Temperature measurement and control for laser and light-emitting diodes

• US 9,031,103 B2
• Filed: 11/05/2013
• Issued: 05/12/2015
• Est. Priority Date: 03/31/2010
• Status: Active Grant

• Current Assignee: Microsoft Technology Licensing LLC (Microsoft Corporation)
• Original Assignee: Microsoft Technology Licensing LLC (Microsoft Corporation)
• Inventors: Castillo, Leo Del, Yee, Dawson
• Primary Examiner(s): Park, Kinam
• Application Number:
  US14/072,492
• Publication Number:
  US 20140056322A1
• Time in Patent Office: 553 Days
• Field of Search: 372/34, 372/29.015, 372/29.011, 372/38.02, 372/38.07
• US Class Current: 372/34
• CPC Class Codes: H01S 5/02415 by using a thermo-electric cooler [TEC], e.g. Peltier element
• CPC Class Codes: H01S 5/0617 using memorised or pre-programmed laser characteristics
• CPC Class Codes: H01S 5/06804 by monitoring an external parameter, e.g. temperature
• CPC Class Codes: H01S 5/0683 by monitoring the optical output parameters
• CPC Class Codes: H01S 5/06837 Stabilising otherwise than by an applied electric field or current, e.g. by controlling the temperature
• CPC Class Codes: H05B 45/14 using electrical feedback from LEDs or from LED modules
• CPC Class Codes: H05B 45/18 using temperature feedback

Abstract

The existing diodes in an LED or laser diode package are used to measure the junction temperature of the LED or laser diode. The light or laser emissions of a diode are switched off by removing the operational drive current applied to the diode package. A reference current, which can be lower the operational drive current, is applied to the diode package. The resulting forward voltage of the diode is measured using a voltage measurement circuit. Using the inherent current-voltage-temperature relationship of the diode, the actual junction temperature of the diode can be determined. The resulting forward voltage can be used in a feedback loop to provide temperature regulation of the diode package, with or without determining the actual junction temperature. The measured forward voltage of a photodiode or the emissions diode in a diode package can be used to determine the junction temperature of the emissions diode.

Claims

1. A circuit, comprising:

an emission diode;

a photodiode;

a voltage measurement circuit configured to measure at least one of a forward voltage of the emission diode or a forward voltage of the photodiode; and

a control circuit configured to control an operating temperature of the emission diode based on the at least one measured forward voltage and a target operating temperature that is equal to a characterized operating temperature of the emission diode when producing emissions at a predetermined wavelength.

2. The circuit of claim 1, wherein:

the at least one measured forward voltage includes the measured forward voltage of the emission diode;

the emission diode comprises a diode junction; and

the measured forward voltage of the emission diode is across the diode junction of the emission diode.

3. The circuit of claim 2, wherein:

the control circuit controls the operating temperature of the emission diode based on the measured forward voltage of the emission diode and the target operating temperature by comparing the measured forward voltage of the emission diode to a reference forward voltage of the emission diode that corresponds to the target operating temperature.

4. The circuit of claim 1, wherein:

the at least one measured forward voltage includes the measured forward voltage of the photodiode;

the photodiode comprises a diode junction; and

the measured forward voltage of the photodiode is across the diode junction of the photodiode.

5. The circuit of claim 4, wherein:

the control circuit controls the operating temperature of the emission diode based on the measured forward voltage of the photodiode and the target operating temperature by comparing the measured forward voltage of the photodiode to a reference forward voltage of the photodiode that corresponds to the target operating temperature.

6. The circuit of claim 1, wherein:

the at least one measured forward voltage includes the measured forward voltage of the photodiode and the measured forward voltage of the photodiode.

7. The circuit of claim 1, further comprising:

a current source coupled to the emission diode and the photodiode, the current source configured to switchably supply a drive current to the emission diode and a reference current to at least one of the emission diode or the photodiode.

8. The circuit of claim 1, wherein:

the drive current is configured to cause emissions by the emission diode; and

the reference current is configured not to cause emissions by the emission diode.

9. The circuit of claim 1, further comprising:

a lookup table;

wherein the control circuit is configured to determine a junction temperature of the emission diode from the lookup table based on the measured forward voltage of the emission diode.

10. A circuit, comprising:

an emission diode;

a current source coupled to the emission diode, the current source configured to switchably supply a drive current and configured to supply a reference current;

a voltage measurement circuit configured to measure a forward voltage of the emission diode; and

a control circuit configured to control an operating temperature of the emission diode based on the measured forward voltage of the emission diode and a target operating temperature that is equal to a characterized operating temperature of the emission diode when producing emissions at a predetermined wavelength.

11. The circuit of claim 10, wherein:

the voltage measurement circuit is configured to measure the forward voltage of the emission diode while the reference current is supplied to the emission diode, and while the drive current is not supplied to the emission diode.

12. The circuit of claim 10, wherein:

the emission diode comprises a diode junction; and

the measured forward voltage of the emission diode is across the diode junction.

13. The circuit of claim 10, further comprising:

a photodiode;

wherein the voltage measurement circuit is further configured to measure a forward voltage of the photodiode; and

wherein the control circuit is further configured to control the operating temperature of the emission diode based on the measured forward voltage of the photodiode.

14. The circuit of claim 13, wherein:

the voltage measurement circuit is configured to measure the forward voltage of the emission diode while the reference current is supplied to the emission diode, and while the drive current is not supplied to the emission diode; and

the voltage measurement circuit is configured to measure the forward voltage of the photodiode while the reference current is supplied to the photodiode, and while the drive current is not supplied to the emission diode.

15. A circuit, comprising:

an emission diode;

a photodiode;

a current source coupled to the emission diode, the current source configured to switchably supply a drive current for the emission diode and configured to switchably supply a reference current for the photodiode;

a voltage measurement circuit configured to measure a forward voltage of the photodiode; and

a control circuit configured to control an operating temperature of the emission diode based on the measured forward voltage of the photodiode and a target operating temperature that is equal to a characterized operating temperature of the emission diode when producing emissions at a predetermined wavelength.

16. The circuit of claim 15, wherein the voltage measurement circuit is further configured to measure the forward voltage of the photodiode while the reference current is supplied to the photodiode, and while the drive current is not supplied to the emission diode.

17. The circuit of claim 15, wherein:

the control circuit controls the operating temperature of the emission diode based on the measured forward voltage of the photodiode and the target operating temperature by comparing the measured forward voltage of the photodiode to a reference forward voltage corresponding to the target operating temperature.

18. The circuit of claim 15, wherein:

the voltage measurement circuit is further configured to measure a forward voltage of the emission diode; and

the control circuit is further configured to control the operating temperature of the emission diode based on the measured forward voltage of the emission diode.

19. The circuit of claim 18, wherein:

the voltage measurement circuit is configured to measure the forward voltage of the photodiode while the reference current is supplied to the photodiode, and while the drive current is not supplied to the emission diode; and

the voltage measurement circuit is configured to measure the forward voltage of the emission diode while the reference current is supplied to emission diode, and while the drive current is not supplied to the emission diode.

20. The circuit of claim 15, further comprising:

a lookup table;

wherein the control circuit is configured to determine a junction temperature of the emission diode from the lookup table based on the measured forward voltage of the photodiode.