Spintronic phase comparator permitting direct phase probing and mapping of electromagnetic signals

• US 9,069,034 B2
• Filed: 06/17/2011
• Issued: 06/30/2015
• Est. Priority Date: 06/30/2010
• Status: Expired due to Fees

• Current Assignee: University of Manitoba
• Original Assignee: University of Manitoba
• Inventors: Hu, Can-Ming, Wirthmann, Andre, Fan, Xiaolong, Gui, Yongsheng
• Primary Examiner(s): Assouad, Patrick
• Assistant Examiner(s): FETZNER, TIFFANY A
• Application Number:
  US13/163,551
• Publication Number:
  US 20120001656A1
• Time in Patent Office: 1,474 Days
• Field of Search: 324300-322, 324/244, 324248-250, 324/260, 324/645, 324/646, 600407-435, 382128-131, 257/15, 257/14, 257/20, 257/428, 250/287, 327/3, 29/82
• US Class Current: 1/1
• CPC Class Codes: G01R 33/1284 Spin resolved measurements; Influencing spins during measurements, e.g. in spintronics devices G01R33/093 takes precedence; semiconductor devices using spin polarized carriers H01L29/66984
• CPC Class Codes: H03D 13/00 Circuits for comparing the phase or frequency of two mutually-independent oscillations measuring phase G01R25/00; phase-discriminators with yes/no output G01R25/005
• CPC Class Codes: H05K 3/30 Assembling printed circuits with electric components, e.g. with resistor
• CPC Class Codes: Y10T 29/4913 Assembling to base an electrical component, e.g., capacitor, etc.

Abstract

An apparatus, system, and method for phase detection of electromagnetic signals are presented. The apparatus may include a magnetic element, one or more first signal contacts coupled to the magnetic element for receiving a first signal, and one or more output contacts coupled to the magnetic element for providing a variable level voltage generated by the magnetic element, the level of the voltage being responsive to a phase difference between the first signal and a second signal. In a further embodiment, the apparatus may include a substrate for mechanically supporting the magnetic element. Additionally, the apparatus may include a conductor mechanically supported by substrate, the conductor configured to receive the second signal.

Claims

1. A spintronic phase comparator apparatus comprising:

a magnetic element;

a first signal source;

a second signal source;

one or more first signal contacts, coupled to the magnetic element configured for receiving a first signal generated from the first signal source, along with a second signal generated from the second signal source;

one or more output contacts, coupled to the magnetic element, configured for providing a variable level voltage generated by the magnetic element, the level of the voltage being responsive to a phase difference between the first signal and the second signal; and

storing the variable level voltage, as an output voltage of the spintronic phase comparator.

2. The spintronic phase comparator apparatus of claim 1, further comprising a substrate configured for mechanically supporting the magnetic element.

3. The spintronic phase comparator apparatus of claim 2, further comprising a conductor mechanically supported by the substrate, the conductor configured to receive the second signal.

4. The spintronic phase comparator apparatus of claim 3, further comprising an electrical insulator positioned in order to separate the conductor from the magnetic element.

5. The spintronic phase comparator apparatus of claim 4, where the electrical insulator is configured to electrically insulate the magnetic element from the conductor.

6. The spintronic phase comparator apparatus of claim 4, where the electrical insulator further comprises silicon dioxide (SiO₂).

7. The spintronic phase comparator apparatus of claim 3, further comprising one or more second signal contacts coupled to the conductor, the second signal contacts being configured to receive the second signal.

8. The spintronic phase comparator apparatus of claim 1, where the electrical conductor is copper.

9. The spintronic phase comparator apparatus of claim 1, where the electrically insulating substrate comprises silicon.

10. The spintronic phase comparator apparatus of claim 1, where the magnetic element has the magneto-resistance including at least one of anisotropic magneto-resistance, giant magneto-resistance, and tunneling magneto-resistance.

11. The spintronic phase comparator apparatus of claim 1, where the magnetic element comprises a Ferro magnet.

12. The spintronic phase comparator apparatus of claim 1, where a permalloy comprises the magnet element.

13. The spintronic phase comparator apparatus of claim 1, where the magnetic element comprises a ferromagnetic semiconductor material.

14. The spintronic phase comparator apparatus of claim 1, where the magnetic element comprises an electrically conductive material.

15. The spintronic phase comparator apparatus of claim 1, where the first signal and the second signal are both each electromagnetic signals having a frequency in the range of 0.1 GHz to 200 GHz.

