Ambient reflectivity absorption system for identifying precious or semi-precious materials and associated methods

• US 9,030,551 B2
• Filed: 05/24/2012
• Issued: 05/12/2015
• Est. Priority Date: 05/24/2011
• Status: Expired due to Fees

• Current Assignee: Discovery Metals, LLC
• Original Assignee: Discovery Metals, LLC
• Inventors: Schmidt, Dorn, Wilson, Brad
• Primary Examiner(s): Perungavoor, Sath V
• Assistant Examiner(s): AYNALEM, NATHNAEL B
• Application Number:
  US13/479,934
• Publication Number:
  US 20130135461A1
• Time in Patent Office: 1,083 Days
• Field of Search: 348/135, 356/445, 356/446
• US Class Current: 348/135
• CPC Class Codes: G01N 2021/3155 Measuring in two spectral ranges, e.g. UV and visible
• CPC Class Codes: G01N 2021/3177 Use of spatially separated filters in simultaneous way
• CPC Class Codes: G01N 2021/3181 using LEDs
• CPC Class Codes: G01N 21/314 with comparison of measurements at specific and non-specific wavelengths dual wavelength spectrometry G01J3/427
• CPC Class Codes: G01N 21/3151 using two sources of radiation of different wavelengths G01N21/33 - G01N21/39 take precedence
• CPC Class Codes: G01N 21/55 Specular reflectivity
• CPC Class Codes: G01N 21/87 Investigating jewels G01N21/88 takes precedence
• CPC Class Codes: G01N 2201/0616 Ambient light is used

Abstract

A reflectivity absorption system for identifying a target precious or semi-precious material can include a detector, a filter system, and an output display. The detector system is capable of detecting a reflected electromagnetic radiation at a primary wavelength and a secondary wavelength. The reflected electromagnetic radiation can be produced from sunlight or other light source. The primary wavelength corresponds to an upper reflectivity of the target material while the secondary wavelength corresponds to a lower reflectivity of the target material. Reflectivity is a function of wavelength such that identifiable variations in wavelength can be observed for certain materials over specific wavelength ranges which are then compared to a known standard reflectivity response for the indicated wavelengths. These systems can be used in portable, handheld, or stationary configurations and can identify exposed target materials in real-time.

Claims

1. A reflectivity absorption system for identifying a target material, comprising:

a) a detector system capable of detecting a reflected electromagnetic radiation at a primary wavelength and a secondary wavelength, said reflected electromagnetic radiation deriving from reflection of electromagnetic radiation from a sample surface, said primary wavelength corresponding to an upper reflectivity of the target material and said secondary wavelength corresponding to a lower reflectivity of the target material;

b) a filter system operatively connected to the detector and configured to filter the reflected electromagnetic radiation into an upper spectral region and a lower spectral region, said upper spectral region encompassing the primary wavelength and excluding the secondary wavelength, and said lower spectral region encompassing the secondary wavelength and excluding the primary wavelength; and

c) an output display configured to register an output signal in a viewable format, said output signal formed using the upper and lower spectral regions.

2. The system of claim 1, wherein the detector system is a CCD.

3. The system of claim 2, further comprising a filter layer comprising individual filters above individual sensor elements within the CCD, the individual filters distinguishable by corresponding distinct wavelengths which pass through the individual filters.

4. The system of claim 3, wherein the individual filters are arranged adjacent to one another to form a pattern comprising at least one instance of a filter tuned for every range of wavelengths that the individual filters can pass, wherein the pattern is repeated across the CCD.

5. The system of claim 1, wherein the filter system comprises at least one tunable optical filter, the tunable optical filter configured to collect data for multiple ranges of wavelengths relevant to reflection responses characteristic of the target material.

6. The system of claim 1, wherein the primary wavelength and the secondary wavelength are selected from infrared, ultraviolet, and visible.

7. The system of claim 1, wherein the primary wavelength is from about 650 nm to about 1 μ

m.

8. The system of claim 1, wherein the upper reflectivity is greater than 95%.

9. The system of claim 1, wherein the lower reflectivity of the target material is at least 20% lower than the upper reflectivity.

10. The system of claim 1, wherein the target material is selected from the group consisting of gold, silver, platinum, palladium, ruthenium, rhodium, osmium, iridium, copper, lead, zinc, alloys thereof, diamonds, emeralds, sapphire, and combinations thereof.

11. The system of claim 1, wherein the target material is gold.

12. The system of claim 1, wherein the target material is a precious material.

13. The system of claim 1, wherein the filter system is oriented to filter the reflected electromagnetic radiation prior to detection by the detector system.

14. The system of claim 13, wherein the filter system includes a first band-pass filter to form the lower spectral region and a second band-pass filter to form the upper spectral region.

15. The system of claim 13, wherein the filter system includes a low-pass filter to form the upper spectral region and a high-pass filter to form the lower spectral region.

16. The system of claim 1, wherein at least one additional range of wavelengths is filtered and detected for use in forming the output display.

17. The system of claim 1, further comprising a data processor configured to transform the upper spectral region and the lower spectral region into the output signal.

18. The system of claim 1, wherein the output signal is a video image.

19. The system of claim 1, further comprising a haptic feedback operatively connected to the detector system and configured to provide a haptic response when the reflected electromagnetic radiation has a reflected intensity corresponding to the upper reflectivity and the lower reflectivity.

20. A method of identifying a target material, comprising:

a) collecting a reflected electromagnetic radiation from a sample surface, said reflected electromagnetic radiation including a primary wavelength corresponding to an upper reflectivity of the target material and a secondary wavelength corresponding to a lower reflectivity of the target material;

b) filtering the reflected electromagnetic radiation into an upper spectral region and a lower spectral region, said upper spectral region encompassing the primary wavelength and excluding the secondary wavelength, and said lower spectral region encompassing the secondary wavelength and excluding the primary wavelength;

c) registering an output signal formed using the upper and lower spectral regions; and

d) identifying the sample surface as the target material by comparing the reflectivity response with a standard.

21. The method of claim 20, wherein the reflected electromagnetic radiation is produced from sunlight.

22. The method of claim 20, wherein the registering includes matching the upper and lower spectral regions to a broadband reflectivity curve of the target material.

23. The method of claim 20, wherein the filtering includes time sequenced oscillation to form a flickering output signal from the upper and lower spectral regions such that visible flicker in the output signal corresponds to substantial changes in reflectivity of the sample surface between the upper spectral region and the lower spectral region.

24. The method of claim 20, wherein the standard is a stored value for the target material, and the identifying is performed by a data processor.