Predictive model of automated fix handling

• US 8,924,935 B1
• Filed: 03/13/2013
• Issued: 12/30/2014
• Est. Priority Date: 09/14/2012
• Status: Active Grant

• Current Assignee: Emc IP Holding Company LLC (Dell Technologies Inc.)
• Original Assignee: EMC Corporation (Dell Technologies Inc.)
• Inventors: Chopra, Shelesh, Scott, William J, Sears, Christopher W
• Primary Examiner(s): Dao, Thuy
• Assistant Examiner(s): BERMAN, STEPHEN DAVID
• Application Number:
  US13/799,198
• Time in Patent Office: 657 Days
• Field of Search: None
• US Class Current: 717/124
• CPC Class Codes: G06F 11/3608 using formal methods, e.g. model checking, abstract interpretation theorem proving G06N5/013
• CPC Class Codes: G06F 11/3616 using software metrics
• CPC Class Codes: G06F 11/3664 Environments for testing or debugging software
• CPC Class Codes: G06F 11/368 for test version control, e.g. updating test cases to a new software version
• CPC Class Codes: G06F 11/3688 for test execution, e.g. scheduling of test suites
• CPC Class Codes: G06F 8/71 Version control security arrangements therefor G06F21/57; Configuration management

Abstract

This disclosure relates to a method, article of manufacture, and apparatus for predictive model of automated fix handling. In some embodiments, this includes decomposing a fix for a defect to features, establishing a mapping of the defect and the fix for the defect by associating the features with the defect, storing codes implementing the fix in directories indicating the corresponding features, adding an association of a test case with the features to the mapping, and applying a rule to the mapping to calculate a vulnerability of the fix.

Claims

1. A processor-executed method for providing a predictive model of an automated fix release process, the method comprising:

tagging a defect indicating attributes of the defect and a feature associated with the defect, wherein the feature is included in a fix for the defect;

assigning a value to each of the attributes;

establishing a mapping of the defect and the feature based on the tagging;

storing codes implementing the fix in directories, wherein the code directories are structured to indicate features of the fix;

adding to the mapping an association of the features and the fix derived from the code directories;

adding an association of a test case with the features to the mapping; and

calculating a vulnerability of the fix, the features, and the codes using the value assigned to each of the attributes of the defect and the mapping;

decomposing each of the features to sub-features;

adding an association of the features and the sub-features to the mapping;

calculating an individual value for each of the sub-features as a function of the values assigned to attributes of defects associated with the sub-features derived from the mapping; and

calculating an overall value for the each of the features as a function of the individual value for each of the sub-features.

2. The method as recited in claim 1, further comprising:

reporting the vulnerability and the mapping.

3. The method as recited in claim 1, wherein the vulnerability includes:

an individual value for each of the features as a function of the values assigned to attributes of defects associated with the features;

an overall value for each of the features calculated as a function of the values assigned to attributes of the defects associated with the codes based on the mapping; and

an overall value for the fix as a function of the individual value for each of the features.

4. The method as recited in claim 1, further comprising:

decomposing each of the sub-features to components;

adding an association of the sub-features and the components to the mapping;

calculating an individual value for each of the components as a function of the values assigned to attributes of defects associated with the components derived from the mapping; and

calculating an overall value for the each of the sub-features as a function of the individual value for each of the components.

5. The method as recited in claim 1, wherein the defect includes a plurality of defects and tagging the defect includes tagging each of the plurality of defects indicating the attributes of each of the plurality of defects and the feature associated with each of the plurality of defects.

6. The method as recited in claim 1, wherein the fix includes a plurality of fixes and the code directories are structured to indicate features of each of the plurality of fixes.

9. The method as recited in claim 1, wherein the attributes tagged include at least one of defect disposition type, severity of the defect, and customer impact of the defect.

10. The method as recited in claim 9, wherein the defect disposition type includes at least one of a functional issue, a non-functional issue, or an environmental issue.

11. The method as recited in claim 1, further comprising:

automatically generating test cases for the fix based on the calculated vulnerability.

12. The method as recited in claim 5, further comprising:

calculating a code density of the codes;

identifying defects among the plurality of defects the codes are associated with from the map; and

dividing the code density by the number of defects to calculate a defect density indicating the vulnerability of the codes.

13. The method as recited in claim 1, further comprising:

identifying modules in the codes and functions in the modules;

adding an association of the modules and the functions to the mapping; and

calculating the vulnerability of the modules and the functions as a function of the values assigned to attributes of defects associated with the modules and the functions derived from the mapping.

7. A system comprising:

a computer processor;

a memory storing instructions that when executed by the computer processor cause the computer processor to perform acts comprising;

tagging a defect indicating attributes of the defect and a feature associated with the defect, wherein the feature is included in a fix for the defect;

assigning a value to each of the attributes;

establishing a mapping of the defect and the feature based on the tagging;

storing codes implementing the fix in directories, wherein the code directories are structured to indicate features of the fix;

adding to the mapping an association of the features and the fix derived from the code directories;

adding an association of a test case with the features to the mapping;

calculating a vulnerability of the fix, the features, and the codes using the value assigned to each of the attributes of the defect and the mapping;

decomposing each of the features to sub-features;

adding an association of the features and the sub-features to the mapping;

calculating an individual value for each of the sub-features as a function of the values assigned to attributes of defects associated with the sub-features derived from the mapping; and

calculating an overall value for the each of the features as a function of the individual value for each of the sub-features.

8. A computer program product comprising a non-transitory computer usable medium having machine readable code embodied therein for:

tagging a defect indicating attributes of the defect and a feature associated with the defect, wherein the feature is included in a fix for the defect;

assigning a value to each of the attributes;

establishing a mapping of the defect and the feature based on the tagging;

storing codes implementing the fix in directories, wherein the code directories are structured to indicate features of the fix;

adding to the mapping an association of the features and the fix derived from the code directories;

adding an association of a test case with the features to the mapping;

calculating a vulnerability of the fix, the features, and the codes using the value assigned to each of the attributes of the defect and the mapping;

decomposing each of the features to sub-features;

adding an association of the features and the sub-features to the mapping;

calculating an individual value for each of the sub-features as a function of the values assigned to attributes of defects associated with the sub-features derived from the mapping; and

calculating an overall value for the each of the features as a function of the individual value for each of the sub-features.