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Cryogenic non destructive testing (NDT) and material treatment

  • US 8,920,023 B2
  • Filed: 04/27/2011
  • Issued: 12/30/2014
  • Est. Priority Date: 08/06/2010
  • Status: Active Grant
First Claim
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1. A method for detecting a defect in a manufactured item, comprising:

  • determining a first metric representing at least one characteristic of the manufactured item at first temperature;

    cooling the manufactured item to a cryogenic temperature;

    heating the manufactured item to a second temperature subsequent to the cryogenic cooling;

    determining a second metric representing the at least one characteristic of the manufacture item at a second temperature subsequent to the cryogenic cooling;

    comparing the first metric with the second metric; and

    ,detecting the defect based upon the comparison;

    wherein the first temperature is greater or equal to 32 degrees F.;

    wherein the step of heating the manufactured item to the second temperature includes heating the manufactured item to a predetermined high temperature above second temperature and allowing the manufacture item to cool to second temperature;

    wherein the predetermined high temperature is greater or equal to 150 degrees Fahrenheit and the cryogenic temperature is −

    70 F or colder.

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