Apparatus and method for characterizing a replica tape

• US 8,994,933 B2
• Filed: 01/09/2014
• Issued: 03/31/2015
• Est. Priority Date: 01/09/2013
• Status: Active Grant

• Current Assignee: DeFelsko Corporation
• Original Assignee: DeFelsko Corporation
• Inventors: Vandervalk, Leon, Stachnik, Robert V., Davis, James Edward
• Primary Examiner(s): Chowdhury, Tarifur
• Assistant Examiner(s): RAHMAN, MD M
• Application Number:
  US14/151,066
• Publication Number:
  US 20140192346A1
• Time in Patent Office: 446 Days
• Field of Search: 356/72
• US Class Current: 356/72
• CPC Class Codes: G01B 11/06 for measuring thickness ; e.g. of sheet material thickness measurement by thermal means G01B21/085
• CPC Class Codes: G01B 7/10 using magnetic means, e.g. by measuring change of reluctance
• CPC Class Codes: G01B 7/14 for measuring distance or clearance between spaced objects or spaced apertures G01B7/30 takes precedence
• CPC Class Codes: G01N 21/59 Transmissivity G01N21/25 takes precedence
• CPC Class Codes: G01N 2201/062 LED's
• CPC Class Codes: G01N 2201/12 Circuits of general importance; Signal processing

Abstract

An apparatus and method are provided for characterizing a replica tape which has been embossed, compressed or cast on a surface of a material to be measured to replicate that surface. The replica tape is secured between first and second holding components such that a compressible surface of the replica tape is secured against the first holding component. A light source transmits light through the second holding component, the replica tape and the first holding component. An image sensor measures intensity of the light respectively transmitted through at least two measurement points of the compressible surface of the replica tape. A processing unit converts the measured light intensity transmitted through the at least two measurement points into at least two data values each respectively relating to a measurement statistic of the replica tape at a corresponding one of the at least two measurement points, respectively.

Claims

1. An apparatus for characterizing a replica tape which has been embossed, compressed or cast on a surface of a material, the replica tape including a first surface and an opposing second surface replicating the surface of the material on which the replica tape was embossed, compressed or cast, the second surface of the replica tape having a plurality of measurement points extending along a first direction substantially perpendicular to a thickness of the replica tape extending in a second direction between the first and second surfaces of the replica tape, wherein the apparatus comprises:

a first holding component having opposing first and second surfaces in the second direction, the first surface of the first holding component being configured to support the second surface of the replica tape thereon;

a second holding component having opposing first and second surfaces in the second direction, the second holding component being configured to be pressed against the first surface of the replica tape to secure the replica tape between the first surface of the first holding component and the second surface of the second holding component;

a light source arranged a first distance from the first surface of the second holding component and configured to transmit light in the second direction through the first and second surfaces of the second holding component, the first and second surfaces of the replica tape, and the first and second surfaces of the first holding component;

an image sensor arranged a second distance from the second surface of the first holding component and configured to measure an intensity of the light respectively transmitted through at least two of the plurality of measurement points of the second surface of the replica tape; and

a processing unit configured to receive the measured intensity of the light transmitted through the at least two of the plurality measurement points and convert the measured light intensity at the at least two measurement points into at least two data values each respectively relating to a measurement statistic of the replica tape at a corresponding one of the at least two measurement points, respectively.

2. The apparatus according to claim 1, wherein the image sensor is configured to measure the intensity of the light respectively transmitted through the at least two measurement points by measuring an amplitude of a corresponding wavelength of the light transmitted through the at least two measurement points, respectively.

3. The apparatus according to claim 1, wherein the light source is configured to transmit light having a wavelength of 200 to 1500 nm.

4. The apparatus according to claim 1,

wherein the light source is configured to transmit infrared light.

5. The apparatus according to claim 4, wherein the image sensor comprises a digital camera having a Bayer filter, and

wherein the infrared light transmitted by the light source bypasses the Bayer filter of the digital camera.

6. The apparatus according to claim 4, comprising:

a band pass filter arranged between the second surface of the first holding component and the image sensor, the band pass filter being configured to pass only infrared light to the image sensor.

7. The apparatus according to claim 1, comprising:

an eddy current sensor arranged on the second surface of the first holding component;

a conductive element attached to at least one point on a periphery of the second holding component between the first and second surfaces of the second holding component,

wherein the second holding component and the conductive element attached to the second holding component are movable in the second direction,

wherein the eddy current sensor is configured to measure a height of the conductive element above the first holding component, and

wherein the processing unit is configured to measure a height of the second holding component based on the measured height of the conductive element, and convert the measured height of the second holding component to a peak to valley thickness according to the measured height of the second holding component.

8. The apparatus according to claim 1, wherein the replica tape includes a transparent backing attached to the first surface of the replica tape, and

wherein the second holding component is configured to be pressed against the transparent backing to secure the replica tape between the first surface of the first holding component and the second surface of the second holding component.

