Electroluminescence sample analysis apparatus
First Claim
1. An apparatus for analysis of an electroluminescence sample comprising:
- a pulse generator configured for applying a pulse driving signal to the electroluminescence sample;
an electroluminescence (EL) detector configured for acquiring a light-receiving signal by receiving electroluminescence emitted from the electroluminescence sample as a result of application of the pulse driving signal, wherein the light-receiving signal obtained by the EL detector is one of a photo current signal, a photo voltage signal and a capacitance signal;
a temperature controller configured for varying the temperature of the electroluminescence sample; and
an electroluminescence transient spectroscopy (ELTS) analysis unit configured for acquiring information on a defective charge trap existing in the electroluminescence sample by analyzing a change in a transient section of the light-receiving signal according to a temperature change of the electroluminescence sample, wherein the ELTS analysis unit is configured for obtaining at least one of information on an activation energy level of the defective charge trap, a concentration of the defective charge trap and a capture cross-section of the defective charge trap by sampling two time points in the transient section of the light-receiving signal, calculating a difference of the light-receiving signal at the two sampled time points, and using a relation of change in the difference of the light-receiving signal according to the temperature change.
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Accused Products
Abstract
Provided is an apparatus for analyzing an electroluminescence sample, which comprises: a pulse generator for applying a pulse driving signal to the electroluminescence sample; an electroluminescence (EL) detector for receiving electroluminescence which is emitted from the electroluminescence sample according to the application of the pulse driving signal, thereby acquiring a light-receiving signal; a temperature controller for varying the temperature of the electroluminescence sample; and an electroluminescence transient spectroscopy (ELTS) analysis unit for analyzing a change in a time division section of the light-receiving signal delayed depending on a change of the temperature of the electroluminescence sample, and acquiring information on a defect-type charge trap which exists in the electroluminescence sample.
8 Citations
13 Claims
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1. An apparatus for analysis of an electroluminescence sample comprising:
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a pulse generator configured for applying a pulse driving signal to the electroluminescence sample; an electroluminescence (EL) detector configured for acquiring a light-receiving signal by receiving electroluminescence emitted from the electroluminescence sample as a result of application of the pulse driving signal, wherein the light-receiving signal obtained by the EL detector is one of a photo current signal, a photo voltage signal and a capacitance signal; a temperature controller configured for varying the temperature of the electroluminescence sample; and an electroluminescence transient spectroscopy (ELTS) analysis unit configured for acquiring information on a defective charge trap existing in the electroluminescence sample by analyzing a change in a transient section of the light-receiving signal according to a temperature change of the electroluminescence sample, wherein the ELTS analysis unit is configured for obtaining at least one of information on an activation energy level of the defective charge trap, a concentration of the defective charge trap and a capture cross-section of the defective charge trap by sampling two time points in the transient section of the light-receiving signal, calculating a difference of the light-receiving signal at the two sampled time points, and using a relation of change in the difference of the light-receiving signal according to the temperature change. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. An apparatus for analysis of an electroluminescence sample comprising:
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a pulse generator configured for applying a pulse driving signal to the electroluminescence sample; an electroluminescence (EL) detector configured for acquiring a light-receiving signal by receiving electroluminescence emitted from the electroluminescence sample as a result of application of the pulse driving signal; a temperature controller configured for varying the temperature of the electroluminescence sample; and an electroluminescence transient spectroscopy (ELTS) analysis unit configured for acquiring information on a defective charge trap existing in the electroluminescence sample by analyzing a change in a transient section of the light-receiving signal according to a temperature change of the electroluminescence sample, wherein the ELTS analysis unit is configured for further obtaining lifetime information by analyzing the transient section of the light-receiving signal obtained at a fixed temperature, and wherein the lifetime information is at least one of information on a minority carrier and the defective charge trap and can be obtained by calculating a time constant of the transient section that changes exponentially. - View Dependent Claims (9, 10, 11, 12, 13)
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Specification