Calibration device

• US 8,892,383 B2
• Filed: 02/12/2009
• Issued: 11/18/2014
• Est. Priority Date: 02/12/2009
• Status: Active Grant

• Current Assignee: Mitsubishi Electric Corporation
• Original Assignee: Mitsubishi Electric Corporation
• Inventors: Hara, Rokuzo, Morita, Shinichi, Maniwa, Hisakazu
• Primary Examiner(s): Breene, John
• Assistant Examiner(s): HWANG, TIMOTHY
• Application Number:
  US13/132,416
• Publication Number:
  US 20110238355A1
• Time in Patent Office: 2,105 Days
• Field of Search: 702/104
• US Class Current: 702/104
• CPC Class Codes: H01Q 3/267 Phased-array testing or checking devices
• CPC Class Codes: H04B 17/21 for calibration; for correcting measurements
• CPC Class Codes: H04B 17/27 for locating or positioning the transmitter

Abstract

In a calibration device, a calibration matrix calculation processing part estimates a calibration matrix by using an orthogonal vector stored in an orthogonal vector storage part and an array mode vector stored in an array mode vector storage part. A calibration matrix output part transmits the calibration matrix computed by the calibration matrix calculation processing part to an unknown parameter estimation device.

Claims

1. A calibration device for calibrating observation data received by a plurality of sensors, the calibration device comprising:

an observation data vector generation processing part that receives the observation data from the plurality of sensors to generate an observation data vector from the received observation data;

a mode vector association processing part capable of calculating or storing in advance a mode vector corresponding to the observation data vector, and of calculating or storing in advance a Fourier coefficient for calculating an orthogonal vector to the mode vector; and

a calibration parameter calculating part that acquires the observation data vector from the observation data vector generation processing part, acquires the mode vector and the Fourier coefficient corresponding to the acquired observation data vector from the mode vector association processing part, calculates the orthogonal vector to the mode vector from the acquired mode vector and the acquired Fourier coefficient, and calculates a plurality of calibration parameters for calibrating an observation error included in the observation data vector from the calculated orthogonal vector and the observation data vector.

2. A calibration device according to claim 1,

wherein the calibration parameter calculating part calculates a calibration matrix, which includes the plurality of calibration parameters and is divided into a plurality of given matrixes in advance, and

wherein the calibration parameter calculating part repetitively estimates each of the plurality of given matrixes from a mutual relationship of the plurality of given matrixes, and estimates the calibration matrix by using the plurality of given matrixes which have been repetitively estimated.

3. A calibration device according to claim 1, further comprising a correlation matrix calculating part that calculates a correlation matrix of a plurality of pieces of observation data received by the plurality of sensors, and extracts a given matrix element included in the calculated correlation matrix,

wherein the calibration parameter calculating part corrects the observation data vector by using the given matrix element extracted by the correlation matrix calculating part.

4. A calibration device according to according to claim 2, further comprising a correlation matrix calculating part that calculates a correlation matrix of a plurality of pieces of observation data received by the plurality of sensors, and extracts a given matrix element included in the calculated correlation matrix,

wherein the calibration parameter calculating part corrects the observation data vector by using the given matrix element extracted by the correlation matrix calculating part.

5. A calibration device according to claim 1, wherein the observation data vector generation processing part generates the observation data vector based on a single signal of an angle parameter in the observation data.

6. A calibration device according to claim 1, wherein:

the plurality of sensors includes an array antenna; and

the calibration parameter calculating part calculates the plurality of calibration parameters for calibrating the observation error in an angle measuring device that uses the array antenna.

7. A calibration device according to claim 1, wherein:

the plurality of sensors includes a plurality of sensors that observe a plurality of frequencies; and

the calibration parameter calculating part calculates the plurality of calibration parameters for calibrating the observation error in a ranging device that uses the plurality of sensors that observe the plurality of frequencies.

8. A calibration device according to claim 1, wherein:

the plurality of sensors includes a plurality of polarization sensors; and

the calibration parameter calculating part calculates the plurality of calibration parameters for calibrating the observation error in an observation device that uses the plurality of polarization sensors.