9. The apparatus according to claim 8, wherein the backing is composed of one of polyester and nylon.

10. The apparatus according to claim 8, comprising:

an eddy current sensor arranged on the second surface of the first holding component;

a conductive element attached to at least one point on a periphery of the second holding component between the first and second surfaces of the second holding component,

wherein the second holding component and the conductive element attached to the second holding component are movable in the second direction,

wherein the eddy current sensor is configured to measure a height of the conductive element above the first holding component, and

wherein the processing unit is configured to measure a height of the second holding component based on the measured height of the conductive element, and convert the measured height of the second holding component to a peak to valley thickness by subtracting the measured height of the second holding component from a thickness of the transparent backing.

11. The apparatus according to claim 8, comprising:

an eddy current sensor arranged on the second surface of the first holding component,

wherein the second holding component is composed of a conductive material and is moveable in the second direction,

wherein the eddy current sensor is configured to measure a height of the second holding component above the first holding component, and

wherein the processing unit is configured to convert the measured height of the second holding component to a peak to valley thickness by subtracting the measured height of the second holding component from a thickness of the transparent backing.

12. The apparatus according to claim 1, comprising:

an eddy current sensor arranged on the second surface of the first holding component,

wherein the second holding component is composed of a conductive material and is moveable in the second direction,

wherein the eddy current sensor is configured to measure a height of the second holding component above the first holding component, and

wherein the processing unit is configured to convert the measured height of the second holding component to a peak to valley thickness according to the measured height of the second holding component.

13. The apparatus according to claim 1, comprising:

a first spring configured to apply a first predetermined force to the first surface of the second holding component to keep pressure between the second holding component and the replica tape constant, regardless of operator input.

14. The apparatus according to claim 11, comprising:

a second spring surrounding the second holding component;

a first ring surrounding the second holding component and having an inner groove configured to accommodate and engage the second spring between the first and second surfaces of the second holding component, and an outer tapered surface; and

a pair of buttons respectively disposed on opposite sides of the second holding component and each including an inner tapered surface matching a contour of the outer tapered surface of the first ring,

wherein the pair of buttons are configured to be depressed to become engaged with the first ring and compress the first ring toward the first holding component such that the second holding component is held in place only by means of the first spring, and to release the pressure between the second holding component and the replica tape from the first spring by applying a second predetermined force, which is greater than the first predetermined force, against the first spring to retract the first spring away from the first holding component.

15. The apparatus according to claim 14, comprising:

a second ring affixed to at least one point along a periphery of the second holding component between the first and second surfaces of the second holding component,

wherein the second spring is arranged above the second ring in the second direction.

16. The apparatus according to claim 1, wherein the processing unit is configured to record in a memory unit the received measured light intensity at the at least two measurement points, and convert the measured light intensity at the at least two measurement points by substituting the recorded measured light intensity with thickness values recorded in a look-up table in association with corresponding values of the measured light intensity, respectively.

17. The apparatus according to claim 16, comprising:

an operator interface processing unit configured to receive an operator input to update the thickness values recorded in the look-up table.

18. The apparatus according to claim 17, wherein the operator interface processing unit is configured to receive an update to the thickness values based on a linearization of a response function for the replica tape.

19. The apparatus according to claim 16, comprising:

a display unit configured to display at least one of;

(i) a two-dimensional rendering of the thickness values corresponding to the measured light intensity at the at least two measurement points, and (ii) a two-dimensional rendering of a three-dimensional surface of the replica tape based on the thickness values corresponding to the measured light intensity at the at least two measurement points.

20. The apparatus according to claim 19, wherein the processing unit is configured to generate an image in which a portion of the replica tape having the maximum thickness of the replica tape is correlated with a darkest area of the image to correct for variations between samples of the replica tape.

21. The apparatus according to claim 16, wherein the look-up table is based on measured thickness values of the replica tape in association with corresponding measured light intensities that are stored after calibration with measured thickness values of an uncompressed, unembossed or uncast replica tape in association with corresponding measured light intensities of the uncompressed, unembossed or uncast replica tape.

22. The apparatus according to claim 16, wherein the look-up table is based on measured thickness values recorded without being associated with measured light intensities of measurement points of the replica tape to account for at least one of (i) variations in measurements, (ii) changes to mechanical components of the apparatus, and (iii) buildup of debris in the apparatus.

23. The apparatus according to claim 1, wherein the processing unit is configured to record in a memory unit the received measured light intensity at the at least two measurement points, and convert the measured light intensity at the at least two measurement points by applying an algorithm to the recorded measured light intensity to obtain corresponding thickness values for the measured light intensity at the at least two measurement points, respectively.

24. The apparatus according to claim 23, comprising:

an operator interface processing unit configured to receive an operator input to update the thickness values recorded in the look-up table.

25. The apparatus according to claim 24, wherein the operator interface processing unit is configured to receive an update to the thickness values based on a linearization of a response function for the replica tape.

26. The apparatus according to claim 23, comprising:

a display unit configured to display at least one of;

(i) a two-dimensional rendering of the thickness values corresponding to the measured light intensity at the at least two measurement points, and (ii) a two-dimensional rendering of a three-dimensional surface of the replica tape based on the thickness values corresponding to the measured light intensity at the at least two measurement points.

