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Top gate thin film transistor with multiple oxide semiconductor layers

  • US 8,901,552 B2
  • Filed: 09/07/2011
  • Issued: 12/02/2014
  • Est. Priority Date: 09/13/2010
  • Status: Active Grant
First Claim
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1. A semiconductor device comprising:

  • a first material film having a hexagonal crystal structure over an insulating surface;

    a second material film having a hexagonal crystal structure on and in contact with the first material film;

    a gate insulating layer over the second material film;

    an insulating layer over the gate insulating layer, the insulating layer comprising an opening portion; and

    a gate electrode layer over the insulating layer, the gate electrode layer being in contact with the gate insulating layer through the opening portion;

    wherein the second material film is thicker than the first material film.

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