Model based simulation method with fast bias contour for lithography process check
First Claim
1. A method, comprising:
- receiving a target layout design having a geometric pattern thereon;
using a computing unit to apply a set of fast-bias contour (FBC) rules to the target layout design to provide an electronic photomask having FBC-edits that differentiate the electronic photomask from the target layout design, wherein the FBC rules are applied without previously applying optical proximity correction (OPC) to the target layout design; and
performing a lithography process check on the electronic photomask to determine whether a patterned integrated circuit layer, which is to be manufactured based on the electronic photomask, is expected to be in conformance with the geometric pattern of the target layout design;
wherein the lithography process check includes a Monte-Carlo process where a plurality of device parameters are randomly varied for a plurality of simulations to characterize how semiconductor devices are expected to be manufactured based on the electronic photomask, which includes the FBC-edits.
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Abstract
Integrated circuit design techniques are disclosed. In some methods, a target layout design having a geometric pattern thereon is received. A set of fast-bias contour (FBC) rules is applied to the target layout design to provide an electronic photomask having FBC-edits. The FBC-edits differentiate the electronic photomask from the target layout design, and the FBC rules are applied without previously applying optical proximity correction (OPC) to the target layout design. A lithography process check is performed on the electronic photomask to determine whether a patterned integrated circuit layer, which is to be manufactured based on the electronic photomask, is expected to be in conformance with the geometric pattern of the target layout design.
7 Citations
18 Claims
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1. A method, comprising:
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receiving a target layout design having a geometric pattern thereon; using a computing unit to apply a set of fast-bias contour (FBC) rules to the target layout design to provide an electronic photomask having FBC-edits that differentiate the electronic photomask from the target layout design, wherein the FBC rules are applied without previously applying optical proximity correction (OPC) to the target layout design; and performing a lithography process check on the electronic photomask to determine whether a patterned integrated circuit layer, which is to be manufactured based on the electronic photomask, is expected to be in conformance with the geometric pattern of the target layout design; wherein the lithography process check includes a Monte-Carlo process where a plurality of device parameters are randomly varied for a plurality of simulations to characterize how semiconductor devices are expected to be manufactured based on the electronic photomask, which includes the FBC-edits. - View Dependent Claims (2, 3, 4, 5)
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6. A method, comprising:
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receiving a target layout design having a geometric pattern thereon; using a computing unit to apply a set of fast-bias contour (FBC) rules to the target layout design to provide an electronic photomask having FBC-edits that differentiate the electronic photomask from the target layout design, wherein the FBC rules are applied without previously applying optical proximity correction (OPC) to the target layout design; performing a lithography process check on the electronic photomask to determine whether a patterned integrated circuit layer, which is to be manufactured based on the electronic photomask, is expected to be in conformance with the geometric pattern of the target layout design; setting a manufacturing yield criteria; determining whether a plurality of simulation results for the plurality of simulations, respectively, meet performance metrics specified for the target layout design; and providing a simulated yield result which specifies how many of the simulation results meet the performance metrics specified for the target layout design. - View Dependent Claims (7)
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8. A method, comprising:
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receiving a target layout design having multiple layers with multiple geometric patterns thereon; using a computing unit to identify instances of a first geometric shape on a first layer of the target layout design; using a computing unit to apply a set of fast-bias contour (FBC) rules to the identified instances of the first geometric shape to generate an electronic photomask having FBC-edits that differentiate the electronic photomask from the target layout design; performing a lithography process check on the electronic photomask to determine whether a patterned integrated circuit layer, which is to be manufactured based on the electronic photomask, is expected to be in conformance with the geometric pattern of the target layout design; wherein the FBC rules alter patterns for individual layers of the target layout design by using one of the following math functions;
a Hermite polynomial, a Bezier curve, a Lagrange polynomial, a Gaussian function, a divergence function, or a Bessel function. - View Dependent Claims (9, 10, 11, 12, 13, 14)
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15. A circuit simulation tool, comprising:
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a computing unit operably coupled to a memory unit via one or more busses; wherein the memory unit is configured to store digitized data representing a target layout design, computer executable lithography process check (LPC) instructions, computer executable fast-bias contour (FBC) instructions, and optical proximity correction (OPC) instructions; wherein the computing unit is configured to apply the FBC instructions on the target layout design to generate a photomask with FBC edits, and then apply the LPC instructions to determine whether a sufficient percentage of devices manufactured using the photomask are expected to operate at minimum performance metrics. - View Dependent Claims (16, 17, 18)
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Specification