Method and system for object reconstruction

• US 9,066,084 B2
• Filed: 02/11/2013
• Issued: 06/23/2015
• Est. Priority Date: 10/11/2005
• Status: Active Grant

• Current Assignee: Apple Inc.
• Original Assignee: Apple Inc.
• Inventors: Zalevsky, Zeev, Shpunt, Alexander, Maizels, Aviad, Garcia, Javier
• Primary Examiner(s): DONAGHUE, LARRY D
• Application Number:
  US13/763,738
• Publication Number:
  US 20130155195A1
• Time in Patent Office: 862 Days
• US Class Current: 1/1
• CPC Class Codes: G01B 11/162 by speckle- or shearing interferometry
• CPC Class Codes: G01B 11/2441 using interferometry
• CPC Class Codes: G01B 11/2513 with several lines being projected in more than one direction, e.g. grids, patterns
• CPC Class Codes: G06T 2207/10012 Stereo images
• CPC Class Codes: G06T 2207/20056 Discrete and fast Fourier transform, [DFT, FFT]
• CPC Class Codes: G06T 7/521 from laser ranging, e.g. using interferometry; from the projection of structured light
• CPC Class Codes: H01L 23/528 Geometry or layout of the interconnection structure H01L27/0207 takes precedence; algorithms G06F30/00
• CPC Class Codes: H01L 23/535 including internal interconnections, e.g. cross-under constructions internal lead connections H01L23/481
• CPC Class Codes: H01L 29/0688 characterised by the particular shape of a junction between semiconductor regions
• CPC Class Codes: H01L 29/42328 with at least one additional gate other than the floating gate and the control gate, e.g. program gate, erase gate or select gate
• CPC Class Codes: H01L 29/788 with floating gate H01L29/78391 takes precedence
• CPC Class Codes: H01L 2924/0002 Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
• CPC Class Codes: H04N 13/20 Image signal generators
• CPC Class Codes: H04N 13/254 in combination with electromagnetic radiation sources for illuminating objects
• CPC Class Codes: H10B 41/10 characterised by the top-view layout
• CPC Class Codes: H10B 41/35 with a cell select transistor, e.g. NAND

Abstract

A system and method are presented for use in the object reconstruction. The system comprises an illuminating unit, and an imaging unit (see FIG. 1). The illuminating unit comprises a coherent light source and a generator of a random speckle pattern accommodated in the optical path of illuminating light propagating from the light source towards an object, thereby projecting onto the object a coherent random speckle pattern. The imaging unit is configured for detecting a light response of an illuminated region and generating image data. The image data is indicative of the object with the projected speckles pattern and thus indicative of a shift of the pattern in the image of the object relative to a reference image of said pattern. This enables real-time reconstruction of a three-dimensional map of the object.

Claims

1. A system for object reconstruction, comprising:

an illuminating unit, comprising a coherent light source and a generator of a random pattern comprising a diffractive optical element (DOE) in an optical path of illuminating light propagating from the light source toward an object, thereby projecting the random pattern onto an object;

an imaging unit configured to detect a light response of an illuminated region and generating image data indicative of the object within the projected pattern; and

a processor, configured to reconstruct a three-dimensional (3D) map of the object responsively to a shift of the pattern in the image data relative to a reference image of the pattern.

2. The system according to claim 1, wherein the reference image is acquired at a reference plane oriented normally to the optical path of the illuminating light.

3. The system according to claim 2, wherein the reference plane is at the same distance from the generator of the random pattern and from the imaging unit.

4. The system according to claim 1, wherein the processor is configured to reconstruct the 3D map by determining a correlation between the image data and the reference image.

5. The system according to claim 1, wherein the DOE is configured to adjust a brightness variation of the projected pattern between different regions in a field of view of the imaging unit.

6. The system according to claim 1, wherein the projected pattern comprises a Fourier transform of the DOE.

7. The system according to claim 1, wherein the imaging unit comprises a single light detector having a stationary field of view.

8. A method for object reconstruction, comprising:

projecting onto an object a random pattern formed by a coherent light source and a generator of the random pattern comprising a diffractive optical element (DOE) in an optical path of illuminating light propagating from the light source toward the object;

detecting a light response of an illuminated region and generating image data indicative of the object within the projected pattern; and

processing the image data so as to reconstruct a three-dimensional (3D) map of the object responsively to a shift of the pattern in the image data relative to a reference image of the pattern.

9. The method according to claim 8, wherein the reference image is acquired at a reference plane oriented normally to the optical path of the illuminating light.

10. The method according to claim 9, wherein the reference plane is at the same distance from the generator of the random pattern and from an imaging unit that detects the light response.

11. The method according to claim 8, wherein processing the image data comprises reconstructing the 3D map by determining a correlation between the image data and the reference image.

12. The method according to claim 8, wherein the DOE is configured to adjust a brightness variation of the projected pattern between different regions in a field of view of the imaging unit.

13. The method according to claim 8, wherein the projected pattern comprises a Fourier transform of the DOE.

14. The method according to claim 8, wherein detecting the light response comprises capturing an image using a single light detector having a stationary field of view.