Resistance measurement system and method of using the same

• US 9,085,464 B2
• Filed: 03/07/2012
• Issued: 07/21/2015
• Est. Priority Date: 03/07/2012
• Status: Active Grant

• Current Assignee: Applied NanoStructured Solutions, LLC (Cabot Corporation)
• Original Assignee: Applied NanoStructured Solutions, LLC (Cabot Corporation)
• Inventors: Malecki, Harry C., Gaigler, Randy L., Fleischer, Corey A., Liu, Han, Malet, Brandon K., Markkula, Samuel J.
• Primary Examiner(s): Gambetta, Kelly M
• Application Number:
  US13/414,669
• Publication Number:
  US 20130236631A1
• Time in Patent Office: 1,231 Days
• Field of Search: 427/248.1, 427/249.1, 427/8, 324/693, 428/292.1, 428/293.4, 428/297.4
• US Class Current: 1/1
• CPC Class Codes: B82Y 30/00 Nanotechnology for materials or surface science, e.g. nanocomposites
• CPC Class Codes: B82Y 35/00 Methods or apparatus for measurement or analysis of nanostructures
• CPC Class Codes: B82Y 40/00 Manufacture or treatment of nanostructures
• CPC Class Codes: C01B 32/15 Nano-sized carbon materials
• CPC Class Codes: G01N 27/04 by investigating resistance

Abstract

A quality control system for the manufacture of carbon nanostructure-laden substrates includes a resistance measurement module for continuously measuring resistance of the carbon nanostructure (CNS)-laden substrate.

Claims

1. A quality control system for the manufacture of carbon nanostructure-laden fibers or fabrics comprising a resistance measurement module configured to receive a carbon nanostructure (CNS)-laden fiber or fabric in motion for continuously measuring resistance of the CNS-laden fiber or fabric as the CNS-laden fiber or fabric moves across the resistance measurement module, wherein:

the resistance measurement module comprises at least a two point conductive contact with the CNT-laden fiber or fabric,

the two point conductive contact is configured to modulate tension on the CNS-laden fiber or fabric over the two point conductive contact as the CNS-laden fiber or fabric moves across the resistance measurement module, and

the two point conductive contact is configured to be in contact with different positions of the CNS-laden fiber or fabric as the CNS-laden fiber or fabric moves across the resistance measurement module.

2. The system of claim 1, wherein the resistance measurement module is configured to measure resistance via an electric field or inductive based measurement.

3. The system of claim 1, wherein the CNS-laden fiber or fabric is configured to be fed continuously to the resistance measurement module from a CNS growth module, the CNS growth module configured to continuously synthesize CNSs on a substrate precursor.

4. The system of claim 3, further equipped with a feedback module, the feedback module configured to receive an output from the resistance measurement module;

the feedback module being optionally in electronic communication with the CNS growth module and being capable of signaling a change in at least one growth condition in the CNS growth module.

5. The system of claim 4, wherein the at least one growth condition is selected from temperature, a partial pressure of a carbon feedstock gas, a partial pressure of an inert gas, linespeed, and combinations thereof.

6. The system of claim 4, wherein the feedback module is configured to provide information to an operator in the form of a data log.

7. The system of claim 6, wherein the data log indicates pass/fail criteria for quality control.

8. The system of claim 7, wherein pass/fail criteria comprises a measurement of CNS loading on the CNS-laden fiber or fabric.

9. The system of claim 1, the at least a two point conductive contact comprising four point conductive contacts, wherein an outer pair of contacts is configured to deliver a current, and an inner pair is configured to measure a voltage.

10. The system of claim 9, wherein the four point contact comprises conductive rollers allowing the advancement the CNS-laden fiber or fabric to a collection mandrel.

11. The system of claim 9, one or more further contacts disposed between the outer pair configured to take multiple voltage measurements.

12. The system of claim 9, wherein the four point conductive contacts are co-linear.

13. The system of claim 9, wherein the four point conductive contacts are staggered.

14. The system of claim 9, wherein the distance between a first and second contact and a third and fourth contact are larger, individually, than the distance between the second contact and the third contact.

19. The system of claim 1, wherein the two point conductive contact is configured to move along the CNS-laden fiber or fabric.

15. A method comprising:

continuously synthesizing carbon nanostructures (CNSs) on a fiber or fabric in a CNS growth chamber to provide a moving CNS-laden fiber or fabric;

continuously receiving, over at least a two point conductive contact, the moving CNS-laden fiber or fabric exiting a distal end of the growth chamber, wherein the two point conductive contact modulates tension on the moving CNS-laden fiber or fabric over the two point conductive contact; and

continuously monitoring resistance of the moving CNS-laden fiber or fabric;

wherein the two point conductive contact is configured to be in contact with different positions of the CNS-laden fiber or fabric as the CNS-laden fiber or fabric is moving.

16. The method of claim 15, wherein continuously monitoring the resistance of the moving CNS-laden fiber or fabric comprises applying an electric field to the moving CNS-laden fiber or fabric.

17. The method of claim 15, wherein continuously monitoring the resistance of the moving CNS-laden fiber or fabric comprises applying a current to the moving CNS-laden fiber or fabric and measuring at least one voltage.

18. The method of claim 15, further comprising altering growth conditions in the CNS growth chamber in response to a threshold resistance measurement.

20. The method of claim 15, wherein the continuously monitoring comprises continuously measuring the resistance of the moving CNS-laden fiber or fabric across a length between the two point conductive contact.