Electrical test device and method

• US 9,063,191 B2
• Filed: 02/24/2012
• Issued: 06/23/2015
• Est. Priority Date: 02/24/2012
• Status: Active Grant

• Current Assignee: Power Probe Group Incorporated
• Original Assignee: Power Probe, Inc.
• Inventors: Whisenand, Jeff, Cruz, Randy
• Primary Examiner(s): Assouad, Patrick
• Assistant Examiner(s): PRETLOW, DEMETRIUS R
• Application Number:
  US13/404,644
• Publication Number:
  US 20130221973A1
• Time in Patent Office: 1,215 Days
• Field of Search: 324/501, 324539-544, 324/500
• US Class Current: 1/1
• CPC Class Codes: G01R 1/06788 Hand-held or hand-manipulated probes, e.g. for oscilloscopes or for portable test instruments end pieces terminating in a probe H01R11/18
• CPC Class Codes: G01R 23/16 Spectrum analysis; Fourier analysis
• CPC Class Codes: G01R 31/005 Testing of electric installations on transport means
• CPC Class Codes: G01R 31/006 on road vehicles, e.g. automobiles or trucks testing of ignition installations peculiar to internal combustion engines F02P17/00
• CPC Class Codes: G01R 31/007 using microprocessors or computers
• CPC Class Codes: G01R 31/1272 of cable, line or wire insulation, e.g. using partial discharge measurements locating faults in cables G01R31/083
• CPC Class Codes: G01R 31/28 Testing of electronic circuits, e.g. by signal tracer EMC, EMP or similar testing of electronic circuits G01R31/002; testing for short-circuits, discontinuities, leakage or incorrect line connection G01R31/50; checking computers or computer components G06F11/00; checking static stores for correct operation G11C29/00 ; testing receivers or transmitters of transmission systems H04B17/00
• CPC Class Codes: G01R 31/52 Testing for short-circuits, leakage current or ground faults

Abstract

An electrical test device may include a power supply, a conductive probe element, and a spectral analysis block. The conductive probe element may be energized by a power supply. The probe element may be placed in contact with an electrical system under test and apply an input signal containing current for measuring at least one parameter of the electrical system. The spectral analysis block may be connected to the probe element and may receive an output signal from the electrical system in response to the application of the current to the electrical system. The spectral analysis block may analyze frequency spectra of the output signal and detect a broadband increase in energy of the frequency spectra above a predetermined energy threshold. The broadband increase in energy may be representative of the occurrence of arcing in the electrical system.

Claims

1. An electrical test device, comprising:

a power supply connected to an external power source;

a single conductive probe element configured to be placed in contact with an electrical path of an electrical system and energized by the power supply for applying to the electrical path a current of relatively low-amperage; and

a processor connected to the probe element and being configured to receive an output signal from the electrical path and determine a first voltage across the electrical path in response to the low-amperage current;

the single conductive probe element being configured to apply a relatively high-amperage current pulse to the electrical path, the processor being configured to determine a second voltage across the electrical path in response to application of the high-amperage current pulse, the high-amperage current pulse being of greater magnitude than the low-amperage current;

the processor being configured to determine a voltage drop across the electrical path based on the difference between the first voltage and the second voltage.

2. The electrical test device of claim 1, wherein:

the electrical path has a normal operating range; and

the processor being configured to prevent the application of the high-amperage current pulse to the electrical path when the first voltage is outside of the normal operating range.

3. The electrical test device of claim 1, wherein:

the electrical path comprises a power feed having a high-voltage side and a low-voltage side;

the probe element being configured to be placed in contact with the low-voltage side; and

the probe element being configured to sink current into the test device during application of the relatively high-amperage current pulse.

4. The electrical test device of claim 1, wherein:

the electrical path comprises a power ground having a high-voltage side and a low-voltage side;

the probe element being configured to be placed in contact with the high-voltage side; and

the probe element being configured to source current into the electrical path during application of the relatively high-amperage current pulse.

5. The electrical test device of claim 1, wherein:

the processor being configured to determine an electrical resistance of the electrical path based on the voltage drop.

6. A method of measuring a voltage drop in a relatively low-impedance electrical path, comprising the steps of:

placing a single conductive probe element in contact with the electrical path;

energizing the probe element from an power supply;

applying, using the probe element, a relatively low-amperage current to the electrical path;

determining, using the processor, a first voltage across the electrical path in response to the application of the low-amperage current;

applying, using the probe element, a relatively high-amperage current pulse to the electrical path, the high-amperage current pulse being of greater magnitude than the low-amperage current;

determining, using the processor, a second voltage across the electrical path in response to the application of the high-amperage current pulse; and

determining, using the processor, a voltage drop across the electrical path based on the difference between the first voltage and the second voltage.

7. The method of claim 6, further comprising the step of:

indicating, using an indicating device, the voltage drop across the electrical path.

8. The method of claim 7 wherein the electrical path has a normal operating range, the method further comprising the step of:

preventing the application of the high-amperage current pulse to the electrical path when the first voltage is outside of the normal operating range.

9. The method of claim 7 wherein the electrical path comprises a power feed having a high-voltage side and a low-voltage side, the method further comprising the steps of:

placing the probe element in contact with the low-voltage side; and

sinking current from the electrical path into the test device during application of the current pulse.

10. The method of claim 7 wherein the electrical path comprises a power ground having a high-voltage side and a low-voltage side, the method further comprising the steps of:

placing the probe element in contact with the high-voltage side; and

sourcing current from the test device into the electrical path during application of the current pulse.