Device for the non-destructive testing of an electrically conductive structure
First Claim
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1. A device for non-destructive testing of an electrically conductive part comprising:
- an induction portion;
a receiving portion; and
processing means;
wherein the induction portion comprises an inductor dissociated into n elementary inductors of layer type supplied at different frequencies f1, f2, . . . , fn;
wherein the receiving portion comprises n′
magnetic receivers distributed over m columns, each column comprising at most n receivers, the magnetic receivers being connected to one another over each column, the m columns of receivers being supplied by electrical signals v1′
, v2′
, . . . , vm′
, of frequencies fi′
, f2′
, . . . , fm′
, zero or non-zero, each magnetic receiver being arranged under an elementary inductor, m magnetic receivers being positioned under each elementary inductor, the indices n, n′ and
m being positive integers such that n>
=2, 1<
n′
<
=n*m and m>
1,wherein the processing means comprises, for each column of receivers of row i with 1≦
i≦
m, means of measuring the signal at terminals of this column of receivers followed by means of demodulating this signal at the frequencies f1+f′
i, f2+f′
i - - - fn+f′
i or f1−
f′
i, f2−
f′
i - - - fn−
f′
i and means of calculating the magnetic field in each of the receivers of this column, andwherein the magnetic receivers are directed according to an axis of sensitivity, a main direction of currents of these elementary receivers being directed according to a perpendicular axis.
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Abstract
A device for non-destructive testing of an electrically conductive part including: an induction portion, a receiving portion, and a processor. The induction portion includes an inductor dissociated into n layers supplied at different frequencies f1, f2, . . . , fn, wherein the receiving portion includes plural magnetic receivers supplied at different frequencies f1′, f2′, . . . , fn′ connected to one another in at least one column, each magnetic receiver being positioned under a layer, the indices n and m being integers >2, and wherein the processor makes it possible to know the magnetic field in each of the magnetic receivers of a column.
11 Citations
16 Claims
-
1. A device for non-destructive testing of an electrically conductive part comprising:
-
an induction portion; a receiving portion; and processing means; wherein the induction portion comprises an inductor dissociated into n elementary inductors of layer type supplied at different frequencies f1, f2, . . . , fn; wherein the receiving portion comprises n′
magnetic receivers distributed over m columns, each column comprising at most n receivers, the magnetic receivers being connected to one another over each column, the m columns of receivers being supplied by electrical signals v1′
, v2′
, . . . , vm′
, of frequencies fi′
, f2′
, . . . , fm′
, zero or non-zero, each magnetic receiver being arranged under an elementary inductor, m magnetic receivers being positioned under each elementary inductor, the indices n, n′ and
m being positive integers such that n>
=2, 1<
n′
<
=n*m and m>
1,wherein the processing means comprises, for each column of receivers of row i with 1≦
i≦
m, means of measuring the signal at terminals of this column of receivers followed by means of demodulating this signal at the frequencies f1+f′
i, f2+f′
i - - - fn+f′
i or f1−
f′
i, f2−
f′
i - - - fn−
f′
i and means of calculating the magnetic field in each of the receivers of this column, andwherein the magnetic receivers are directed according to an axis of sensitivity, a main direction of currents of these elementary receivers being directed according to a perpendicular axis. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16)
-
Specification