Pulsed behavior modeling with steady state average conditions

• US 8,952,710 B2
• Filed: 07/13/2012
• Issued: 02/10/2015
• Est. Priority Date: 07/15/2011
• Status: Active Grant

• Current Assignee: Qorvo US, Inc. (Qorvo, Inc.)
• Original Assignee: RF Micro Devices Incorporated (Qorvo, Inc.)
• Inventors: Retz, James M., Folkmann, Andrew F., Chiron, Jean-Frederic
• Primary Examiner(s): Nguyen, Tung X
• Application Number:
  US13/548,283
• Publication Number:
  US 20130181730A1
• Time in Patent Office: 942 Days
• US Class Current: 324/750.01
• CPC Class Codes: G01R 31/28 Testing of electronic circuits, e.g. by signal tracer EMC, EMP or similar testing of electronic circuits G01R31/002; testing for short-circuits, discontinuities, leakage or incorrect line connection G01R31/50; checking computers or computer components G06F11/00; checking static stores for correct operation G11C29/00 ; testing receivers or transmitters of transmission systems H04B17/00
• CPC Class Codes: G01R 31/2834 Automated test systems [ATE]; using microprocessors or computers G01R31/317 takes precedence; ATE for detection of defective computer hardware G06F11/2736
• CPC Class Codes: G01R 31/2839 using signal generators, power supplies or circuit analysers G01R31/2879 takes precedence; multimeters G01R15/12, network analysers G01R27/28

Abstract

A method for pulsed behavior modeling of a device under test (DUT) using steady state conditions is disclosed. The method includes providing an automated test system (ATS) programmed to capture at least one behavior of the DUT. The ATS then generates a DUT input power pulse that transitions from a predetermined steady state level to a predetermined pulse level and back to the predetermined steady state level. At least one behavior of the DUT is then captured by the ATS while the input power is at the predetermined pulse level. The ATS then steps the predetermined pulse level to a different predetermined pulse level, and the above steps are repeated until a range of predetermined pulse levels is swept. The ATS then steps the predetermined steady state level to a different steady state level, and the above steps are repeated until a range of predetermined steady state levels is swept.

Claims

1. A method for pulsed behavior modeling of a device under test (DUT) comprising:

generating for the DUT an input power signal having an input power pulse that transitions from a predetermined steady state level to a predetermined pulse level and back to the predetermined steady state level;

capturing at least one behavior of the DUT while the input power is at the predetermined pulse level;

stepping the predetermined pulse level to a different predetermined pulse level;

repeating the above steps until a range of predetermined pulse levels is swept;

stepping the predetermined steady state level to a different steady state level; and

repeating the above steps until a range of predetermined steady state levels is swept.

2. The method of claim 1 wherein the DUT is a power amplifier (PA).

3. The method of claim 2 wherein the at least one behavior is amplitude modulation-amplitude modulation (AMAM) behavior for each predetermined steady state level and each predetermined pulse level.

4. The method of claim 2 wherein the at least one behavior is amplitude modulation-phase modulation (AMPM) behavior for each predetermined steady state level and each predetermined pulse level.

5. The method of claim 1 wherein the range of predetermined pulse levels is from around −

30 dBm to around 10 dBm.

6. The method of claim 5 wherein an iterative step of predetermined pulse level is around 1 dB while stepping the predetermined pulse level to a different predetermined pulse level.

7. The method of claim 1 wherein the range of predetermined steady state levels is from around −

20 dBm to around 10 dBm.

8. The method of claim 7 wherein an iterative step of predetermined steady level is around 10 dB.

9. The method of claim 2 wherein the range of predetermined steady state levels is only one steady state level of input power for an envelope tracking system.

10. The method of claim 9 further including a step of setting a predetermined average PA supply voltage in association with generating the input power signal for the DUT.

11. The method of claim 10 further including stepping a predetermined PA supply voltage pulse level to a different predetermined PA supply pulse level is associated with stepping the predetermined steady state level to a different steady state level.

12. A tangible computer-readable medium having instructions stored thereon, wherein the instructions are readable by a computing device of an automated test system to perform operations for pulsed behavior modeling of a device under test (DUT), the operations comprising:

generating for the DUT an input power signal having an input power pulse that transitions from a predetermined steady state level to a predetermined pulse level and back to the predetermined steady state level;

capturing at least one behavior of the DUT while the input power is at the predetermined pulse level;

stepping the predetermined pulse level to a different predetermined pulse level;

repeating the above steps until a range of predetermined pulse levels is swept;

stepping the predetermined steady state level to a different steady state level; and

repeating the above steps until a range of predetermined steady state levels is swept.

13. The tangible computer-readable medium of claim 12 wherein the DUT is a power amplifier (PA).

14. The tangible computer-readable medium of claim 13 wherein the at least one behavior is amplitude modulation-amplitude modulation (AMAM) behavior for each predetermined steady state level and each predetermined pulse level.

15. The tangible computer-readable medium of claim 13 wherein the at least one behavior is amplitude modulation-phase modulation (AMPM) behavior for each predetermined steady state level and each predetermined pulse level.

16. The tangible computer-readable medium of claim 12 wherein the range of predetermined pulse levels is from around −

30 dBm to around 10 dBm.

17. The tangible computer-readable medium of claim 16 wherein an iterative step of predetermined pulse level is around 1 dB while stepping the predetermined pulse level to a different predetermined pulse level.

18. The tangible computer-readable medium of claim 12 wherein the range of predetermined steady state levels is from around −

20 dBm to around 10 dBm.

19. The tangible computer-readable medium of claim 18 wherein an iterative step of predetermined steady level is around 10 dB.

20. The tangible computer-readable medium of claim 13 wherein the range of predetermined steady state levels is only one steady state level of input power for an envelope tracking system.

21. The tangible computer-readable medium of claim 20 further including a step of setting a predetermined average PA supply voltage in association with generating the input power signal for the DUT.

22. The tangible computer-readable medium of claim 21 further including stepping a predetermined PA supply voltage pulse level to a different predetermined PA supply pulse level is associated with stepping the predetermined steady state level to a different steady state level.