Method and device for high resolution full field interference microscopy

• US 9,025,150 B2
• Filed: 05/17/2011
• Issued: 05/05/2015
• Est. Priority Date: 05/18/2010
• Status: Expired due to Fees

• Current Assignee: LLTech Management
• Original Assignee: LLTech Management
• Inventors: Boccara, Albert Claude, Harms, Fabrice, Le Conte Chrestien de Poly, Bertrand
• Primary Examiner(s): STAFIRA, MICHAEL PATRICK
• Application Number:
  US13/698,738
• Publication Number:
  US 20130107268A1
• Time in Patent Office: 1,449 Days
• US Class Current: 356/432
• CPC Class Codes: G01B 9/02 Interferometers
• CPC Class Codes: G01B 9/02068 Auto-alignment of optical elements
• CPC Class Codes: G01B 9/02082 Caused by speckles
• CPC Class Codes: G01B 9/02091 Tomographic interferometers, e.g. based on optical coherence
• CPC Class Codes: G01B 9/04 Measuring microscopes
• CPC Class Codes: G02B 21/0056 based on optical coherence, e.g. phase-contrast arrangements, interference arrangements
• CPC Class Codes: G02B 26/06 for controlling the phase of light G02B26/08 takes precedence , measuring optical phase difference G01J9/00

Abstract

The invention relates to an incoherent light full field interference microscopy device for the imaging of a volumetric scattering sample (106). The device comprises an interference device (100) between a reference wave (401), produced by reflection of an incident wave by a reflective surface (105) of a reference arm of the interference device, and an object wave (402) produced by backscattering of the incident wave by a slice of the sample, an acquisition device (108) for at least a first interference signal and at least a second interference signal resulting from the interference of the reference and object waves, the at least two interference signals having a phase difference, an processing unit (403) for calculating an image of the slice of the sample, based on said interference signals. The interference device also comprises an optical element (404) for modifying the phase of the wavefront, and the microscopy device comprises a control unit (405) for the optical element, linked to the processing unit (403), the optical phase modification element being controlled by optimizing a statistical parameter of at least a part of the image calculated by the processing unit.

Claims

1. An incoherent light full field interference microscopy device for the imaging of a volumetric scattering sample, comprising:

a source for emitting an incident wave having a given spectral band;

an interference device comprising a reference arm and an object arm, to provide optical interference between a reference wave obtained by reflection of the incident wave on a reflective surface of the reference arm and an object wave obtained by the backscattering of the incident wave by a slice of the sample at a given depth of said sample, when said sample is placed in an object focal plane of a microscope objective placed in the object arm;

a device for multichannel acquisition of at least a first interference signal and at least a second interference signal resulting from the optical interference of said reference and object waves, the at least two interference signals having a phase difference produced by varying the relative path length difference between the two arms of the interference device, said device for multichannel acquisition being placed in a plane optically conjugated with said object focal plane of said microscope objective of the object arm; and

a processing unit for calculating an image of the slice of the sample based on said first and second interference signals, wherein

the interference device additionally comprises an optical element for modifying the phase of the wavefront of one of said reference or object waves, and

the microscopy device comprises a control unit for the optical element, linked to the processing unit, the optical phase modification element being controlled by optimizing a statistical parameter of at least a part of the image calculated by the processing unit.

2. The device according to claim 1, wherein the optical phase modification element is positioned in the object arm, for controlling the phase of the incident wave on the sample.

3. The device according to claim 2, wherein the interference device comprises a microscope objective in each of the arms, and the optical phase modification element is positioned on a pupil or an image of the pupil of the microscope objective of the object arm.

4. The device according to claim 1, wherein the optical phase deformation element is a deformable mirror.

5. The device according to claim 1, wherein the calculation of the image of the slice of the sample comprises the subtraction of at least two interference signals having a phase difference of π

and the optical phase modification element is controlled by optimizing the standard deviation measured on at least some of the values of the points of the image calculated in this way.

6. The device according to claim 5, wherein the calculation of the image of the slice of the sample additionally comprises the calculation of the absolute value of the aforementioned subtraction, and the optical phase modification element is controlled by optimizing the mean, the standard deviation or the contrast measured on at least some of the values of the points of the image calculated in this way.

7. The device according to claim 1, wherein the optimization of the statistical parameter comprises the measurement of the parameter for three states of the optical phase modification element corresponding to the introduction of three respective given values of an optical aberration.

8. The device according to claim 1, wherein the interference device is of the Linnik type, comprising a beam splitter element for forming the object and reference arms, and a microscope objective in each of the arms.

9. The device according to claim 1, wherein the interference device comprises a variable filter in one of its arms and a plate in the other arm to compensate the path length difference introduced by the variable density.

10. A method of incoherent light full field interference microscopy for the imaging of a volumetric scattering sample, comprising:

emission of an incident wave having a given spectral band;

optical interference between a reference wave obtained by reflection of the incident wave on a mirror of a reference arm of the interference device and an object wave obtained by backscattering of the incident wave by a slice of the sample at a given depth of said sample, the sample being placed in an object focal plane of a microscope objective placed in an object arm of the interference device;

acquisition using a multichannel acquisition device, placed in a plane optically conjugated with said object focal plane of said microscope objective of the object arm, of at least a first interference signal and at least a second interference signal resulting from the interference of the reference and object waves, the at least two interference signals having a phase difference produced by varying the relative path length difference between the two arms of the interference device;

processing of the first and second interference signals for calculating an image of the slice of the sample; and

control of the phase of the wave incident on the sample by optimizing a statistical parameter of at least a part of the image calculated on the basis of the processing of the interference signals.

11. The method of microscopy according to claim 10, wherein the calculation of the image of the slice of the sample comprises the subtraction of at least two interference signals having a phase difference of π

, and the phase of the wave incident on the sample is controlled by optimizing the standard deviation measured on at least some of the values of the points of the image.

12. The method of microscopy according to claim 11, wherein the calculation of the image of the slice of the sample additionally comprises the calculation of the absolute value of the aforementioned subtraction, and the phase of the wave incident on the sample is controlled by optimizing the mean, the standard deviation or the contrast measured on at least some of the values of the points of the image.

13. The method of microscopy according to claim 10, wherein the control of the phase of the wave incident on the sample comprises, for a given optical aberration, the measurement of a given number of values of the statistical parameter after the introduction of the same number of values of the optical aberration into the phase of the wave incident on the sample, where the calculation of the value of the aberration maximizes the value of the parameter, and the introduction of the value of the aberration into the phase of the wave incident on the sample.

14. The method of microscopy according to claim 13, wherein the number of values of the introduced optical aberration is three.