Mineral identification using mineral definitions including variability

• US 8,937,282 B2
• Filed: 10/26/2012
• Issued: 01/20/2015
• Est. Priority Date: 10/26/2012
• Status: Active Grant

• Current Assignee: FEI Company (Thermo Fisher Scientific Incorporated)
• Original Assignee: FEI Company (Thermo Fisher Scientific Incorporated)
• Inventors: Owen, Michael James, Buhot, Michael
• Primary Examiner(s): MASKELL, MICHAEL P
• Application Number:
  US13/661,774
• Publication Number:
  US 20140117230A1
• Time in Patent Office: 816 Days
• Field of Search: 250/306, 250/307, 250/310, 250/311, 250/281, 250/282, 702/28, 702/32, 378/45, 378/46, 378/48, 850/10
• US Class Current: 250/307
• CPC Class Codes: G01N 2223/418 electron microscope
• CPC Class Codes: G01N 23/2252 Measuring emitted X-rays, e.g. electron probe microanalysis [EPMA]

Abstract

An improved mineral analysis system includes mineral definitions that include not only characteristics of the minerals, but also variability in those characteristics. The variabilities allow the calculation of ranges of expected values for different quality of measurements, for example, for different numbers of x-ray counts. Match probabilities can therefore be calculated to more accurately determine the composition of a mineral sample.

Claims

1. A method of spectrum data analysis to determine the composition of a sample of unknown mineral composition, the method comprising:

directing an electron beam toward the sample of unknown composition;

measuring the energy of x-rays emitted from the sample to acquire an x-ray spectrum of the sample;

fitting multiple, non-contiguous portions of the acquired x-ray spectrum to corresponding portions of high quality spectra of known materials and obtaining a similarity metric for each portion for each of the high quality spectra;

combining the similarity metrics of the individual portions for each high quality spectrum to determine an overall similarity metric between the spectrum of the sample and each high quality spectra of known material; and

identifying the unknown material as the material corresponding to the high quality spectrum having the best similarity metric which meets a specified threshold,

in which fitting multiple, non-contiguous portions of the acquired x-ray spectrum to corresponding portions of high quality spectra includes fitting portion containing essentially single peaks in either spectrum.

2. A system for spectrum data analysis, comprising:

an electron beam column for directing an electron beam toward a sample;

an x-ray spectrometer for measuring the energy of x-rays emitted from the sample in response to the electron beam;

a processor for executing computer instructions to analyze a mineral sample; and

a computer memory for storing instructions for carrying out the method of claim 1.

3. The system of claim 2 further comprising a back scattered electron detector.