Methods and systems for point of use removal of sacrificial material
First Claim
1. A sensor, comprising:
- an array of chemically-sensitive field effect transistors (chemFETs), each chemFET in the array having a floating gate structure including an upper surface;
a dielectric layer over the upper surfaces of the floating gate structures of the chemFETs in the array, the dielectric layer including cavities extending to the upper surfaces of the floating gate structures and corresponding to sensing surfaces of the chemFETs;
a conformal protective layer over the sensing surfaces, sidewalls of the cavities, and top surface of the array.
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Accused Products
Abstract
A method of manufacturing a sensor, the method including forming an array of chemically-sensitive field effect transistors (chemFETs), depositing a dielectric layer over the chemFETs in the array, depositing a protective layer over the dielectric layer, etching the dielectric layer and the protective layer to form cavities corresponding to sensing surfaces of the chemFETs, and removing the protective layer. The method further includes, etching the dielectric layer and the protective layer together to form cavities corresponding to sensing surfaces of the chemFETs. The protective layer is at least one of a polymer, photoresist material, noble metal, copper oxide, and zinc oxide. The protective layer is removed using at least one of sodium hydroxide, organic solvent, aqua regia, ammonium carbonate, hydrochloric acid, acetic acid, and phosphoric acid.
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Citations
7 Claims
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1. A sensor, comprising:
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an array of chemically-sensitive field effect transistors (chemFETs), each chemFET in the array having a floating gate structure including an upper surface; a dielectric layer over the upper surfaces of the floating gate structures of the chemFETs in the array, the dielectric layer including cavities extending to the upper surfaces of the floating gate structures and corresponding to sensing surfaces of the chemFETs; a conformal protective layer over the sensing surfaces, sidewalls of the cavities, and top surface of the array. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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Specification