System and method for multiplex spectroscopic imaging
First Claim
1. A system for measuring a sample, the system comprising:
- a) an illumination source adapted to provide electromagnetic radiation pulses at a selected temporal frequency;
b) a microscope adapted to focus the provided electromagnetic radiation onto the sample, so that resultant electromagnetic radiation is produced by an interaction of the provided electromagnetic radiation with the sample;
c) a plurality of optical sensors;
d) a disperser adapted to disperse wavelengths of the resultant electromagnetic radiation onto the plurality of optical sensors; and
e) a plurality of resonant amplifiers corresponding to respective ones of the optical detectors, each resonant amplifier operative to amplify signals having the selected temporal frequency.
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Accused Products
Abstract
A system for measuring an sample includes an illumination source providing electromagnetic radiation pulses at a selected temporal frequency. A microscope focuses the radiation to interact with the sample and produce resultant electromagnetic radiation. A disperser disperses wavelengths of the resultant radiation onto optical sensors, and respective resonant amplifiers amplify signals having the selected temporal frequency. Optical detection apparatus includes the optical sensors, resonant amplifiers, and disperser. The resonant amplifiers amplify portion(s) of their inputs having a selected temporal frequency and attenuate other portion(s). A method of analyzing constituents of a sample includes contemporaneously irradiating the sample with narrowband light and broadband light, the optical power of either modulated at a selected temporal frequency; dispersing wavelengths of resultant light across the optical detectors; and filtering respective signals from the optical detectors to provide spectrum data including signals corresponding to the selected temporal frequency.
10 Citations
18 Claims
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1. A system for measuring a sample, the system comprising:
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a) an illumination source adapted to provide electromagnetic radiation pulses at a selected temporal frequency; b) a microscope adapted to focus the provided electromagnetic radiation onto the sample, so that resultant electromagnetic radiation is produced by an interaction of the provided electromagnetic radiation with the sample; c) a plurality of optical sensors; d) a disperser adapted to disperse wavelengths of the resultant electromagnetic radiation onto the plurality of optical sensors; and e) a plurality of resonant amplifiers corresponding to respective ones of the optical detectors, each resonant amplifier operative to amplify signals having the selected temporal frequency. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. Optical detection apparatus, comprising:
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a) a plurality of optical sensors configured to provide respective electrical signals corresponding to respective incident electromagnetic radiation; b) a plurality of resonant amplifiers corresponding to respective optical detectors, each resonant amplifier operative to amplify portion(s) of the respective electrical signal having a selected temporal frequency and to attenuate portion(s) of the respective electrical signal not having the selected temporal frequency; and c) a disperser adapted to receive light and distribute a respective selected portion of an optical bandwidth of the received light to each of the plurality of optical sensors. - View Dependent Claims (10, 11)
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12. A method of analyzing constituents of a sample, the method comprising:
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contemporaneously irradiating the sample with incident radiation including narrowband light and broadband light; while irradiating the sample, modulating optical power of the narrowband light or the broadband light at a selected temporal frequency; dispersing wavelengths of resultant light from the sample across a plurality of optical detectors; and filtering respective signals from the optical detectors to provide a spectrum dataset of the sample, the spectrum dataset including signals corresponding to the selected temporal frequency. - View Dependent Claims (13, 14, 15, 16, 17, 18)
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Specification