High performance stress-enhanced MOSFETs using Si:C and SiGe epitaxial source/drain and method of manufacture
First Claim
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1. A method of manufacturing a semiconductor structure, comprising:
- forming a pFET stack and an nFET stack on a substrate;
forming first source/drain regions at the substrate adjacent respective opposing sides of the pFET stack;
growing a first layer of material at the first source/drain regions associated with the pFET stack, wherein after the growing, the first layer of material has a lattice structure that matches a lattice structure of a first underlying portion of the substrate to create a compressive state within a pFET channel;
forming second source/drain regions at the substrate adjacent respective opposing sides of the nFET stack, wherein forming the first and second source/drain regions comprises;
forming a first protection layer;
forming a first mask on only a portion of the first protection layer and on the nFET stack, the first mask exposing the pFET stack; and
performing a first etching process using the first mask as an etching mask;
forming a second protection layer;
forming a second mask on only a portion of the second protection layer and on the pFET stack, the second mask exposing the nFET stack; and
performing a second etching process using the second mask as an etching mask; and
growing a second layer of material at the second source/drain regions associated with the nFET stack, wherein after the growing, the second layer of material has a lattice structure that matches a lattice structure of a second underlying portion of the substrate to create a tensile state within an nFET channel.
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Abstract
A semiconductor device and method of manufacturing a semiconductor device. The semiconductor device includes channels for a pFET and an nFET. A SiGe layer is selectively grown in the source and drain regions of the pFET channel and a Si:C layer is selectively grown in source and drain regions of the nFET channel. The SiGe and Si:C layer match a lattice network of the underlying Si layer to create a stress component. In one implementation, this causes a compressive component in the pFET channel and a tensile component in the nFET channel.
129 Citations
20 Claims
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1. A method of manufacturing a semiconductor structure, comprising:
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forming a pFET stack and an nFET stack on a substrate; forming first source/drain regions at the substrate adjacent respective opposing sides of the pFET stack; growing a first layer of material at the first source/drain regions associated with the pFET stack, wherein after the growing, the first layer of material has a lattice structure that matches a lattice structure of a first underlying portion of the substrate to create a compressive state within a pFET channel; forming second source/drain regions at the substrate adjacent respective opposing sides of the nFET stack, wherein forming the first and second source/drain regions comprises; forming a first protection layer; forming a first mask on only a portion of the first protection layer and on the nFET stack, the first mask exposing the pFET stack; and performing a first etching process using the first mask as an etching mask; forming a second protection layer; forming a second mask on only a portion of the second protection layer and on the pFET stack, the second mask exposing the nFET stack; and performing a second etching process using the second mask as an etching mask; and growing a second layer of material at the second source/drain regions associated with the nFET stack, wherein after the growing, the second layer of material has a lattice structure that matches a lattice structure of a second underlying portion of the substrate to create a tensile state within an nFET channel. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18)
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19. A method of manufacturing a semiconductor structure, the method comprising:
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forming a pFET stack and an nFET stack on a substrate; forming first source/drain regions at the substrate adjacent respective opposing sides of the pFET stack, wherein forming the first source/drain regions comprises; forming a first protection layer; forming a first mask on the nFET stack and partially on the first protection layer; and performing a first etching process using the first mask as an etching mask; growing a first layer of material at the first source/drain regions associated with the pFET stack, wherein the first layer of material provides a compressive state in a pFET channel associated with the pFET stack; forming second source/drain regions at the substrate adjacent respective opposing sides of the nFET stack, wherein forming the second source/drain regions comprises; forming a second protection layer; forming a second mask on the pFET stack and partially on the second protection layer; and performing a second etching process using the second mask as an etching mask; and growing a second layer of material at the second source/drain regions associated with the nFET stack, wherein the second layer of material provides a tensile state in an nFET channel associated with the nFET stack. - View Dependent Claims (20)
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Specification