Manufacturing apparatus of coordinate detecting device

• US 8,975,556 B2
• Filed: 05/11/2009
• Issued: 03/10/2015
• Est. Priority Date: 05/15/2008
• Status: Active Grant

• Current Assignee: Fujitsu Component Limited (Fujitsu Limited)
• Original Assignee: Fujitsu Component Limited (Fujitsu Limited)
• Inventors: Kondoh, Koichi
• Primary Examiner(s): Tran, Thien S
• Application Number:
  US12/463,458
• Publication Number:
  US 20090283507A1
• Time in Patent Office: 2,129 Days
• Field of Search: 219/121.68, 219/121.73, 219/121.82, 219/121.83, 345/173, 345/174, 345/177, 341/33, 707/535, 178/18.05, 178/18.04, 178/18.06
• US Class Current: 219/121.68
• CPC Class Codes: G06F 3/045 using resistive elements, e.g. a single continuous surface or two parallel surfaces put in contact
• CPC Class Codes: H01C 17/242 by laser trimming by laser in general B23K26/351

Abstract

A coordinate detecting device includes a resistive film formed on a substrate and a common electrode for applying a voltage to the resistive film, wherein a potential distribution is created in the resistive film, an electric potential of the resistive film at a contact position is detected, and a position of the contact position of the resistive film is detected. In a manufacturing apparatus, a laser light source irradiates laser light to remove a part of the resistive film to form a resistive film removed part, an optical system converges the laser light, a plurality of probes measure electric potentials of a surface of the resistive film with the common electrode providing the voltage to the resistive film, an X-Y table moves the substrate at least two-dimensionally, and a control part controls the X-Y table and the laser light source.

Claims

1. A manufacturing apparatus of a coordinate detecting device, comprising:

a plurality of probes each provided at a position which comes into contact with a surface of a resistive film that is transparent in a visible region and formed on one surface of a transparent glass substrate of the coordinate detecting device to measure electric potentials of the surface of the resistive film to which a voltage is applied via a common electrode of the coordinate detecting device, wherein said surface of the resistive film faces away from the transparent glass substrate;

a laser light source provided at a position facing the other surface of the transparent glass substrate opposite to said one surface, which irradiates laser light toward the resistive film through the transparent glass substrate to remove a part of the resistive film and form a resistive film removed part based on the electric potentials measured with the plurality of probes;

an optical system which converges the laser light;

an X-Y table which moves the substrate of the coordinate detecting device at least two-dimensionally; and

a control part which controls the X-Y table and the laser light source.

2. The manufacturing apparatus of a coordinate detecting device, as claimed in claim 1, wherein:

the resistive film is made of a material including ITO, or indium oxide, tin oxide or zinc oxide.

3. The manufacturing apparatus of a coordinate detecting device, as claimed in claim 1, wherein:

a wavelength of the laser light falls within a range between 340 nm and 420 nm.

4. The manufacturing apparatus of a coordinate detecting device, as claimed in claim 1, wherein:

the control part is configured to control the X-Y table and the laser light source to form the resistive film removed part at a position along the common electrode to control electric potentials provided to the resistive film via the common electrode to make uniform an electric potential distribution created on the resistive film.

9. The manufacturing apparatus of a coordinate detecting device as claimed in claim 1, wherein the plurality of probes is provided in a space formed inside the X-Y table.

5. A manufacturing apparatus of a coordinate detecting device that includes a transparent glass substrate that has a resistive film formed on one surface thereof, the manufacturing apparatus comprising:

a plurality of probes each provided at a position which comes into contact with a surface of the resistive film formed on said one surface of the transparent glass substrate to measure electric potentials of the surface of the resistive film to which a voltage is applied via a common electrode of the coordinate detecting device, wherein said surface of the resistive film faces away from the transparent glass substrate;

a laser light source provided at a position facing the other surface of the transparent glass substrate opposite to said one surface, which irradiates laser light toward the resistive film through the transparent glass substrate to remove a part of the resistive film from the transparent glass substrate, wherein a wavelength of the laser light falls within a range between 340 nm and 420 nm;

an optical system which converges the laser light toward the resistive film;

an X-Y table which moves the transparent glass substrate in an X-Y plane; and

a control part which controls the X-Y table and the laser light source, wherein the control part controls the laser light source to irradiate the laser light based on the electric potentials measured with the plurality of probes.

6. The manufacturing apparatus of a coordinate detecting device as claimed in claim 5, wherein the resistive film is a transparent resistive film.

7. A manufacturing apparatus that removes a resistive film from a transparent glass substrate, the manufacturing apparatus comprising:

a plurality of probes each provided at a position which comes into contact with a surface of the resistive film formed on one surface of the transparent glass substrate to measure electric potentials of the surface of the resistive film to which a voltage is applied via a common electrode, wherein said surface of the resistive film faces away from the transparent glass substrate;

a laser light source provided at a position facing the other surface of the transparent glass substrate opposite to said one surface, which irradiates laser light toward the resistive film through the transparent glass substrate to remove a part of the resistive film from said one surface of the transparent glass substrate;

an optical system which converges the laser light toward the resistive film; and

a control part which controls the irradiation of the laser light from the laser light source based on the electric potentials measured with the plurality of probes.

8. The manufacturing apparatus as claimed in claim 7, wherein a wavelength of the laser light falls within a range between 340 nm and 420 nm.