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Method and system for testing safety automation logic of a manufacturing cell

  • US 8,949,480 B2
  • Filed: 05/11/2009
  • Issued: 02/03/2015
  • Est. Priority Date: 05/11/2009
  • Status: Expired due to Fees
First Claim
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1. A method for testing the performance of automation logic used in a manufacturing cell, the method comprising:

  • connecting a first automation component to a host machine through an input/output (I/O) card;

    transmitting a predetermined test scenario from a test scenario generator module (TSGM) to the host machine;

    generating a set of input control signals using the host machine in response to the test scenario, wherein the input control signals are adapted to control a function of the component based on the test scenario;

    transmitting the generated set of input control signals to the first automation component via the I/O card;

    recording the behavior of the first automation component as input control signals and a corresponding set of output control signals in a memory location, as a set of recorded test signals;

    disconnecting the first automation component from the I/O card;

    connecting the I/O card to an automation controller through an I/O block;

    automatically transmitting the test scenario and the recorded test signals to the automation controller through the I/O card and the I/O block for playback on the automation controller, thereby emulating an operation of the first automation component; and

    testing the performance of the automation logic using the recorded test signals.

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