Hall sensors having forced sensing nodes

• US 9,024,629 B2
• Filed: 09/17/2012
• Issued: 05/05/2015
• Est. Priority Date: 09/16/2011
• Status: Active Grant

• Current Assignee: Infineon Technologies AG
• Original Assignee: Infineon Technologies AG
• Inventors: Motz, Mario
• Primary Examiner(s): Nguyen, Tung X
• Application Number:
  US13/621,336
• Publication Number:
  US 20130069641A1
• Time in Patent Office: 960 Days
• US Class Current: 324/251
• CPC Class Codes: G01R 33/075 Hall devices configured for spinning current measurements

Abstract

Embodiments relate to forced spinning Hall sensors. In embodiments, forced Hall sensors can provide reduced residual offset, lower current consumption and improved or complete rejection of nonlinear backbias effects when compared with conventional approaches.

Claims

1. A method comprising:

applying a bias signal to a first node of a Hall plate;

forcing a voltage level at second and third nodes of the Hall plate to a fixed value;

measuring a differential signal in each of first and second feedback circuits coupled, respectively, to the second and third nodes; and

determining a magnetic field output signal from the differential signals.

2. The method of claim 1, wherein applying a bias signal comprises applying a bias voltage.

3. The method of claim 2, wherein forcing a voltage level comprises applying a voltage within about +/−

10% of half of the bias voltage.

4. The method of claim 1, wherein applying a bias signal comprises applying a bias current.

5. The method of claim 4, wherein forcing a voltage level comprises applying a bias current to force the second and third nodes to a voltage within about +/−

10% of half of the bias signal.

6. The method of claim 1, wherein measuring a differential signal comprises measuring at least one of a differential voltage, a differential current or a differential digital value.

7. The method of claim 1, wherein determining a magnetic field output signal comprises ignoring a common mode value of the differential signals.

8. The method of claim 1, further comprising operating the Hall plate in a spinning mode.

9. The method of claim 1, wherein the first and second feedback circuits comprise a single differential feedback circuit.

10. The method of claim 1, wherein measuring a differential signal further comprises measuring a voltage drop across a feedback resistor coupled to an operational amplifier, wherein each of the first and second feedback circuits comprise a feedback resistor and an operational amplifier.

11. The method of claim 1, further comprising selectively exchanging coupling of the first and second feedback circuits with the second and third nodes by switching.

12. A Hall sensor comprising:

a Hall plate;

a bias source coupled to a first node of the Hall plate;

a feedback circuit coupled to a second node and a third node of the Hall plate;

a voltage source coupled to the feedback circuit;

a first current source coupled to the feedback circuit and selectively coupleable to one or the other of the second and third nodes and configured to inject a common mode current at the second or third node;

a second current source coupled to the feedback circuit and selectively coupleable to one or the other of the third and second nodes and configured to inject a common mode current at the third or second node;

circuitry selectively coupleable to the second and third nodes; and

an output signal related to a differential signal at an output of the feedback circuit and an output of the circuitry.

13. The Hall sensor of claim 12, wherein the circuitry selectively coupleable to the second and third nodes comprises at least one of an amplifier or an analog-to-digital converter (ADC).

14. The Hall sensor of claim 12, wherein an output of the circuitry selectively coupleable to the second and third nodes is coupled to a differential current source.

15. The Hall sensor of claim 12, wherein the circuitry selectively coupleable to the second and third nodes comprises a comparator selectively coupleable to the second and third nodes.

16. The Hall sensor of claim 12, wherein the feedback circuit comprises a common mode feedback circuit configured to force a common mode voltage at the second and third nodes to the force voltage.

17. The Hall sensor system of claim 12, wherein the bias source is a voltage source.

18. The Hall sensor system of claim 12, wherein the bias source is a current source.

19. The Hall sensor system of claim 12, wherein the first feedback circuit comprises a comparator.

20. The Hall sensor system of claim 12, further comprising switches to selectively couple the circuitry to the second and third nodes.

21. The Hall sensor system of claim 12, wherein the circuitry comprises a comparator.

22. The Hall sensor system of claim 12, wherein the Hall sensor comprises a spinning Hall sensor.