Methods and systems for trimming circuits
First Claim
1. A method of removing material from the surface of a first circuit, the method comprising:
- generating a first laser pulse using a pulse generator;
targeting a spot on the first circuit using a focusing component;
delivering the first laser pulse to the spot on the first circuit, the first circuit including a digital component;
ablating material from the spot using the first laser pulse without changing a state of the digital component by using the first laser pulse having a wavelength in a near-infrared region and a duration equal or shorter than sub-nanosecond; and
testing performance of the first circuit following the step of ablating material, the testing being performed without reinitializing the circuit between the steps of ablating material and testing performance,targeting the spot on the first circuit comprises;
generating a second laser pulse using a pulse generator;
delivering a second laser pulse to a sacrificial piece of material;
detecting the position of the ablation caused by the second laser pulse with a vision system that forms an image; and
using this image to guide the first laser to the spot.
5 Assignments
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Accused Products
Abstract
Removing material from the surface of a first circuit comprises generating a first laser pulse using a pulse generator; targeting a spot on the first circuit using a focusing component; delivering the first laser pulse to the spot on the first circuit, the first circuit including a digital component; ablating material from the spot using the first laser pulse without changing a state of the digital component; testing performance of the first circuit, the testing being performed without reinitializing the circuit between the steps of ablating material and testing performance. Targeting the spot on the first circuit comprises generating a second laser pulse using a pulse generator; delivering a second laser pulse to a sacrificial piece of material; detecting the position of the ablation caused by the second laser pulse with a vision system that forms an image; and using this image to guide the first laser to the spot.
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Citations
26 Claims
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1. A method of removing material from the surface of a first circuit, the method comprising:
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generating a first laser pulse using a pulse generator; targeting a spot on the first circuit using a focusing component; delivering the first laser pulse to the spot on the first circuit, the first circuit including a digital component; ablating material from the spot using the first laser pulse without changing a state of the digital component by using the first laser pulse having a wavelength in a near-infrared region and a duration equal or shorter than sub-nanosecond; and testing performance of the first circuit following the step of ablating material, the testing being performed without reinitializing the circuit between the steps of ablating material and testing performance, targeting the spot on the first circuit comprises; generating a second laser pulse using a pulse generator; delivering a second laser pulse to a sacrificial piece of material; detecting the position of the ablation caused by the second laser pulse with a vision system that forms an image; and using this image to guide the first laser to the spot. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13)
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14. A method of removing material from the surface of a first circuit, the method comprising:
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generating a first laser pulse using a pulse generator; targeting a spot on the first circuit using a focusing component; delivering the first laser pulse to the spot on the first circuit, the first circuit including a digital component; ablating material from the spot using the first laser pulse without changing a state of the digital component by using the first laser pulse having a wavelength in a near-infrared region and a duration equal or shorter than sub-nanosecond; and testing performance of the first circuit following the step of ablating material, the testing being performed without reinitializing the circuit between the steps of ablating material and testing performance, targeting the spot on the first circuit comprises; generating a second laser pulse using a pulse generator; delivering a second laser pulse to a sacrificial piece of material; aligning a visible alignment beam to identify the location of the ablation caused by the second laser pulse; and using the alignment beam to guide the first laser to the spot. - View Dependent Claims (15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26)
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Specification