Methods for addressing aging of XO crystals
First Claim
Patent Images
1. A method for calibrating an XO crystal, the method comprising:
- determining a change of age of the XO crystal since last prior use of the XO crystal;
determining that at least one calibration parameter is not suitable for use in at least one calibration technique of the XO crystal, based on the change of age of the XO crystal;
expanding a search window of the at least one calibration technique; and
determining at least one fresh calibration parameter using the expanded search window, the at least one fresh calibration parameter being configured to update the at least one calibration parameter for suitable use in the at least one calibration technique of the XO crystal, wherein the at least one calibration parameter is used for an entire range of frequency response calibration values in the at least one calibration technique.
1 Assignment
0 Petitions
Accused Products
Abstract
Methods, apparatuses, systems and computer-readable media for addressing the aging of oscillation (XO) crystals are presented. Some embodiments may determine a change of age of the XO crystal since last prior use of the XO crystal. Embodiments may then determine that at least one calibration parameter is not suitable for use in at least one calibration technique of the XO crystal, based on the change of age of the XO crystal. Embodiments may then determine at least one fresh calibration parameter configured to update the at least one calibration parameter for suitable use in the at least one calibration technique of the XO crystal.
7 Citations
32 Claims
-
1. A method for calibrating an XO crystal, the method comprising:
-
determining a change of age of the XO crystal since last prior use of the XO crystal; determining that at least one calibration parameter is not suitable for use in at least one calibration technique of the XO crystal, based on the change of age of the XO crystal; expanding a search window of the at least one calibration technique; and determining at least one fresh calibration parameter using the expanded search window, the at least one fresh calibration parameter being configured to update the at least one calibration parameter for suitable use in the at least one calibration technique of the XO crystal, wherein the at least one calibration parameter is used for an entire range of frequency response calibration values in the at least one calibration technique. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
-
-
9. An apparatus configured to calibrate an XO crystal, the apparatus comprising a processor configured to:
-
determine a change of age of the XO crystal since last prior use of the XO crystal; determine that at least one calibration parameter is not suitable for use in at least one calibration technique of the XO crystal, based on the change of age of the XO crystal; expand a search window of the at least one calibration technique; and determine at least one fresh calibration parameter using the expanded search window, the at least one fresh calibration parameter being configured to update the at least one calibration parameter for suitable use in the at least one calibration technique of the XO crystal, wherein the at least one calibration parameter is used for an entire range of frequency response calibration values in the at least one calibration technique. - View Dependent Claims (10, 11, 12, 13, 14, 15, 16)
-
-
17. An apparatus configured to calibrate an XO crystal, the apparatus comprising:
-
means for determining a change of age of the XO crystal since last prior use of the XO crystal; means for determining that at least one calibration parameter is not suitable for use in at least one calibration technique of the XO crystal, based on the change of age of the XO crystal; means for expanding a search window of the at least one calibration technique; and means for determining at least one fresh calibration parameter using the expanded search window, the at least one fresh calibration parameter being configured to update the at least one calibration parameter for suitable use in the at least one calibration technique of the XO crystal, wherein the at least one calibration parameter is used for an entire range of frequency response calibration values in the at least one calibration technique. - View Dependent Claims (18, 19, 20, 21, 22, 23, 24)
-
-
25. A computer program product residing on a non-transitory processor-readable medium and comprising processor-readable instructions configured to cause a processor to:
-
determine a change of age of the XO crystal since last prior use of the XO crystal; determine that at least one calibration parameter is not suitable for use in at least one calibration technique of the XO crystal, based on the change of age of the XO crystal; expand a search window of the at least one calibration technique; and determine at least one fresh calibration parameter using the expanded search window, the at least one fresh calibration parameter being configured to update the at least one calibration parameter for suitable use in the at least one calibration technique of the XO crystal, wherein the at least one calibration parameter is used for an entire range of frequency response calibration values in the at least one calibration technique. - View Dependent Claims (26, 27, 28, 29, 30, 31, 32)
-
Specification