System and method for shape measurements on thick MPR images

• US 8,917,941 B2
• Filed: 09/26/2011
• Issued: 12/23/2014
• Est. Priority Date: 09/28/2010
• Status: Active Grant

• Current Assignee: Siemens Healthineers AG (Siemens AG)
• Original Assignee: Siemens AG
• Inventors: Yang, Lining
• Primary Examiner(s): Le, Vu
• Assistant Examiner(s): WOLDEMARIAM, AKLILU K
• Application Number:
  US13/244,984
• Publication Number:
  US 20130208989A1
• Time in Patent Office: 1,184 Days
• Field of Search: 382/145, 382/203, 345/424, 345/505, 345/536
• US Class Current: 382/203
• CPC Class Codes: A61B 6/03 Computed tomography [CT] echo-tomography A61B8/14
• CPC Class Codes: A61B 6/5211 involving processing of medical diagnostic data
• CPC Class Codes: A61B 8/5215 involving processing of medical diagnostic data
• CPC Class Codes: G01R 33/5608 Data processing and visualization specially adapted for MR, e.g. for feature analysis and pattern recognition on the basis of measured MR data, segmentation of measured MR data, edge contour detection on the basis of measured MR data, for enhancing measured MR data in terms of signal-to-noise ratio by means of noise filtering or apodization, for enhancing measured MR data in terms of resolution by means for deblurring, windowing, zero filling, or generation of gray-scaled images, colour-coded images or images displaying vectors instead of pixels image data processing or generation, in general G06T
• CPC Class Codes: G06F 18/00 Pattern recognition
• CPC Class Codes: G06T 2207/10081 Computed x-ray tomography [CT]
• CPC Class Codes: G06T 2207/30004 Biomedical image processing
• CPC Class Codes: G06T 7/62 of area, perimeter, diameter or volume
• CPC Class Codes: G16H 50/20 for computer-aided diagnosis, e.g. based on medical expert systems

Abstract

A method for measuring shapes in thick multi-planar reformatted (MPR) digital images, including identifying a shape in a digital MPR image, scan-converting points corresponding to the identified shape on a starting plane of an MPR slab in an image volume from which the MPR was obtained to generate a plurality of starting points for the identified shape, calculating an end point in the MPR slab corresponding to each starting point, propagating a ray from each starting point to each corresponding end point, accumulating samples along each ray, and computing a desired measurement value from the accumulated samples after reaching the end point for all rays.

Claims

1. A method for measuring shapes in thick multi-planar reformatted (MPR) digital images, comprising the steps of:

automatically measuring a shape in a digital MPR image;

scan-converting points corresponding to the identified shape on a starting plane of a thick MPR slab in an image volume from which the MPR was obtained to generate a plurality of starting points for the identified shape, wherein the thick MPR slab comprises a plurality of slices;

calculating an end point in the MPR slab corresponding to each starting point, wherein calculating an end point corresponding to each starting point comprises extending a normal of the MPR slab from each starting point until an end plane of the MPR slab is reached in the image volume, wherein the end point corresponds to a point of intersection of the extended normal and the end plane of the MPR slab;

propagating a ray from each starting point to each corresponding end point;

accumulating samples along each ray; and

computing a desired measurement value from the accumulated samples after reaching the end point for all rays,

wherein the steps of automatically measuring a shape, scan-converting points, calculating an end point, propagating a ray, accumulating samples, and computing a desired measurement value are performed by a computer processor.

2. The method of claim 1, wherein samples are accumulated by performing tri-linear interpolation at each sample point.

3. The method of claim 1, wherein samples are accumulated by performing nearest-neighbor interpolation at each sample point.

4. The method of claim 1, wherein accumulating samples includes averaging the sample values.

5. The method of claim 1, wherein accumulating samples comprises saving a maximum of the accumulated samples.

6. The method of claim 1, wherein calculating an end point corresponding to each starting point comprises extending a normal of the MPR slab from each starting point fro a distance corresponding to a thickness of the slab, wherein an end point of the extended normal is the end point corresponding to the starting point.

7. The method of claim 1, further comprising saving the sample accumulated for each ray, wherein the measurement values are computed from the saved accumulated samples.

8. The method of claim 1, wherein computing a desired measurement value from the accumulated samples comprises applying an MPR filter to the accumulated samples.

9. The method of claim 1, wherein computing a desired measurement value from the accumulated samples comprises applying maximum intensity filter to the accumulated samples.

10. A method for measuring shapes in thick multi-planar reformatted (MPR) digital images, comprising the steps of:

automatically measuring a shape in a digital MPR image;

scan-converting points corresponding to the identified shape on a starting plane of a thick MPR slab in an image volume from which the MPR was obtained to generate a plurality of starting points for the identified shape, wherein the thick MPR slab comprises a plurality of slices;

calculating an end point in the MPR slab corresponding to each starting point, wherein calculating an end point corresponding to each starting point comprises extending a normal of the MPR slab from each starting point fro a distance corresponding to a thickness of the slab, wherein an end point of the extended normal is the end point corresponding to the starting point;

propagating a ray from each starting point to each corresponding end point;

accumulating samples along each ray; and

saving the sample accumulated for each ray,

wherein the steps of automatically measuring a shape, scan-converting points, calculating an end point, propagating a ray, accumulating samples, and saving the sample are performed by a computer processor.

11. The method of claim 10, further comprising computing a desired measurement value from the saved accumulated samples after reaching the end point for all rays.

12. A non-transitory program storage device readable by a computer, tangibly embodying a program of instructions executed by the computer to perform the method steps for measuring shapes in thick multi-planar reformatted (MPR) digital images, the method comprising the steps of:

automatically measuring a shape in a digital MPR image;

scan-converting points corresponding to the identified shape on a starting plane of a thick MPR slab in an image volume from which the MPR was obtained to generate a plurality of starting points for the identified shape, wherein the thick MPR slab comprises a plurality of slices;

calculating an end point in the MPR slab corresponding to each starting point, wherein calculating an end point corresponding to each starting point comprises extending a normal of the MPR slab from each starting point until an end plane of the MPR slab is reached in the image volume, wherein the end point corresponds to a point of intersection of the extended normal and the end plane of the MPR slab;

propagating a ray from each starting point to each corresponding end point;

accumulating samples along each ray; and

computing a desired measurement value from the accumulated samples after reaching the end point for all rays.

13. The computer readable program storage device of claim 12, wherein samples are accumulated by performing tri-linear interpolation at each sample point.

14. The computer readable program storage device of claim 12, wherein samples are accumulated by performing nearest-neighbor interpolation at each sample point.

15. The computer readable program storage device of claim 12, wherein accumulating samples includes averaging the sample values.

16. The computer readable program storage device of claim 12, wherein accumulating samples comprises saving a maximum of the accumulated samples.

17. The computer readable program storage device of claim 12, wherein calculating an end point corresponding to each starting point comprises extending a normal of the MPR slab from each starting point fro a distance corresponding to a thickness of the slab, wherein an end point of the extended normal is the end point corresponding to the starting point.

18. The computer readable program storage device of claim 12, the method further comprising saving the sample accumulated for each ray, wherein the measurement values are computed from the saved accumulated samples.

19. The computer readable program storage device of claim 12, wherein computing a desired measurement value from the accumulated samples comprises applying an MPR filter to the accumulated samples.

20. The computer readable program storage device of claim 12, wherein computing a desired measurement value from the accumulated samples comprises applying maximum intensity filter to the accumulated samples.