Abridged ion trap-time of flight mass spectrometer

• US 8,969,798 B2
• Filed: 09/30/2011
• Issued: 03/03/2015
• Est. Priority Date: 07/07/2011
• Status: Active Grant

• Current Assignee: Bruker Daltonics, Inc. (Bruker Corporation)
• Original Assignee: Bruker Daltonics, Inc. (Bruker Corporation)
• Inventors: Park, Melvin Andrew
• Primary Examiner(s): Ippolito, Nicole
• Assistant Examiner(s): STOFFA, WYATT A
• Application Number:
  US13/249,709
• Publication Number:
  US 20130009051A1
• Time in Patent Office: 1,250 Days
• Field of Search: 250/288, 250/287, 250290-292, 250/294, 250/281, 250/282, 250/396.R
• US Class Current: 250/287
• CPC Class Codes: H01J 49/0031 Step by step routines describing the use of the apparatus H01J49/0081 takes precedence
• CPC Class Codes: H01J 49/063 Multipole ion guides, e.g. quadrupoles, hexapoles
• CPC Class Codes: H01J 49/40 Time-of-flight spectrometers H01J49/36 takes precedence
• CPC Class Codes: H01J 49/421 Mass filters, i.e. deviating unwanted ions without trapping
• CPC Class Codes: H01J 49/4225 Multipole linear ion traps, e.g. quadrupoles, hexapoles

Abstract

An improved trap-TOF mass spectrometer has a set of electrodes arranged to produce both a quadrupolar RF confining field and a substantially homogeneous dipole field. In operation, ions are first confined by the RF field and then, at a selected time, the RF confining field is discontinued and the dipole field is used to accelerate the ions so as to initiate a TOF MS analysis. The apparatus of the present invention may be used alone or in conjunction with other analyzers to produce mass spectra from analyte ions.

Claims

1. An abridged trap-TOF mass analyzer comprising:

an abridged linear ion trap with

a plurality of rectilinear electrode structures each comprising a plurality of electrodes arranged along a line, each structure having a substantially planar face with a first dimension and a second dimension perpendicular to the first dimension and being constructed so that a voltage applied across the second dimension produces at the planar face an electrical potential whose amplitude is a linear function of position along the second dimension,

a mechanism that positions the plurality of rectilinear electrode structures so that, for each electrode structure, the first dimension extends along the central axis and the planar faces of the electrode structures are parallel and positioned about the central axis,

a source that applies an RF potential across the second dimension of each of the electrode structures to produce a multipole field to focus analyte ions toward the central axis, and

one or more trapping electrode assemblies that produce axially confining fields before and after the plurality of electrode structures along the central axis;

a drift region; and

an ion detector.

2. The abridged trap-TOF mass analyzer according to claim 1 wherein at least one of the electrode structures includes a gap through which ions may pass.

3. The abridged trap-TOF mass analyzer according to claim 1 wherein the electrode structures are positioned around the central axis so as to leave gaps between the electrode structures through which ions may pass.

4. The abridged trap-TOF mass analyzer according to claim 1 comprising four electrode structures.

5. The abridged trap-TOF mass analyzer according to claim 1 comprising two electrode structures positioned on opposite sides of the central axis.

6. The abridged trap-TOF mass analyzer according to claim 1 further comprising a second accelerator stage having a plurality of apertured electrically conducting accelerator electrodes positioned along an axis orthogonal to the central axis such that the application of potentials to the accelerator electrodes produces an electric field.

7. The abridged trap-TOF mass analyzer according to claim 6 wherein the second accelerator stage comprises an electrically conducting grid positioned along the orthogonal axis adjacent to the accelerator electrodes such that the application of potentials to the grid and accelerator electrodes produces a substantially homogeneous electric field.

8. The abridged trap-TOF mass analyzer according to claim 1 further comprising a housing that encloses the abridged linear ion trap and restricts a flow of gas between the abridged linear ion trap and the drift region and has a slit through which ions may pass from the abridged linear ion trap into the drift region.

9. The abridged trap-TOF mass analyzer according to claim 8 further comprising a mechanism for introducing a controlled flow of collision gas into the housing.

10. The abridged trap-TOF mass analyzer according to claim 1 wherein the trapping electrode assemblies comprise a pair of trapping electrodes extending perpendicularly to the central axis and positioned before and after the plurality of electrode structures along the central axis.

11. The abridged trap-TOF mass analyzer according to claim 1 wherein at least one abridged ion trap is positioned on the central axis upstream from the abridged linear ion trap.

12. The abridged trap-TOF mass analyzer according to claim 11 wherein ions are cooled by collisions with gas molecules in the at least one abridged ion trap.

13. The abridged trap-TOF mass analyzer according to claim 1 further comprising at least one reflectron device.

14. The abridged trap-TOF mass analyzer according to claim 1 wherein the ion detector is positioned at a first TOF image plane at which ions come into temporal focus after passing through the drift region.

15. The abridged trap-TOF mass analyzer according to claim 1 wherein the ion detector is positioned at a second TOF image plane at which ions come into second-order temporal focus after passing through the drift region.

