Closed loop atomic inertial sensor

• US 9,030,655 B2
• Filed: 02/04/2013
• Issued: 05/12/2015
• Est. Priority Date: 06/27/2012
• Status: Active Grant

• Current Assignee: Honeywell International Inc.
• Original Assignee: Honeywell International Inc.
• Inventors: Strabley, Jennifer S., Salit, Kenneth, Salit, Mary K., Nelson, Karl D., Compton, Robert
• Primary Examiner(s): Chowdhury, Tarifur
• Assistant Examiner(s): AMARA, MOHAMED K
• Application Number:
  US13/758,370
• Publication Number:
  US 20140022534A1
• Time in Patent Office: 827 Days
• Field of Search: 356/72, 73/13.8, 73/13.7, 73/17.7, 702/104, 702/141, 702/96
• US Class Current: 356/72
• CPC Class Codes: G01C 19/58 Turn-sensitive devices without moving masses
• CPC Class Codes: G01C 21/166 Mechanical, construction or arrangement details of inertial navigation systems
• CPC Class Codes: G01C 21/183 Compensation of inertial measurements, e.g. for temperature effects
• CPC Class Codes: G01P 15/08 with conversion into electric or magnetic values
• CPC Class Codes: G01P 15/093 by photoelectric pick-up
• CPC Class Codes: G01P 21/00 Testing or calibrating of apparatus or devices covered by the preceding groups

Abstract

An apparatus for inertial sensing is provided. The apparatus comprises at least one atomic inertial sensor, and one or more micro-electrical-mechanical systems (MEMS) inertial sensors operatively coupled to the atomic inertial sensor. The atomic inertial sensor and the MEMS inertial sensors operatively communicate with each other in a closed feedback loop.

Claims

1. An apparatus for inertial sensing, the apparatus comprising:

at least one atomic inertial sensor; and

one or more micro-electrical-mechanical systems (MEMS) inertial sensors operatively coupled to the at least one atomic inertial sensor through a calibration unit;

a plurality of laser devices in optical communication with the at least one atomic inertial sensor and configured to generate optical pulses that are directed to the at least one atomic inertial sensor;

wherein the calibration unit receives output signals from the at least one atomic inertial sensor and the one or more MEMS inertial sensors, and the at least one atomic inertial sensor receives output signals from the calibration unit, such that the at least one atomic inertial sensor and the MEMS inertial sensors operatively communicate with each other in a closed feedback loop;

wherein the output signals from the calibration unit are used to shift a relative phase between atoms and the optical pulses from the laser devices in the at least one atomic inertial sensor, the optical pulses from the laser devices each having frequencies that are shifted until the at least one atomic inertial sensor has substantially all of its atoms returned to their initial phase, the initial phase being mapped by a final laser pulse onto a distribution of atoms within a ground state hyperfine manifold.

2. The apparatus of claim 1, wherein the at least one atomic inertial sensor comprises an atomic interferometer.

3. The apparatus of claim 1, wherein the MEMS inertial sensors comprise at least one MEMS gyroscope and at least one MEMS accelerometer.

4. The apparatus of claim 1, wherein the laser devices comprise distributed Bragg reflector laser diodes or vertical-cavity surface-emitting lasers.

5. The apparatus of claim 1, wherein the laser devices comprise:

a master laser that emits at least one beam that establishes a reference frequency;

a first slave laser, offset in frequency a first amount from the reference frequency, that emits a first beam and a second beam; and

a second slave laser, offset in frequency a second amount from the reference frequency, that emits a first beam and a second beam.

6. The apparatus of claim 5, further comprising one or more optical components that direct the beam from the master laser and the first beam from the first slave laser to interfere with one another and generate a first radio frequency signal at a first photodetector.

7. The apparatus of claim 6, further comprising one or more optical components that direct the beam from the master laser and the first beam from the second slave laser to interfere with one another and generate a second radio frequency signal at a second photodetector.

8. The apparatus of claim 7, wherein the MEMS gyroscope and the MEMS accelerometer are each operatively coupled to the calibration unit, which corrects for MEMS bias and scale factor errors based on a comparison of atomic data from the output signals of the at least one atomic inertial sensor.

9. The apparatus of claim 8, wherein the calibration unit converts a rotation rate signal received from the MEMS gyroscope into a first frequency offset, and converts an acceleration signal received from the MEMS accelerometer into a second frequency offset.

10. The apparatus of claim 9, further comprising a frequency sweep generator that receives the first and second frequency offsets from the calibration unit.

11. The apparatus of claim 10, further comprising a first mixer that receives a first frequency sweep signal from the frequency sweep generator and receives the first radio frequency signal from the first photodetector, wherein the first mixer compares the first frequency sweep signal to the first radio frequency signal and generates a frequency offset lock signal that is sent to a first low pass filter.

