remitted planar light differ from the plurality of wavelengths λ

_j of the remitted structured light,

and

combining measurements of the remitted structured light and the remitted planar lighted collected from the turbid sample and determining the scattering and absorption coefficients of the turbid sample.

14. A method as in claim 13, wherein determining the scattering and absorption coefficients of the turbid sample includes determining fit parameters of the turbid sample, wherein the fit parameters include one or more of the optical properties of the turbid sample at a number of wavelengths, λ

_j, and the concentration of absorbing or fluorescent molecules.

15. A method as in claim 13, wherein combining the measurements of the remitted structured light and the remitted planar lighted collected from the turbid sample is performed using a scattering function with a dependence of scattering on wavelength to interpolate or extrapolate measurements at discrete wavelengths λ

_j of remitted structured light collected from the turbid sample to obtain estimates for scattering at wavelengths λ

_k of remitted planar light collected from the turbid sample.

16. A method as in claim 15 wherein the scattering function is a power law function defined as μ

_s′

(λ

)=A₁*λ

<sup>−

b</sup>₁+A₂*λ

<sup>−

b</sup>_{2+ . . . +}A_n*λ

<sup>−

b</sup>_n, wherein n is less than or equal to 3.

17. A method as in claim 13 wherein the steps of illuminating a turbid sample with structured light and illuminating the turbid sample with planar light includes illuminating the turbid sample with light from an illumination apparatus having a plurality of light sources configured to illuminate a target area of a turbid sample with planar light and illuminating the turbid sample with light from a projection system configured to illuminate the target area of turbid sample with structured light, wherein the illumination apparatus is positioned off axis to the projection system.

18. A method as in claim 13 wherein the steps of collecting light reflected from the turbid sample includes collecting reflected light with a sensor, wherein the sensor is positioned off axis to the illumination apparatus and the projection system.

19. A method as in claim 17 wherein the plurality of light sources configured to illuminate the target area of the turbid sample with planar light are positioned about a periphery of a base of the illumination apparatus.

20. A method as in claim 17, wherein the illumination apparatus comprises a light ring assembly having a ring body with sockets formed about a periphery of the ring body, wherein the light sources are removably mounted within the sockets.