System and method of adaptive voltage scaling
First Claim
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1. A method comprising:
- prior to issuing a recommendation by an adaptive voltage scaling (AVS) system;
performing a first iteration of an AVS operation to sample characteristics of a semiconductor device to determine a first adjustment recommendation; and
performing at least one additional iteration of the AVS operation to determine at least one additional adjustment recommendation; and
in response to the first adjustment recommendation and each of the at least one additional adjustment recommendations being consistent, issuing the recommendation by the AVS system.
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Abstract
A particular method includes, prior to issuing a recommendation by an adaptive voltage scaling (AVS) system, performing a first iteration of an AVS operation to sample characteristics of a semiconductor device to determine a first adjustment recommendation. The method further includes performing at least one additional iteration of the AVS operation to determine at least one additional adjustment iteration. When a threshold number of consecutive adjustment recommendations are consistent, the method includes issuing the recommendation by the AVS system.
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Citations
46 Claims
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1. A method comprising:
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prior to issuing a recommendation by an adaptive voltage scaling (AVS) system; performing a first iteration of an AVS operation to sample characteristics of a semiconductor device to determine a first adjustment recommendation; and performing at least one additional iteration of the AVS operation to determine at least one additional adjustment recommendation; and in response to the first adjustment recommendation and each of the at least one additional adjustment recommendations being consistent, issuing the recommendation by the AVS system. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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13. An apparatus comprising:
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an adaptive voltage scaling (AVS) system comprising; multiple sensors configured to sample characteristics of a semiconductor device; and a controller coupled to the sensors and configured to determine an adjustment recommendation for each iteration of an AVS operation that includes sampling the characteristics, wherein the controller is further configured to issue a recommendation in response to a threshold number of consecutive adjustment recommendations being consistent. - View Dependent Claims (14, 15, 16, 17, 18, 19, 20, 21, 22, 23)
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24. An apparatus comprising:
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means for sampling characteristics of a semiconductor device; means for determining an adjustment recommendation for each iteration of an adaptive voltage scaling (AVS) operation that includes sampling the characteristics; and means for issuing a recommendation in response to a threshold number of consecutive adjustment recommendations being consistent. - View Dependent Claims (25, 26, 27, 28, 29, 30, 31, 32, 33, 34)
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35. A computer-readable storage device comprising instructions that, when executed by a processor, cause the processor to:
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prior to issuing a recommendation by an adaptive voltage scaling (AVS) system; perform a first iteration of an AVS operation to sample characteristics of a semiconductor device to determine a first adjustment recommendation; and perform at least one additional iteration of the AVS operation to determine at least one additional adjustment recommendation; and in response to the first adjustment recommendation and each of the at least one additional adjustment recommendations being consistent, issue the recommendation by the AVS system. - View Dependent Claims (36, 37, 38, 39, 40, 41, 42, 43, 44, 45, 46)
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Specification