Wafer level package resistance monitor scheme
First Claim
Patent Images
1. An integrated circuit, comprising:
- a monitoring circuit; and
a monitored circuit connected with the monitoring circuit, the monitored circuit comprising an in-fab redistribution layer connector and a post-fab redistribution layer connector; and
the monitoring circuit configured to determine at a stage before fabrication of an additional layer of the integrated circuit, if a resistance of a connection between the in-fab redistribution layer connector and the post-fab redistribution layer connector exceeds a threshold, the resistance being indicative of a thickness of an oxide layer formed between the in-fab redistribution layer connector and the post-fab redistribution layer connector.
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Abstract
An integrated circuit includes a monitoring circuit and a monitored circuit connected with the monitoring circuit. The monitoring circuit is operable to determine during fabrication if a resistance of a connection between an in-fab redistribution layer connector and a post-fab redistribution layer connector exceeds a threshold.
22 Citations
18 Claims
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1. An integrated circuit, comprising:
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a monitoring circuit; and a monitored circuit connected with the monitoring circuit, the monitored circuit comprising an in-fab redistribution layer connector and a post-fab redistribution layer connector; and the monitoring circuit configured to determine at a stage before fabrication of an additional layer of the integrated circuit, if a resistance of a connection between the in-fab redistribution layer connector and the post-fab redistribution layer connector exceeds a threshold, the resistance being indicative of a thickness of an oxide layer formed between the in-fab redistribution layer connector and the post-fab redistribution layer connector. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. An integrated circuit, comprising:
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an in-fab redistribution layer connector; a post-fab redistribution layer connector connected with the in-fab redistribution layer connector to make an electrical connection; an oxide layer located between the in-fab redistribution layer connector and the post-fab redistribution layer connector, the oxide layer providing a connector resistance to the electrical connection; and a monitoring circuit connected with the oxide layer, the monitoring circuit to determine if a resistance between the in-fab redistribution layer connector and the post-fab redistribution layer connector caused by the oxide layer exceed a threshold. - View Dependent Claims (10, 11, 12, 13, 14, 15)
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16. A monitoring circuit for an integrated circuit, comprising:
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an in-fab trace; a post-fab trace connected with the in-fab trace; an oxide layer positioned between the in-fab trace and the post-fab trace; and a fuse trace connected with the in-fab trace, where the fuse trace is operable to break if a resistance caused by the oxide layer exceeds a threshold, and where the in-fab trace, the post-fab trace and the fuse trace comprise a wheatstone bridge circuit. - View Dependent Claims (17, 18)
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Specification