12. The apparatus of claim 11, wherein the first low pass filter sends a filtered signal to the first slave laser to adjust its frequency such that the second beam emitted by the first slave laser is at an adjusted frequency and is directed to a first input of the at least one atomic inertial sensor.

13. The apparatus of claim 12, further comprising a second mixer that receives a second frequency sweep signal from the frequency sweep generator and receives the second radio frequency signal from the second photodetector, wherein the second mixer compares the second frequency sweep signal to the second radio frequency signal and generates a frequency offset lock signal that is sent to a second low pass filter.

14. The apparatus of claim 13, wherein the second low pass filter sends a filtered signal to the second slave laser to adjust its frequency such that the second beam emitted by the second slave laser is at an adjusted frequency and is directed to a second input of the at least one atomic inertial sensor.

15. A method for inertial sensing, the method comprising:

providing an inertial sensing apparatus comprising;

at least one atomic inertial sensor;

a plurality of micro-electrical-mechanical systems (MEMS) inertial sensors in operative communication with the at least one atomic inertial sensor through a calibration unit, wherein the MEMS inertial sensors comprise at least one MEMS gyroscope and at least one MEMS accelerometer;

a master laser that emits a first beam and a second beam that establish a reference frequency;

a first slave laser, offset in frequency a first amount from the reference frequency, that emits a first beam and a second beam; and

a second slave laser, offset in frequency a second amount from the reference frequency, that emits a first beam and a second beam;

wherein the calibration unit receives output signals from the at least one atomic inertial sensor and the MEMS inertial sensors, and the at least one atomic inertial sensor receives output signals from the calibration unit, such that the at least one atomic inertial sensor and the MEMS inertial sensors operatively communicate with each other in a closed feedback loop;

directing the first beam from the master laser and the first beam from the first slave laser to interfere with one another and generate a first radio frequency signal at a first photodetector;

directing the second beam from the master laser and the first beam from the second slave laser to interfere with one another and generate a second radio frequency signal at a second photodetector;

converting a rotation rate signal received from the MEMS gyroscope into a first frequency offset;

converting an acceleration signal received from the MEMS accelerometer into a second frequency offset;

generating a frequency sweep signal from the first and second frequency offsets;

comparing the frequency sweep signal to the first radio frequency signal to generate a first frequency offset lock signal;

comparing the frequency sweep signal to the second radio frequency signal to generate a second frequency offset lock signal;

sending the first frequency offset lock signal to the first slave laser to adjust its frequency such that the first slave laser emits a second beam at an adjusted frequency that is directed to the at least one atomic inertial sensor; and

sending the second frequency offset lock signal to the second slave laser to adjust its frequency such that the second slave laser emits a second beam at an adjusted frequency that is directed to the at least one atomic inertial sensor;

wherein the adjusted frequency of the first slave laser and the adjusted frequency of the second laser result in the at least one atomic inertial sensor having substantially all of its atoms returned to their initial phase, the initial phase being mapped by a final laser pulse onto a distribution of atoms within a ground state hyperfine manifold.

16. The method of claim 15, wherein the at least one atomic inertial sensor comprises an atomic interferometer.

17. The method of claim 15, further comprising correcting outputs of the MEMS gyroscope and MEMS accelerometer for MEMS bias and scale factor errors based on a comparison of atomic data from the at least one atomic inertial sensor.

18. An inertial sensing apparatus comprising:

at least one atomic inertial sensor comprising an atomic interferometer;

a plurality of micro-electrical-mechanical systems (MEMS) inertial sensors in operative communication with the at least one atomic inertial sensor through a calibration unit, wherein the MEMS inertial sensors comprise at least one MEMS gyroscope and at least one MEMS accelerometer; and

a plurality of laser devices in optical communication with the at least one atomic inertial sensor and configured to generate optical pulses that are directed to the at least one atomic inertial sensor;

wherein the calibration unit receives output signals from the at least one atomic inertial sensor and the MEMS inertial sensors, and the at least one atomic inertial sensor receives output signals from the calibration unit, such that the at least one atomic inertial sensor and the MEMS inertial sensors operatively communicate with each other in a closed feedback loop;

wherein the output signals from the calibration unit are used to shift a relative phase between atoms and the optical pulses from the laser devices in the at least one atomic inertial sensor, the optical pulses from the laser devices each have frequencies that are shifted until the at least one atomic inertial sensor has substantially all of its atoms returned to their initial phase, the initial phase being mapped by a final laser pulse onto a distribution of atoms within a ground state hyperfine manifold.

19. The apparatus of claim 18, wherein the calibration unit is operatively coupled to the at least one MEMS gyroscope and the at least one MEMS accelerometer, the calibration unit configured to correct for MEMS bias and scale factor errors based on a comparison of atomic data from the at least one atomic inertial sensor.