Methods and devices for optically determining a characteristic of a substance

• US 9,080,943 B2
• Filed: 04/26/2012
• Issued: 07/14/2015
• Est. Priority Date: 04/26/2012
• Status: Active Grant

• Current Assignee: Halliburton Energy Services Incorporated (Halliburton Company)
• Original Assignee: Halliburton Energy Services Incorporated (Halliburton Company)
• Inventors: Freese, Robert, Jones, Christopher Michael, Perkins, David, Simcock, Michael, Soltmann, William
• Primary Examiner(s): PYO, KEVIN K
• Application Number:
  US13/456,327
• Publication Number:
  US 20130284898A1
• Time in Patent Office: 1,174 Days
• Field of Search: 250/208.2, 250/226, 250/221, 250/222.1, 250/573, 250/574, 356/73, 356/432, 356/435, 356/436, 356/442
• US Class Current: 1/1
• CPC Class Codes: G01J 2003/1213 Filters in general, e.g. dichroic, band
• CPC Class Codes: G01J 3/0232 using shutters
• CPC Class Codes: G01J 3/36 Investigating two or more bands of a spectrum by separate detectors
• CPC Class Codes: G01J 3/42 Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry beam switching arrangements G01J3/08
• CPC Class Codes: G01N 21/17 Systems in which incident light is modified in accordance with the properties of the material investigated where the material investigated is optically excited causing a change in wavelength of the incident light G01N21/63
• CPC Class Codes: G01N 21/31 Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry G01N21/72 takes precedence
• CPC Class Codes: G06E 3/001 Analogue devices in which mathematical operations are carried out with the aid of optical or electro-optical elements optical elements per se G02B; devices consisting of a plurality of solid state components, including light sensitive semiconductor components, formed in or on a common substrate H01L27/14; electro-, magneto- or acousto-optics, non-linear optics G02F1/00; graph reading G06K11/00

Abstract

Optical computing devices are disclosed. One exemplary optical computing device includes an electromagnetic radiation source configured to optically interact with a sample and at least two integrated computational elements. The at least two integrated computational elements may be configured to produce optically interacted light, and at least one of the at least two integrated computational elements may be configured to be disassociated with a characteristic of the sample. The optical computing device further includes a first detector arranged to receive the optically interacted light from the at least two integrated computational elements and thereby generate a first signal corresponding to the characteristic of the sample.

Claims

1. A method of determining a desired characteristic of a sample, comprising:

optically interacting an electromagnetic radiation source with the sample and at least two integrated computational elements, wherein at least one of the at least two integrated computational elements is configured to be disassociated with the desired characteristic of the sample and to return a regression vector associated with a second characteristic of the sample different from the desired characteristic of the sample, and wherein at least one of the at least two integrated computational elements comprises at least two adjacent layers of material having different indices of refraction;

producing optically interacted light from the at least two integrated computational elements;

receiving with at least one detector the optically interacted light from the at least two integrated computational elements, thereby generating a first signal and a second signal; and

computationally combining the first and second signals to determine the desired characteristic of the sample.

2. The method of claim 1, wherein each of the first and second integrated computational elements is configured to be disassociated with the desired characteristic of the sample.

3. The method of claim 1, wherein the at least one detector computationally combines the first and second signals.

4. The method of claim 1, wherein the at least one detector is a first detector, the method further comprising:

detecting with a second detector electromagnetic radiation from the electromagnetic radiation source;

generating a third signal with the second detector, the third signal being indicative of electromagnetic radiating deviations;

receiving the third signal with a signal processor communicably coupled to the first and second detectors; and

computationally combining the third signal with the first and second signals to normalize the first and second signals.

5. The method of claim 1, further comprising rotating the at least two first and second integrated computational elements within a movable assembly configured for rotation, the at least two integrated computational elements being radially disposed within the movable assembly.

6. The method of claim 5, further comprising:

optically interacting the electromagnetic radiation source with at least one neutral element radially disposed within the movable assembly for rotation therewith; and

producing a compensating signal indicative of radiating deviations of the electromagnetic radiation source.

7. The method of claim 6, further comprising:

receiving with the at least one detector the compensating signal; and

computationally combining the compensating signal with the first and second signals in order to compensate for electromagnetic radiating deviations.

8. The method of claim 1, further comprising oscillating the at least two first and second integrated computational elements as arranged on a linear array.

16. The method of claim 1, wherein receiving with at least one detector the optically interacted light comprises receiving a portion of the optically interacted light transmitted through at least one of the at least two integrated computational elements.

17. The method of claim 1, wherein receiving with at least one detector the optically interacted light comprises receiving a portion of the optically interacted light reflected from at least one of the at least two integrated computational elements.

18. The method of claim 1, wherein receiving with at least one detector the optically interacted light comprises receiving a first portion of the optically interacted light transmitted through a first of the at least two integrated computational elements with a first detector, and receiving a second portion of the optically interacted light reflected from a second of the at least two integrated computational elements with a second detector.

19. The method of claim 1, further comprising interacting the electromagnetic radiation optically interacted with the sample with a third integrated computational element that returns a regression vector associated with a third characteristic of the sample, the third characteristic of the sample being different from the desired characteristic of the sample and from the second characteristic of the sample.

20. The method of claim 1, wherein interacting an electromagnetic radiation with the sample and at least two integrated computational elements comprises interacting the electromagnetic element with three integrated computational elements, the three integrated computational elements configured to be disassociated with the desired characteristic of the sample.

9. A method of determining a desired characteristic of a sample, comprising:

optically interacting an electromagnetic radiation source with a sample and at least two integrated computational elements, wherein at least one of the at least two integrated computational elements comprises at least two adjacent layers of material having different indices of refraction;

producing optically interacted light from the at least two integrated computational elements, wherein at least one of the at least two integrated computational elements is configured to be disassociated with the desired characteristic of the sample and return a regression vector associated with a second characteristic of the sample different from the desired characteristic of the sample; and

receiving with at least one detector the optically interacted light from the at least two integrated computational elements, thereby generating a first signal corresponding to the desired characteristic of the sample.

10. The method of claim 9, wherein each of the first and second integrated computational elements is configured to be disassociated with the desired characteristic of the sample.

11. The method of claim 10, further comprising:

detecting with a second detector electromagnetic radiation from the electromagnetic radiation source; and

generating a second signal indicative of electromagnetic radiating deviations with the second detector.

12. The method of claim 11, further comprising:

receiving the first and second signals with a signal processor communicably coupled to the first and second detectors; and

computationally combining the first and second signals to normalize the first signal.

13. A method of determining a desired characteristic of a sample, comprising:

optically interacting electromagnetic radiation radiated from the sample with at least two integrated computational elements, wherein at least one of the at least two integrated computational elements comprises at least two adjacent layers of material having different indices of refraction;

producing optically interacted light from the at least two integrated computational elements, at least one of the at least two integrated computational elements being configured to be disassociated with the desired characteristic of the sample and to return a regression vector associated with a second characteristic of the sample different from the desired characteristic of the sample; and

receiving with at least one detector the optically interacted light from the at least two integrated computational elements, thereby generating a first signal corresponding to the desired characteristic of the sample.

14. The method of claim 13, wherein each of the first and second integrated computational elements is configured to be disassociated with the desired characteristic of the sample.

15. The method of claim 13, further comprising acting upon the sample mechanically, magnetically, or electrically in order to emit the electromagnetic radiation from the sample.