16. A method of mass analyzing ions comprising:

(a) providing an abridged trap-TOF mass analyzer comprising a first abridged linear ion trap with a plurality of rectilinear electrode structures each comprising a plurality of electrodes arranges along a line, each structure having a substantially planar face with a first dimension and a second dimension perpendicular to the first dimension and being constructed so that a voltage applied across the second dimension produces an electrical potential at the planar face whose amplitude is a linear function of position along the second dimension;

a mechanism that positions the plurality of rectilinear electrode structures so that, for each electrode structure, the first dimension extends along the central axis and the planar faces of the electrode structures are parallel and positioned about the central axis; and

one or more trapping electrode assemblies which can be used to produce axially confining fields before and after the plurality of electrode structures along the central axis, a drift region and an ion detector;

(b) injecting analyte ions into the first abridged linear ion trap along the central axis;

(c) applying an RF potential across the second dimension of each of the electrode structures so as to produce a multipole field to focus the analyte ions toward the central axis;

(d) discontinuing the RF potential;

(e) applying a DC potential to one of (i) between the plurality of electrode structures and (ii) across the second dimensions of the electrode structures so that a first substantially homogeneous dipole field is established to accelerate the analyte ions out of the first abridged linear ion trap and into the drift region; and

(f) detecting the ions.

17. The method of mass analyzing ions according to claim 16 further comprising applying one of a repulsive DC potential and a repulsive RF potential to at least one of the trapping electrode assemblies so as to restrict the motion of the ions along the central axis.

18. The method of mass analyzing ions according to claim 16 further comprising providing a collision gas in the first abridged linear ion trap and cooling the analyte ions via collisions with molecules of the collision gas.

19. The method of mass analyzing ions according to claim 16 wherein step (a) comprises placing the ion detector at a first TOF image plane at which ions come into temporal focus after passing through the drift region.

20. The method of mass analyzing ions according to claim 19 further comprising providing a second stage accelerator that comprises a plurality of apertured electrically conducting accelerator electrodes positioned along an axis orthogonal to the central axis and applying potentials to the accelerator electrodes so as to produce a second substantially homogeneous dipole field.

21. The method of mass analyzing ions according to claim 20 further comprising adjusting the DC potential and the potentials so that the strength of the first and second substantially homogeneous dipole fields are substantially the same in order to produce first order focusing at the first TOF image plane.

22. The method of mass analyzing ions according to claim 16 further comprising introducing a time delay between steps (d) and (e) and selecting a duration of the time delay in order to improve the mass resolution of the analyzer in a range of mass values.

23. The method of mass analyzing ions according to claim 22 wherein step (e) comprises manipulating the DC potential so that a strength of the first substantially homogeneous dipole field is a function of time defined by the equation U′

=V′

+W′

(1−

exp((τ

−

t)/t₁)), where τ

is the duration of the time delay, V′

is a DC potential difference applied at time τ

, (V′

+W′

) is a final DC potential difference, t is time, and t₁ is a time constant.

24. The method of mass analyzing ions according to claim 16 further comprising providing upstream from the first abridged linear ion trap a second abridged linear ion trap with a plurality of rectilinear electrode structures, each structure having a substantially planar face with a first dimension and a second dimension perpendicular to the first dimension and being constructed so that a voltage applied across the second dimension produces an electrical potential at the planar face whose amplitude is a linear function of position along the second dimension;

a mechanism that positions the plurality of rectilinear electrode structures so that, for each electrode structure, the first dimension extends along the central axis and the planar faces of the electrode structures are parallel and positioned symmetrically about the central axis; and

one or more trapping electrode assemblies which can be used to produce axially confining fields before and after the plurality of electrode structures along the central axis and applying an RF waveform to the second abridged linear ion trap.

25. The method of mass analyzing ions according to claim 24 further comprising providing a collision gas in the second abridged linear ion trap.

26. The method of mass analyzing ions according to claim 24 further comprising forming fragment ions from analyte ions in the second abridged linear ion trap via one of collision induced dissociation, electron transfer dissociation, electron capture dissociation, photodissociation, metastable activated dissociation and a combination of these methods.

27. A method of mass analyzing ions comprising:

providing an abridged trap-TOF mass analyzer comprising a first abridged linear ion trap with a plurality of rectilinear electrode structures, each structure having a substantially planar face with a first dimension and a second dimension perpendicular to the first dimension and being constructed so that a voltage applied across the second dimension produces an electrical potential at the planar face whose amplitude is a linear function of position along the second dimension;

a mechanism that positions the plurality of rectilinear electrode structures so that, for each electrode structure, the first dimension extends along the central axis and the planar faces of the electrode structures are parallel and positioned symmetrically about the central axis; and

one or more trapping electrode assemblies which can be used to produce axially confining fields before and after the plurality of electrode structures along the central axis, a drift region and an ion detector;

receiving analyte ions into the first abridged linear ion trap along the central axis;

applying an RF potential across the second dimension of each of the electrode structures so as to produce a multipole field to focus the analyte ions toward the central axis;

discontinuing the RF potential;

applying a DC potential to one of (i) between the plurality of electrode structures and (ii) across the second dimensions of the electrode structures so that a first substantially homogeneous dipole field is established to accelerate the analyte ions out of the first abridged linear ion trap and into the drift region; and

detecting the ions,

where the step of discontinuing comprises discontinuing the RF potential at a phase that is an integer multiple of π

in order to reduce the effect of ion micromotion on the TOF mass analysis.