Micromechanical system
First Claim
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1. A yaw-rate sensor for determining a Coriolis force, comprising:
- a semiconductor substrate;
a mass body mounted so it is movable over the semiconductor substrate, wherein the mass body includes two mass elements set to move in different directions;
a drive unit for setting the mass body into an oscillating movement in a plane of the mass body; and
a detection unit for determining deflections of the mass elements within the plane and caused by the Coriolis force, the detection unit including a piezoresistive element, wherein a piezoresistive element is operationally linked to the semiconductor substrate and a lever element, which is mounted in an anchor point so it is rotatable on the semiconductor substrate, is provided, and which is coupled to the mass body and the piezoresistive element so that a force or movement introduced by the mass body into the lever element is transmitted by the lever element using a conversion factor to the piezoresistive element.
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Abstract
A yaw-rate sensor for determining a Coriolis force includes a semiconductor substrate, a mass body mounted so it is movable over the semiconductor substrate, a drive unit for setting the mass body into an oscillating movement, and a detection unit for determining a deflection of the mass body which is caused by the Coriolis force. The detection unit includes a piezoresistive element, whose electrical resistance is a function of the deformation of the piezoresistive element.
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8 Claims
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1. A yaw-rate sensor for determining a Coriolis force, comprising:
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a semiconductor substrate; a mass body mounted so it is movable over the semiconductor substrate, wherein the mass body includes two mass elements set to move in different directions; a drive unit for setting the mass body into an oscillating movement in a plane of the mass body; and a detection unit for determining deflections of the mass elements within the plane and caused by the Coriolis force, the detection unit including a piezoresistive element, wherein a piezoresistive element is operationally linked to the semiconductor substrate and a lever element, which is mounted in an anchor point so it is rotatable on the semiconductor substrate, is provided, and which is coupled to the mass body and the piezoresistive element so that a force or movement introduced by the mass body into the lever element is transmitted by the lever element using a conversion factor to the piezoresistive element. - View Dependent Claims (2, 3)
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4. A yaw-rate sensor for determining a Coriolis force, comprising:
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a semiconductor substrate; a mass body mounted so it is movable over the semiconductor substrate; a drive unit for setting the mass body into an oscillating movement; and a detection unit for determining a deflection of the mass body caused by the Coriolis force, the detection unit including a piezoresistive element, wherein the mass body includes two mass elements, which are set into movements in opposite directions by the drive unit, and a piezoresistive element is situated between the mass elements and is operationally linked to the mass elements in such a way that deflections of the mass elements caused by the Coriolis force act in opposite directions on the piezoresistive element. - View Dependent Claims (5, 6, 7, 8)
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Specification