Systems and methods for measuring birefringence in glass and glass-ceramics

• US 8,957,374 B2
• Filed: 09/23/2013
• Issued: 02/17/2015
• Est. Priority Date: 09/28/2012
• Status: Active Grant

• Current Assignee: Corning Incorporated
• Original Assignee: Corning Incorporated
• Inventors: Liu, Anping, Roussev, Rostislav Vatchev, Schneider, Vitor Marino, Whittier, Alana Marie
• Primary Examiner(s): Kim, Kiho
• Application Number:
  US14/033,954
• Publication Number:
  US 20140092377A1
• Time in Patent Office: 512 Days
• US Class Current: 250/338.1
• CPC Class Codes: G01J 4/04 Polarimeters using electric detection means G01J4/02 takes precedence
• CPC Class Codes: G01N 21/23 Bi-refringence

Abstract

Systems and methods of for measuring birefringence and stress in a sample made of ion-exchanged glass or a ceramic are disclosed, wherein the method includes digitally capturing TE and TM angular spectra of intensity versus pixel number for the sample. The TE and TM angular spectra are processed to minimize differences between respective regions of the TE and TM angular spectra. The amount of shift in pixels that best overlaps the processed TE and TM spectra is determined. The birefringence B is calculated by multiplying the pixel shift by the index resolution. The stress is calculated by multiplying the birefringence by the stress-optic coefficient.

Claims

1. A method of optically measuring an amount of birefringence B in a surface of a sample, comprising:

a) digitally capturing TE and TM angular spectra of intensity versus pixel number for the sample, wherein the digital capturing is defined by pixels having an index resolution;

b) processing the TE and TM angular spectra to minimize differences between respective regions of the TE and TM angular spectra, wherein the respective regions include a rate of change of intensity with angle that is at least 40% of a maximum rate of change of intensity with angle;

c) determining an amount of shift in pixels that best overlaps the processed TE and TM spectra; and

d) determining the amount of birefringence B by multiplying the pixel shift by the index resolution.

2. The method of claim 1, wherein said rate of change is at least 70% of the maximum rate of change.

3. The method of claim 1, further including capturing multiple TE- and TM-spectrum images and averaging the multiple images to reduce speckle.

4. The method of claim 3, wherein the digital capturing of the TE and TM angular spectra is performed so that either:

a) the TE and TM angular spectra are simultaneously captured as TE and TM images on respective TE and TM sections of a photodetector;

or

b) the TE and TM angular spectra are sequentially captured as TE and TM images on one or more photodetectors.

5. The method of claim 4, wherein the photodetector comprises an infrared analog detector that captures TE and TM images, and wherein said digital capturing includes processing the TE and TM images with a frame grabber.

6. The method of claim 1, wherein the digitally captured TE and TM spectra constitute raw TE and TM spectra, and further comprising:

capturing reference TE and TM angular spectra in the absence of the sample;

normalizing the raw TE and TM angular spectra by the reference TE and TM angular spectra; and

processing the normalized TE and TM angular spectra per acts b) through d).

7. The method of claim 6, further comprising correcting for a nonlinear detector response to obtain normalized TE and TM angular spectra.

8. The method of claim 1, wherein the sample has a stress-optic coefficient SOC and further comprising:

calculating an amount of surface stress σ

from the birefringence B via the relationship σ

=B·

SOC.

9. The method of claim 1, wherein the digital capturing includes receiving the TE and TM spectra on separate photodetectors.

10. The method of claim 1, wherein the digital capturing includes scanning the TE and TM spectra past either:

a) two single photodiodes;

or

b) a linear array of photo-sensing elements.

11. The method of claim 1, further comprising:

directing light from a light source to a coupling prism that is optically coupled to a top surface of the sample.

12. The method of claim 11, further comprising passing the light through at least one light-scattering element disposed between the light source and a coupling surface of the coupling prism.

13. The method of claim 1, wherein processing the TE and TM angular spectra includes:

summing multiple TE spectra to obtain a summed TE spectrum;

summing multiple TM spectra to obtain a summed TM spectrum;

low-pass filtering the summed TE and TM spectra;

band-pass filtering the low-pass-filtered summed TE and TM spectra; and

normalizing the band-pass-filtered and low-pass-filtered TE and TM spectra so that each of the TE and TM spectra has a range from 0 to 1.

14. The method of claim 1, wherein the sample comprises a glass or a glass ceramic having an attenuation α

_s, wherein the birefringence has measurement error σ

, and wherein the operating wavelength is an infrared wavelength that satisfies the condition α

_sλ

<

250π

σ

.

15. A method of optically measuring an amount of birefringence B in a surface of a sample made of ion-exchanged glass or a glass-ceramic, comprising:

a) digitally capturing TE and TM angular spectra of intensity versus pixel number for the sample, wherein the digital capturing is defined by pixels having an index resolution;

b) optionally normalizing the TE and TM angular spectra to a total-reflectivity spectrum obtained without sample, representative of an angular distribution of an illumination system;

c) processing the TE and TM angular spectra or the optionally normalized TE and TM angular spectra to obtain filtered TE and TM spectra;

d) calculating respective derivatives of the filtered TE and TM spectra;

e) determining the angular locations of respective maxima of the respective derivatives; and

f) determining the shift by the angular separation of the respective derivative maxima.

16. A system for optically measuring an amount of birefringence B in a surface of a sample made of ion-exchanged glass or a glass-ceramic, comprising:

a prism optically coupled to the sample surface at a coupling surface and having an input surface and an output surface;

a light source that emits light having an operating wavelength in the infrared range, with the light source optically coupled to the prism coupling surface via the input surface and over a first optical path;

a photodetector system optically coupled to the prism coupling surface via the output surface over a second optical path and configured to receive TE and TM light representative of TE and TM angular spectra of the sample, wherein the photodetector system includes one or more pixels having an index resolution; and

a controller electrically connected to the photodetector system and arranged to receive the TE and TM images, the controller being configured with instructions embodied in a computer-readable medium to process the TE and TM images to minimize differences between respective regions of the TE and TM angular spectra, wherein the respective regions include a rate of change of intensity with angle that is at least 40% of a maximum rate of change of intensity with angle, to determine an amount of pixel shift that best overlaps the processed TE and TM spectra in the respective regions and the amount of birefringence B by multiplying the pixel shift by the index resolution.

17. The system of claim 16, where said rate of change of intensity with angle is at least 70%.

18. The system of claim 16, wherein the photodetector system comprises an IR analog detector electrically connected to a frame grabber, and wherein a TE/TM polarizer is disposed in front of the IR analog detector, the TE/TM polarizer including at least one TE section and at least one TM section that defines corresponding at least one TE region and at least one TM region of the IR analog detector.

19. The system of claim 16, wherein the sample has an attenuation α

_s, the system has a birefringence measurement error σ

, and wherein the operating wavelength is an infrared wavelength that satisfies the condition α

_sλ

<

250π

σ

.

20. The system of claim 16, further comprising at least one light-scattering element disposed between the light source and the prism coupling surface.

21. The system of claim 16, wherein the photodetector system includes either:

a) first and second single-pixel detectors optically separated by a polarizing beam-splitting device disposed in the second optical path;

or

b) first and second linear detectors optically separated by a polarizing beam-splitting device disposed in the second optical path;

or

c) one linear detector having a TM section and a TE section optically separated by a polarizing beam-splitting device disposed in the second optical path.