27. The apparatus according to claim 26, wherein the processing unit is configured to generate an image in which a portion of the replica tape having the maximum thickness of the replica tape is correlated with a darkest area of the image to correct for variations between samples of the replica tape.

28. The apparatus according to claim 23, wherein the algorithm is based on measured thickness values of the replica tape in association with corresponding measured light intensities that are recorded after calibration with measured thickness values of an uncompressed, unembossed or uncast replica tape in association with corresponding measured light intensities of the uncompressed, unembossed or uncast replica tape.

29. The apparatus according to claim 23, wherein the algorithm is based on measured thickness values recorded without being associated with measured light intensities of measurement points of the replica tape to account for at least one of (i) variations in measurements, (ii) changes to mechanical components of the apparatus, and (iii) buildup of debris in the apparatus.

30. The apparatus according to claim 1, wherein the processing unit is configured to determine at least one marking in the replica tape to distinguish between different grades of the replica tape, and adjust corresponding thickness values associated with the measured light intensities at the at least two measurement points based on a particular grade of the replica tape.

31. The apparatus according to claim 1, wherein the first holding component includes a transparent window, and the second holding component includes a translucent anvil.

32. The apparatus according to claim 1, wherein the first and second holding components are each respectively comprised of a support structure for supporting the replica tape therebetween and one of a window and a hole arranged in the corresponding support structure to enable light from the light source to be transmitted therethrough.

33. A method for characterizing a replica tape, the method comprising:

embossing, compressing or casting the replica tape on a surface of a material to be measured, the embossed, compressed or cast replica tape having a compressible surface which replicates the surface of the material;

securing the replica tape between a first holding component and a second holding component such that the compressible surface of the replica tape is secured against the first holding component;

transmitting light through the second holding component, the replica tape and the first holding component;

measuring, in an image sensor, an intensity of the light respectively transmitted through at least two measurement points of the compressible surface of the replica tape; and

converting, in a processing unit, the measured light intensity transmitted through the at least two measurement points into at least two data values each respectively relating to a measurement statistic of the replica tape at a corresponding one of the at least two measurement points, respectively.

34. The method according to claim 33, comprising:

generating and displaying a two-dimensional representation of the converted data values,

wherein the generated and displayed two-dimensional representation of the converted data values includes at least one of;

(i) a two-dimensional rendering of thickness values of the replica tape corresponding to the measured light intensity at the at least two measurement points, and (ii) a two-dimensional rendering of a three-dimensional surface of the replica tape based on the thickness values corresponding to the measured light intensity at the at least two measurement points.

35. The method according to claim 34, wherein the generating and displaying of the two-dimensional representation of the converted data values includes generating an image in which a portion of the replica tape having the maximum thickness of the replica tape is correlated with a darkest area of the image to correct for variations between samples of the replica tape.

36. The method according to claim 33, wherein a conductive element is attached to at least one point on a periphery of the second holding component between opposing surfaces of the second holding component,

wherein the second holding component and the conductive element attached to the second holding component are movable in a direction of the thickness of the replica tape, and

wherein the method comprises:

measuring a height of the conductive element above the first holding component;

measuring a height of the second holding component based on the measured height of the conductive element; and

converting the measured height of the second holding component to a peak to valley thickness according to the measured height of the second holding component.

37. The method according to claim 33, wherein the replica tape includes a transparent backing attached to the first surface of the replica tape,

wherein the second holding component is pressable against the transparent backing to secure the replica tape between the first and second holding components,

wherein a conductive element is attached to at least one point on a periphery of the second holding component between opposing surfaces of the second holding component,

wherein the second holding component and the conductive element attached to the second holding component are movable in a direction of the thickness of the replica tape, and

wherein the method comprises:

measuring a height of the conductive element above the first holding component;

measuring a height of the second holding component based on the measured height of the conductive element; and

converting the measured height of the second holding component to a peak to valley thickness by subtracting the measured height of the second holding component from a thickness of the transparent backing.

38. The method according to claim 33, wherein the converting of the measured light intensity comprises:

recording in a memory unit the received measured light intensity at the at least two measurement points; and

converting the measured light intensity at the at least two measurement points by substituting the recorded measured light intensity with thickness values recorded in a look-up table in association with corresponding values of the measured light intensity, respectively.

39. The method according to claim 38, wherein the look-up table is based on measured thickness values of the replica tape in association with corresponding measured light intensities that are stored after calibration with measured thickness values of an uncompressed, unembossed or uncast replica tape in association with corresponding measured light intensities of the uncompressed, unembossed or uncast replica tape.

40. The method according to claim 33, wherein the converting of the measured light intensity comprises:

recording in a memory unit the received measured light intensity at the at least two measurement points; and

converting the measured light intensity at the at least two measurement points by applying an algorithm to the recorded measured light intensity to obtain corresponding thickness values for the measured light intensity at the at least two measurement points, respectively.

41. The method according to claim 40, wherein the algorithm is based on measured thickness values of the replica tape in association with corresponding measured light intensities that are recorded after calibration with measured thickness values of an uncompressed, unembossed or uncast replica tape in association with corresponding measured light intensities of the uncompressed, unembossed or uncast replica tape.