16. A spintronic phase comparator system comprising:

a first signal source configured to provide a first signal;

a second signal source configured to provide a second signal; and

a phase comparator device comprising;

a magnetic element supported on a substrate;

one or more first signal contacts, coupled to the magnetic element, that are configured for receiving a first signal;

one or more output contacts, coupled to the magnetic element, that are configured for providing a variable level voltage generated by the magnetic element, the level of the voltage being responsive to a phase difference between the first signal and the second signal; and

storing the variable level voltage, as an output voltage of the spintronic phase comparator.

17. The spintronic phase comparator system of claim 16, further comprising a meter coupled to the spintronic phase comparator that is configured to measure the variable level voltage generated by the magnetic element.

18. The spintronic phase comparator system of claim 16, further comprising a conductor mechanically supported by the substrate, the conductor also being configured to receive the second signal.

19. The spintronic phase comparator system of claim 18, further comprising an electrical insulator positioned in order to separate the conductor from the magnetic element.

20. The spintronic phase comparator system of claim 19, where the electrical insulator is configured to electrically insulate the magnetic element from the conductor.

21. The spintronic phase comparator system of claim 19, where the electrical insulator further comprises silicon dioxide (SiO₂).

22. The spintronic phase comparator system of claim 18, further comprising one or more second signal contacts that are coupled onto the conductor, with the second signal contacts being configured to receive the second signal.

23. The spintronic phase comparator system of claim 16, where the electrical conductor is copper.

24. The spintronic phase comparator system of claim 16, where the electrically insulating substrate comprises silicon.

25. The spintronic phase comparator system of claim 16, where the first signal and the second signal are both each electromagnetic signals having a frequency in the range of 0.1 GHz to 200 GHz.

26. The spintronic phase comparator system of claim 16, further comprising a signal generator as the signal source that is configured for providing the first signal.

27. The spintronic phase comparator system of claim 16, where the second signal source comprises electromagnetic radiation that is either reflected or transmitted by an object in the near field.

28. The spintronic phase comparator system of claim 16, where the second signal source comprises electromagnetic radiation that is either reflected or transmitted by an object in the far field.

29. The spintronic phase comparator system of claim 16, further comprising a processing device configured to determine a dielectric function of an object in response to a phase difference between the first signal and the second signal, where the second signal comprises electromagnetic radiation reflected by the object.

30. The spintronic phase comparator system of claim 16, further comprising a processing device configured to determine a homogeneity of an object in response to a phase difference between the first signal and the second signal, where the second signal comprises electromagnetic radiation reflected by the object.

31. The spintronic phase comparator system of claim 16, further comprising an external magnetic field source for applying an external magnetic field to the phase comparator device.

32. A spintronic method of phase comparison that compares electromagnetic signals, using a spintronic phase comparator, the method comprising:

receiving a first signal from a first signal source at a magnetic element;

receiving a second signal from a second signal source; and

generating, with the magnetic element, a variable level voltage, the level of the voltage being responsive to a phase difference between the first signal and a second signal; and

storing the generated variable level voltage as an output voltage of the spintronic phase comparator.

33. The spintronic method of claim 32, further comprising measuring the voltage generated by the magnetic element before the variable level voltage is stored as an output voltage of the spintronic phase comparator.

34. The spintronic method of claim 33, further comprising repeatedly quantifying a phase difference between the first signal and the second signal in response to the variable voltage level being generated by the magnetic element as the first and second signals occur over time with the spintronic phase comparator.

35. The spintronic method of claim 32, where the second signal source comprises electromagnetic radiation that is being reflected by an object in the near field.

36. The spintronic method of claim 32, where the second signal source comprises electromagnetic radiation that is being reflected by an object in the far field.

37. A spintronic phase comparator method of manufacturing a spintronic phase comparator device, the method comprising:

providing a substrate;

providing a magnetic element coupled onto the substrate;

forming one or more first signal contacts, coupled to the magnetic element, configured for receiving a first signal generated from a first signal source, along with a second signal generated from a second signal source;

forming one or more output contacts, coupled to the magnetic element, that is/are configured for providing a variable level voltage, the level of the voltage being responsive to a phase difference between the first signal and the second signal; and

storing the variable level voltage, as an output voltage of the spintronic phase comparator.

38. The spintronic phase comparator method of claim 37, further comprising providing a conductor coupled onto the electrically insulating substrate, the conductor being configured in order to receive the second signal from the second signal source.

39. The spintronic phase comparator method of claim 38, further comprising forming an electrical insulator positioned in order to separate the conductor from the magnetic element.

40. The spintronic phase comparator method of claim 38, further comprising forming one or more second signal contacts coupled onto the conductor, whereby the second signal contacts are configured in order to receive the second signal from the second signal source.