Intelligent airfoil component grain defect inspection

• US 9,046,497 B2
• Filed: 03/09/2012
• Issued: 06/02/2015
• Est. Priority Date: 03/09/2011
• Status: Active Grant

• Current Assignee: Rolls-Royce Corporation (Rolls-Royce Holdings Plc)
• Original Assignee: Rolls-Royce Corporation (Rolls-Royce Holdings Plc)
• Inventors: Kush, Matthew T., Ma, Kong, Moriarty, Robert
• Primary Examiner(s): TSAI, CAROL S W
• Application Number:
  US13/416,516
• Publication Number:
  US 20120232841A1
• Time in Patent Office: 1,180 Days
• Field of Search: 702/167, 369/44.29, 369/44.34, 369/44.35, 378/58
• US Class Current: 1/1
• CPC Class Codes: G01N 2021/8887 based on image processing techniques
• CPC Class Codes: G01N 21/8851 Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges G01N21/8806 and G01N21/93 - G01N21/95692 take precedence; optical measurement of dimensions G01B11/00; optical scanning G02B26/10; image transformation G06T3/00; computerised image enhancement G06T5/00; image processing per se for flaw detection G06T7/0002
• CPC Class Codes: G01N 23/00 Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00

Abstract

A system including a positioning system with a component manipulator structured to position a component in response to a positioning algorithm; a scanning system capable of producing a set of light waves directed at a surface of the component, detecting a set of reflected light waves from the surface of the component, and producing a reflectivity data set in response to the set of reflected light waves; and a microprocessor structured to apply a fuzzy logic algorithm to the reflectivity signal to determine a solution set and produce a grain structure characterization in response to the solution set.

Claims

1. A system comprising:

a component manipulator structured to position a component in response to a positioning algorithm;

a surface scanner configured to;

output electromagnetic radiation directed at a surface of the component,

detect reflected electromagnetic radiation from the surface of the component, and

produce a reflectivity signal in response to detecting the reflected electromagnetic radiation; and

a processor configured to;

apply a fuzzy logic algorithm to the reflectivity signal to determine a solution set in response to the reflectivity signal; and

produce a grain structure characterization in response to the solution set.

2. The system of claim 1, wherein the processor is configured to produce a grain structure characterization including a pass/fail signal, and wherein the electromagnetic radiation is a visible or near-visible light.

3. The system of claim 1, wherein the processor is configured to produce a grain structure characterization including a characterization report.

4. The system of claim 1, wherein the processor is configured to produce a grain structure characterization including a feature selected from the group consisting of:

grain structure, grain defects, grain locations, grain size, grain defect density and combinations thereof.

5. A method comprising:

applying a positioning algorithm to manipulate at least one piece of positioning equipment to position a component;

outputting electromagnetic radiation directed at a surface of the component;

detecting reflected electromagnetic radiation from the surface of the component;

producing a reflectivity data set in response to detecting the reflected electromagnetic radiation;

applying a fuzzy logic analysis to the reflectivity data set to produce a solution data set; and

producing a grain structure characterization in response to the solution data set.

6. The method of claim 5, wherein the fuzzy logic analysis includes an input collecting module, a processing module, a compiling module, and an output producing module.

7. The method of claim 6, wherein the input collecting module includes collecting the reflectivity data set.

8. The method of claim 6, wherein the output producing module includes producing the solution data set.

9. The method of claim 5, wherein the at least one piece of positioning equipment includes a robotic manipulator.

10. The method of claim 5, wherein producing the grain structure characterization comprises indicating a grain structure feature selected from the group consisting of grain structure, grain defects, grain locations, grain size, grain defect density and combinations thereof.

11. The method of claim 10, wherein producing the grain structure characterization comprises producing a pass/fail signal.

12. The method of claim 10, wherein producing the grain structure characterization comprises producing a characterization report.

13. An apparatus comprising:

a controller comprising;

a position module that determines a positioning algorithm used to position a component;

a reflection module that

controls a light source to direct light to a surface of the component,

control a detection unit to detect a quantity of reflected light from the surface of the component, and

generates reflectivity data set in response to the quantity of reflected light;

a grain structure characterization module utilizing a fuzzy logic algorithm to;

apply the reflectivity data set as a set of input variables;

assign a degree of intensity to the set of input variables;

determine an output data set; and

convert the output data set to a set of solutions; and

an indication module that output at least one indication of a grain structure in response to the set of solutions.

14. The apparatus of claim 13, wherein the indication module outputs the at least one indication by at least outputting a characterization of at least one grain defect.

15. The apparatus of claim 13, wherein the indication module outputs the at least one indication by at least outputting a grain structure feature selected from the group consisting of:

grain structure, grain defects, grain locations, grain size, grain defect density and combinations thereof.

16. The apparatus of claim 13, wherein the indication module outputs the at least one indication by at least outputting a grain structure characterization in response to the set of solutions and a cognitive characterization process utilizing an airfoil defect knowledge bank.

17. The apparatus of claim 13, wherein the position module controls a component manipulator to position the component in response to a positioning algorithm.

18. The apparatus of claim 17, wherein the component manipulator utilizes an imaging system to identify a component type of the component, and wherein the position module determines the positioning algorithm in response to receiving an indication of the component type.

19. The apparatus of claim 17, wherein the positioning module identifies the component in response to the reflectivity data set and a component orientation database.

20. The apparatus of claim 13, wherein the component comprises a single crystal cast airfoil-type component.