High accuracy temperature sensor

• US 8,915,646 B2
• Filed: 03/30/2012
• Issued: 12/23/2014
• Est. Priority Date: 03/30/2012
• Status: Active Grant

• Current Assignee: Integrated Device Technology Incorporated (Renesas Electronics Corporation)
• Original Assignee: Integrated Device Technology Incorporated (Renesas Electronics Corporation)
• Inventors: Wei, Changming, Chen, Yonggang
• Primary Examiner(s): Caputo, Lisa
• Assistant Examiner(s): AHMED, NASIR UDDIN
• Application Number:
  US13/435,950
• Publication Number:
  US 20130259091A1
• Time in Patent Office: 998 Days
• Field of Search: 374169-172, 374/184, 341/143, 341/155, 341/110, 341/126, 341/140, 341/146, 341/77
• US Class Current: 374/178
• CPC Class Codes: G01K 7/34 using capacitative elements capacitors per se H01G

Abstract

Temperature accuracy is improved, conversion gain is increased without increasing current density and parasitic resistance errors and other problems with conventional bandgap reference temperature sensors are eliminated by generating a signal proportional to temperature from three samples, where the signal is defined as a difference between a first difference and a second difference, the first difference comprising a difference between a second sample and a first sample, the second difference comprising a difference between a third sample and the first sample, and where the signal is defined to cancel parasitic components in the first, second and third samples.

Claims

1. A method comprising:

sampling a temperature sensor to generate first, second and third samples; and

generating a signal proportional to temperature from the first, second and third samples, where the signal is defined as a difference between a first difference and a second difference, the first difference comprising a difference between the second sample and the first sample, the second difference comprising a difference between the third sample and the first sample, and where the signal is defined to cancel parasitic components in the first, second and third samples.

2. The method of claim 1, further comprising:

reconfiguring a reconfigurable stimulator into a first, second and third configuration to generate a first, second and third stimulus; and

applying the first, second and third stimulus to the temperature sensor;

generating, by the temperature sensor, first, second and third responses, respectively, from the applied first, second and third stimulus, wherein sampling generates the first, second and third samples, respectively, from the first, second and third responses.

3. The method of claim 2, wherein reconfiguring the reconfigurable stimulator comprises using dynamic element matching (DEM) to reconfigure the reconfigurable stimulator.

4. The method of claim 2, wherein the first, second and third stimulus have different magnitudes.

5. The method of claim 4, wherein each of the first, second and third configuration of the reconfigurable stimulator comprises a different number of transistors that respectively generate the first, second and third stimulus.

6. The method of claim 1, further comprising:

reconfiguring a reconfigurable temperature sensor into a first, second and third configuration to generate first, second and third responses to a first, second and third stimulus, wherein sampling generates the first, second and third samples, respectively, from the first, second and third responses.

7. The method of claim 6, wherein reconfiguring the reconfigurable temperature sensor comprises using dynamic element matching (DEM) to reconfigure the reconfigurable temperature sensor.

8. The method of claim 6, wherein the first, second and third stimulus have different magnitudes.

9. The method of claim 6, wherein each of the first, second and third configuration of the reconfigurable temperature sensor comprises a different number of transistors that respectively generate the first, second and third responses.

10. The method of claim 1, further comprising:

adjusting the magnitude of at least one of the first, second and third samples to cancel parasitic components.

11. The method of claim 10, wherein sampling a temperature sensor to generate a set of samples comprises:

sampling the first sample to a first capacitor of a first magnitude;

sampling the second sample to a second capacitor of a second magnitude; and

sampling the third sample to a third capacitor of a third magnitude.

12. The device of claim 11, wherein the sampling of the first, second and third samples is performed serially.

13. The method of claim 11, further comprising:

forming first, second and third capacitors using dynamic element matching (DEM).

14. A device comprising:

a sampler that samples a temperature sensor to generate a set of samples comprising first, second and third samples;

a signal generator that generates a signal proportional to temperature from the first, second and third samples, where the signal is defined as a difference between a first difference and a second difference, the first difference comprising a difference between the second sample and the first sample, the second difference comprising a difference between the third sample and the first sample, and is defined to cancel parasitic components in the first, second and third samples.

15. The device of claim 14, further comprising:

a reconfigurable stimulator reconfigurable into a first configuration, a second configuration and a third configuration to generate, respectively, a stimulus comprising a first stimulus, a second stimulus and a third stimulus; and

a temperature sensor comprising a single transistor that generates a first response, a second response and third response in response to being stimulated, respectively, by the first stimulus, the second stimulus and the third stimulus, wherein the temperature sensor generates the first sample, the second sample and the third sample, respectively, by sampling the first response, the second response and the third response.

16. The device of claim 15, wherein the signal generator comprises:

a differential integrator having a positive and a negative terminal, wherein the first, second and third capacitors are selectively coupled to one of the positive terminal and the negative terminal based on the definition of the signal.

17. The device of claim 14, further comprising:

a stimulator that generates a stimulus; and

a reconfigurable temperature sensor reconfigurable into a first configuration stimulated by the stimulus, a second configuration stimulated by the stimulus and a third configuration stimulated by the stimulus to generate, respectively a first response, a second response and third response, wherein the temperature sensor generates the first sample, the second sample and the third sample, respectively, by sampling the first response, the second response and the third response.

18. The device of claim 14, wherein the sampler comprises:

a first capacitor of a first magnitude that holds the first sample;

a second capacitor of a second magnitude that holds the second sample; and

a third capacitor of a third magnitude that holds the third sample.

19. A device comprising:

a signal generator that generates a signal proportional to temperature from first, second and third samples of a temperature sensor, where the signal is defined as a difference between a first difference and a second difference, the first difference comprising a difference between the second sample and the first sample, the second difference comprising a difference between the third sample and the first sample, and where the signal is defined to cancel parasitic components in the first, second and third samples.

20. The device of claim 19, wherein the signal generator adjusts the magnitude of at least one of the first, second and third samples to cancel parasitic components.