Probing apparatus for semiconductor devices
First Claim
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1. A probing apparatus for semiconductor devices, comprising:
- a primary circuit board including an inner area having a plurality of first contacts and an outer area having a plurality of first terminals and second terminals, the first contacts being electrically connected to the first terminals via first conductive members in the primary circuit board;
a signal-adapting board positioned on the primary circuit board, the signal-adapting board having a plurality of second contacts electrically connected to the first contacts via second conductive members in the signal-adapting board; and
a power board positioned on the primary circuit board without covering the inner area and the outer area, and the power board has a plurality of power contacts electrically connected to the second terminals via power traces in the primary circuit board,wherein the power contacts are grouped into a plurality of contact groups, the power board further includes a plurality of first connecting sites, and one of the first connecting sites is electrically connected to the power contacts of the same group.
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Abstract
A probing apparatus for semiconductor devices provides a primary circuit board and a signal-adapting board positioned on the primary circuit board. The primary circuit board includes an inner area having a plurality of first contacts and an outer area having a plurality of first terminals and second terminals, and the first contacts are electrically connected to the first terminals via first conductive members in the primary circuit board. The signal-adapting board includes a plurality of second contacts electrically connected to the first contacts via second conductive members in the signal-adapting board.
7 Citations
26 Claims
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1. A probing apparatus for semiconductor devices, comprising:
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a primary circuit board including an inner area having a plurality of first contacts and an outer area having a plurality of first terminals and second terminals, the first contacts being electrically connected to the first terminals via first conductive members in the primary circuit board; a signal-adapting board positioned on the primary circuit board, the signal-adapting board having a plurality of second contacts electrically connected to the first contacts via second conductive members in the signal-adapting board; and a power board positioned on the primary circuit board without covering the inner area and the outer area, and the power board has a plurality of power contacts electrically connected to the second terminals via power traces in the primary circuit board, wherein the power contacts are grouped into a plurality of contact groups, the power board further includes a plurality of first connecting sites, and one of the first connecting sites is electrically connected to the power contacts of the same group. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14)
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15. A probing apparatus for semiconductor devices, comprising:
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a primary circuit board including an inner area having a plurality of first contacts and an outer area having a plurality of first terminals and second terminals, the first contacts being electrically connected to the first terminals via first conductive members in the primary circuit board; and a power board positioned on the primary circuit board without covering the inner area, the power board having a plurality of second contacts electrically connected to the second terminals via at least second conductive members in the primary circuit board, wherein the second contacts are grouped into a plurality of contact groups, the power board further includes a plurality of first connecting sites, and one of the first connecting sites is electrically connected to the second contacts of the same group. - View Dependent Claims (16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26)
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Specification