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Testing of electronic circuits using an active probe integrated circuit

  • US 8,928,343 B2
  • Filed: 04/03/2008
  • Issued: 01/06/2015
  • Est. Priority Date: 04/03/2007
  • Status: Expired due to Fees
First Claim
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1. A probe card comprising:

  • at least one reprogrammable active probe integrated circuit (APIC) positioned immediately adjacent and coupled to at least one probe array on a common substrate, the APIC being manufactured to test more than one device under test (DUT) with more than one different physical architecture, the at least one probe array being physically configurable to suit a DUT having a physical architecture capable of being tested by the APIC and the APIC being programmed to perform at least one desired signal transformation to suit the at least one probe array and the DUT, to provide power to the DUT, or to perform a desired signal transformation and provide power to the DUT.

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