Multiband spatial heterodyne spectrometer and associated methods

• US 8,922,783 B2
• Filed: 04/09/2012
• Issued: 12/30/2014
• Est. Priority Date: 04/27/2007
• Status: Expired due to Fees

• Current Assignee: Bodkin Design & Engineering, LLC
• Original Assignee: Bodkin Design & Engineering, LLC
• Inventors: Bodkin, Andrew
• Primary Examiner(s): Lyons, Michael A
• Application Number:
  US13/442,574
• Publication Number:
  US 20140029004A1
• Time in Patent Office: 995 Days
• Field of Search: 356/328, 356/451, 356/456, 356/484, 356/488, 356/521, 359/566, 359/569, 359/571
• US Class Current: 356/484
• CPC Class Codes: G01J 3/02 Details
• CPC Class Codes: G01J 3/021 using plane or convex mirrors, parallel phase plates, or particular reflectors
• CPC Class Codes: G01J 3/22 Littrow mirror spectrometers
• CPC Class Codes: G01J 3/2823 Imaging spectrometer
• CPC Class Codes: G01J 3/36 Investigating two or more bands of a spectrum by separate detectors
• CPC Class Codes: G01J 3/45 Interferometric spectrometry
• CPC Class Codes: G01J 3/453 by correlation of the amplitudes

Abstract

A multiband spatial heterodyne spectrometer for determining spectra in first and second wavelength bands has a beamsplitter configured to split incident light and to direct the incident light upon a first and a second diffraction grating. The gratings are configured for Littrow reflection of incident light of the first wavelength band at a first order and Littrow reflection of incident light of the second wavelength band at a second order. Light reflected by the first and the second diffraction grating forms diffraction patterns imaged by an electronic camera. A dispersive device separates the imaged interference patterns onto separate groups of pixel sensors corresponding to the wavelength bands. A processing device receives information from the detector and computes spectra therefrom. The second diffraction grating is split spatially or temporally to provide two different responses, so the system can disambiguate spectra. In embodiments, the spectrometer computes hyperspectral images of a target.

Claims

1. A dual-path spatial heterodyne spectrometer for determining spectra of incident light comprising:

a beam splitter configured to split incident light and to direct the incident light upon a first and a second diffraction grating, wherein the first diffraction grating has a first half configured for Littrow reflection of incident light at a first wavelength at a first order at a first angle, and a second half configured for Littrow reflection of incident light at the first wavelength at the first order at a second angle, wherein the second diffraction grating is configured for Littrow reflection of light of the first wavelength, and wherein light reflected by the first and the second diffraction grating forms interference patterns;

an electronic camera for detecting the interference patterns, the camera comprising a detector having at least a first and a second group of pixel sensors; and

a processing device coupled to receive information from the detector and to compute spectra therefrom.

2. The dual-path spatial heterodyne spectrometer of claim 1 wherein light at the first wavelength and reflected by the first half of the first diffraction grating is detected by the first group of pixel sensors, and light reflected by the second half of the first diffraction grating is detected by the second group of pixel sensors.

3. The dual-path spatial heterodyne spectrometer of claim 2 wherein at least one singular image-forming device of the electronic camera selected from a lens and a mirror serves to image interference patterns formed by light from second diffraction grating and both the first and second halves of the first diffraction grating.

4. A dual-path multiband spatial heterodyne spectrometer comprising the dual-path spatial heterodyne spectrometer of claim 2 and further comprising a cross-dispersive device selected from the group consisting of a prism and a diffraction grating, the cross-dispersive device positioned such that light of the first wavelength and corresponding to interference fringes generated by the first half of the first diffraction grating is imaged on the first group of pixel sensors, and light of a second wavelength and corresponding to interference fringes generated by the first half of the first diffraction grating is imaged on a third group of pixel sensors of the electronic camera.

5. The dual-path multiband spatial heterodyne spectrometer for determining spectra of claim 4 wherein the dispersive device is a prism.

6. The dual-path multiband spatial heterodyne spectrometer of claim 4 wherein the dispersive device is a diffraction grating.

7. The dual-path multiband spatial heterodyne spectrometer of claim 4 wherein the first order is in the range 10 to 400.

8. The dual-path multiband spatial heterodyne spectrometer of claim 4 wherein the first half of the first diffraction grating has lines ruled with a different pitch than lines of the second half of the first diffraction grating.

9. The dual-path multiband spatial heterodyne spectrometer of claim 4 wherein the first half of the first diffraction grating is positioned at an angle with respect to the second half of the first diffraction grating.

10. The dual-path multiband spatial heterodyne spectrometer of claim 4 wherein a lens selected between an anamorphic lens and a compound lens comprising a cylindrical lens and a spherical lens, images an opening selected from the group consisting of a slit and an aperture in a first axis, and a diffraction grating in a second axis.

11. The dual-path multiband spatial heterodyne spectrometer of claim 4 wherein light of the first wavelength is diffracted for Littrow reflection in an order by the first diffraction grating, and light of the second wavelength is diffracted for Littrow reflection by the first diffraction grating in an order different from the order of diffraction of the first wavelength.

12. The dual-path spatial heterodyne spectrometer of claim 2 wherein the first half of the first diffraction grating has lines ruled with a different pitch than lines of the second half of the first diffraction grating.

13. The dual-path spatial heterodyne spectrometer of claim 2 wherein the first half of the first diffraction grating is positioned at an angle with respect to the second half of the first diffraction grating.

14. The dual-path spatial heterodyne spectrometer of claim 2 further comprising a linear variable filter disposed before the detector to block light of a second wavelength from the first and second groups of pixel sensors, while allowing light of the first wavelength to reach the first and second groups of pixel sensors, and blocking light of the first wavelength from a third group of pixel sensors of the electronic camera while allowing light of the second wavelength to reach the third group of pixel sensors.