Multi-beam detector retrofitted from single-beam detector

• US 8,927,936 B2
• Filed: 12/19/2012
• Issued: 01/06/2015
• Est. Priority Date: 12/19/2012
• Status: Active Grant

• Current Assignee: Progress Rail Services Corporation (Caterpillar Incorporated)
• Original Assignee: Progress Rail Services Corporation (Caterpillar Incorporated)
• Inventors: Bartonek, Mark J., Arndt, Donald J.
• Primary Examiner(s): Kim, Kiho
• Assistant Examiner(s): Jo, Taeho
• Application Number:
  US13/719,450
• Publication Number:
  US 20140166885A1
• Time in Patent Office: 748 Days
• Field of Search: 250/349, 250/339.04, 250/342
• US Class Current: 250/349
• CPC Class Codes: B61K 9/04 Detectors for indicating the overheating of axle bearings and the like, e.g. associated with the brake system for applying the brakes in case of a fault
• CPC Class Codes: G01J 2005/0033 Wheel
• CPC Class Codes: G01J 5/0022 for sensing the radiation of moving bodies
• CPC Class Codes: G01J 5/0205 Mechanical elements; Supports for optical elements
• CPC Class Codes: G01J 5/047 Mobile mounting; Scanning arrangements
• CPC Class Codes: G01J 5/0806 Focusing or collimating elements, e.g. lenses or concave mirrors
• CPC Class Codes: G01J 5/10 using electric radiation detectors
• CPC Class Codes: G02B 26/10 Scanning systems
• CPC Class Codes: G02B 26/123 Multibeam scanners, e.g. using multiple light sources or beam splitters
• CPC Class Codes: Y10T 29/49002 Electrical device making

Abstract

The present disclosure is directed to a method of retrofitting an existing single-beam infrared scanner assembly for detecting the temperature of an object. The method may include removing optics and optoelectronic components contained within an existing housing of the single-beam infrared scanner assembly. The optics and optoelectronic components of the single-beam infrared scanner assembly may be replaced with optics and optoelectronic components for a multi-beam infrared scanner assembly. The replacement optics and optoelectronic components for the multi-beam infrared scanner assembly may be installed in the existing housing of the single-beam infrared scanner assembly.

Claims

1. A method of retrofitting an existing single-beam infrared scanner assembly for detecting the temperature of an object, the method comprising:

removing optics and optoelectronic components contained within an existing housing of the single-beam infrared scanner assembly;

configuring replacement optics and optoelectronic components for a multi-beam infrared scanner assembly to fit in the existing housing of the single-beam infrared scanner assembly;

installing the replacement optics and optoelectronic components in the existing housing; and

positioning the optics for the multi-beam infrared scanner assembly in a path of infrared radiation received through a pre-existing opening in the existing housing.

2. The method of claim 1, wherein removing optics and optoelectronic components includes removing a single-beam infrared lens from the existing housing of the single-beam infrared scanner assembly.

3. The method of claim 2, further including removing a single-beam infrared lens holder for supporting the single-beam infrared lens in the existing housing of the single-beam infrared scanner assembly.

4. The method of claim 3, wherein removing optics and optoelectronic components includes removing a mirror assembly from the existing housing of the single-beam infrared scanner assembly.

5. The method of claim 4, wherein removing optics and optoelectronic components includes removing a shutter assembly from the existing housing of the single-beam infrared scanner assembly.

6. The method of claim 1, wherein removing optics and optoelectronic components includes removing a single-beam infrared detector and associated electronics from the existing housing of the single-beam infrared scanner assembly.

7. The method of claim 1, wherein replacing the optics and optoelectronic components of the single-beam infrared scanner assembly includes replacing a single-beam infrared lens and a single-beam infrared lens holder with a multi-beam infrared lens and a multi-beam infrared lens holder.

8. The method of claim 1, wherein replacing the optics and optoelectronic components of the single-beam infrared scanner assembly includes replacing a single-beam infrared detector and associated electronics with a multi-beam infrared detector and associated electronics.

9. A retrofit multi-beam infrared scanner assembly comprising:

a housing from a single-beam infrared scanner assembly configured for installation in the vicinity of an object for which a temperature is being measured; and

a multi-beam optical element configured to fit within said housing in place of a single-beam optical element, the multi-beam optical element further being configured for placement within said housing in an optical path of a plurality of different wavelength bands of infrared radiation emitted from the object.

10. The retrofit multi-beam infrared scanner assembly of claim 9, further including a multi-beam optoelectronic element mounted within said housing in place of a single-beam optoelectronic element, the multi-beam optoelectronic element being configured to receive the plurality of different wavelength bands of infrared radiation emitted from the object.

11. The retrofit multi-beam infrared scanner assembly of claim 10, wherein the multi-beam optoelectronic element includes a multi-beam infrared detector.

12. The retrofit multi-beam infrared scanner assembly of claim 11, wherein the multi-beam infrared detector includes a focal plane array of detection elements.

13. The retrofit multi-beam infrared scanner assembly of claim 12, wherein the detection elements include infrared sensors configured to detect thermal energy being emitted from the object.

14. The retrofit multi-beam infrared scanner assembly of claim 10, further including a processor configured to receive a plurality of signals from said multi-beam optoelectronic element and process the plurality of signals into a single output indicative of a temperature of the object.

15. A retrofit multi-beam infrared scanner assembly comprising:

a housing from a single-beam infrared scanner assembly configured for installation in the vicinity of an object for which a temperature is being measured; and

a multi-beam optical element configured to fit within said housing in place of a single-beam optical element, the multi-beam optical element further being configured for placement within said housing in an optical path of a plurality of spatially separated beams of infrared radiation emitted from different portions or areas on the object.

16. The retrofit multi-beam infrared scanner assembly of claim 15, further including a multi-beam optoelectronic element mounted within said housing in place of a single-beam optoelectronic element, the multi-beam optoelectronic element being configured to receive the spatially separated beams of infrared radiation emitted from different portions or areas on the object.

17. The retrofit multi-beam infrared scanner assembly of claim 16, wherein the multi-beam optoelectronic element includes a multi-beam infrared detector.

18. The retrofit multi-beam infrared scanner assembly of claim 17, wherein the multi-beam infrared detector includes a focal plane array of detection elements.

19. The retrofit multi-beam infrared scanner assembly of claim 18, wherein the detection elements include infrared sensors configured to detect photons being emitted from the object.

20. The retrofit multi-beam infrared scanner assembly of claim 16, further including a processor configured to receive a plurality of signals from said multi-beam optoelectronic element and process the plurality of signals into a single output indicative of a temperature of the object.

21. A retrofit multi-beam infrared scanner assembly comprising:

a housing from a single-beam infrared scanner assembly configured for installation in the vicinity of an object for which a temperature is being measured;

a multi-beam optical element mounted within said housing in place of a single-beam optical element, the multi-beam optical element being configured for placement in an optical path of a plurality of spatially separated beams of infrared radiation emitted from different portions or areas on the object, the multi-beam optical element further being configured to fit within said housing in place of the single-beam optical element;

a multi-beam infrared detector mounted within said housing in place of a single-beam infrared detector, the multi-beam infrared detector being configured as a focal plane array of detection elements, the multi-beam infrared detector further being configured to fit within said housing in place of the single-beam infrared detector; and

a processor configured to receive a plurality of signals from said multi-beam infrared detector and process the plurality of signals into a single output indicative of a temperature of the object.