Magnetostrictive sensor array for active or synthetic phased-array focusing of guided waves
First Claim
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1. A system, comprising:
- at least one strip of ferromagnetic material induced with a bias magnetic field coupled to a surface of a structure under test; and
a plurality of pulsing/receiving coil circuits aligned with a surface of the at least one strip of the ferromagnetic material,wherein the plurality of pulsing/receiving coil circuits are individually controllable by a number of channels to excite guided waves in the structure under test using at least one of active phased-array focusing or synthetic phased-array focusing of the guided waves.
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Abstract
A system includes at least one strip of ferromagnetic material and a plurality of pulsing/receiving coil circuits. The at least one strip of ferromagnetic material is induced with a bias magnetic field and is coupled to a surface of a structure under test. The plurality of pulsing/receiving coil circuits are aligned with a surface of the at least one strip of the ferromagnetic material. The plurality of pulsing/receiving coil circuits are individually controllable by a number of channels to excite guided waves in the structure under test using at least one of active phased-array focusing or synthetic phased-array focusing of the guided waves.
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Citations
20 Claims
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1. A system, comprising:
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at least one strip of ferromagnetic material induced with a bias magnetic field coupled to a surface of a structure under test; and a plurality of pulsing/receiving coil circuits aligned with a surface of the at least one strip of the ferromagnetic material, wherein the plurality of pulsing/receiving coil circuits are individually controllable by a number of channels to excite guided waves in the structure under test using at least one of active phased-array focusing or synthetic phased-array focusing of the guided waves. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. A non-destructive inspection method, comprising:
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inducing a bias magnetic field in a ferromagnetic material coupled to a surface of a test structure; individually addressing a plurality of channels to actuate a plurality of pulser/receiver coils disposed on the ferromagnetic material to generate guided waves in the test structure using at least one of active phased-array focusing or synthetic phased-array focusing of the guided waves; receiving a reflected signal at one of the plurality of pulser/receiver coils; and processing the reflected signal to identify if the test structure includes an irregularity along its longitudinal length. - View Dependent Claims (11, 12, 13, 14)
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15. A system, comprising:
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a ferromagnetic material coupled to a surface of a test piece, the ferromagnetic material having an induced bias magnetic field; a plurality of pulsing/receiving coil circuits distributed on the surface of the test piece and aligned to a surface of the ferromagnetic material; and a controller configured to individually control each of a plurality of channels each corresponding to at least one of the plurality of pulsing receiving coil circuits to excite guided waves in the test piece using at least one of active phased-array focusing or synthetic phased-array focusing of the guided waves. - View Dependent Claims (16, 17, 18, 19, 20)
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Specification