Semiconductor device including metal-oxide-semiconductor field effect transistors and methods of fabricating the same
First Claim
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1. A method of fabricating a semiconductor device, comprising:
- patterning a substrate to form trenches;
forming a sacrificial layer to cover inner surfaces of the trenches, the sacrificial layer having a single-layered structure;
forming sacrificial patterns by isotropically etching the sacrificial layer such that the sacrificial layer remains on bottom surfaces of the trenches;
forming lightly doped regions in sidewalls of the trenches using the sacrificial patterns as an ion mask;
removing the sacrificial patterns; and
sequentially forming a gate insulating layer and a gate electrode layer in the trenches.
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Abstract
A method of fabricating a semiconductor device may include patterning a substrate to form trenches, forming a sacrificial layer to cover inner surfaces of the trenches, the sacrificial layer having a single-layered structure, forming sacrificial patterns by isotropically etching the sacrificial layer such that the sacrificial layer remains on bottom surfaces of the trenches, forming lightly doped regions in sidewalls of the trenches using the sacrificial patterns as an ion mask, removing the sacrificial patterns, and sequentially forming a gate insulating layer and a gate electrode layer in the trenches.
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Citations
19 Claims
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1. A method of fabricating a semiconductor device, comprising:
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patterning a substrate to form trenches; forming a sacrificial layer to cover inner surfaces of the trenches, the sacrificial layer having a single-layered structure; forming sacrificial patterns by isotropically etching the sacrificial layer such that the sacrificial layer remains on bottom surfaces of the trenches; forming lightly doped regions in sidewalls of the trenches using the sacrificial patterns as an ion mask; removing the sacrificial patterns; and sequentially forming a gate insulating layer and a gate electrode layer in the trenches. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. A method of fabricating a semiconductor device, comprising:
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forming a sacrificial layer to cover inner surfaces and a bottom surface of trenches formed in a substrate; forming sacrificial patterns by isotropically etching the sacrificial layer such that the sacrificial layer remains on bottom surfaces of the trenches; forming lightly doped regions on the exposed inner surfaces of the trenches; removing the sacrificial patterns; and sequentially forming a gate insulating layer and a gate electrode layer in the trenches. - View Dependent Claims (13, 14, 15, 16, 17, 18, 19)
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Specification