Spectroscopic sensors
First Claim
1. A sensor, comprising:
- a circuit board comprising an electronic processor;
a plurality of radiation sources, each source being mounted directly to the circuit board; and
a spectral detector attached to the circuit board, the spectral detector being configured to analyze radiation derived from one or more of the plurality of radiation sources,wherein the plurality of radiation sources comprises a short-distance source positioned at a distance of 9 mm or less from the detector, and at least two long-distance sources each positioned at different distances at least 10 mm from the detector; and
wherein during operation of the sensor, the electronic processor is configured to;
select one of the at least two long-distance sources by;
(i) exposing a subject to incident radiation produced by one of the long-distance sources;
(ii) measuring reflected or transmitted radiation from the subject using the spectral detector;
(iii) repeating (i) and (ii) for each of the long-distance sources to generate spectral information corresponding to each of the long-distance sources;
(iv) comparing the spectral information for each of the long-distance sources to expected peak information to determine which ones of the long-distance sources are suitable for illumination of the subject; and
(v) selecting one of the suitable long-distance sources from (iv) based on acquisition times associated with the spectral information corresponding to each of the suitable long-distance sources;
expose the subject to incident radiation from the short-distance source and from the selected long-distance source and use the spectral detector to measure radiation from the subject corresponding to illumination by the short-distance source and the selected long-distance source; and
analyze the measured radiation to determine one or more properties of the subject.
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Accused Products
Abstract
Disclosed herein are sensors that include: (a) a circuit board that includes an electronic processor; (b) a plurality of radiation sources, each source being attached to the circuit board; and (c) a spectral detector attached to the circuit board, the spectral detector being configured to analyze radiation derived from one or more of the plurality of radiation sources. During use, the sensors are configured to be worn on a portion of a body of a subject. The electronic processor is configured to cause two or more of the plurality of radiation sources to direct incident radiation to the subject, to cause the spectral detector to analyze radiation from the subject, and to determine one or more properties of the subject based on the radiation from the subject. Methods of making and using these sensors are also disclosed.
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Citations
20 Claims
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1. A sensor, comprising:
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a circuit board comprising an electronic processor; a plurality of radiation sources, each source being mounted directly to the circuit board; and a spectral detector attached to the circuit board, the spectral detector being configured to analyze radiation derived from one or more of the plurality of radiation sources, wherein the plurality of radiation sources comprises a short-distance source positioned at a distance of 9 mm or less from the detector, and at least two long-distance sources each positioned at different distances at least 10 mm from the detector; and wherein during operation of the sensor, the electronic processor is configured to; select one of the at least two long-distance sources by; (i) exposing a subject to incident radiation produced by one of the long-distance sources; (ii) measuring reflected or transmitted radiation from the subject using the spectral detector; (iii) repeating (i) and (ii) for each of the long-distance sources to generate spectral information corresponding to each of the long-distance sources; (iv) comparing the spectral information for each of the long-distance sources to expected peak information to determine which ones of the long-distance sources are suitable for illumination of the subject; and (v) selecting one of the suitable long-distance sources from (iv) based on acquisition times associated with the spectral information corresponding to each of the suitable long-distance sources; expose the subject to incident radiation from the short-distance source and from the selected long-distance source and use the spectral detector to measure radiation from the subject corresponding to illumination by the short-distance source and the selected long-distance source; and analyze the measured radiation to determine one or more properties of the subject. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. A sensor, comprising:
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a flexible mounting member comprising an adhesive surface configured to attach directly to a sample and to assume a shape corresponding to at least a portion of the sample when it attaches to the sample; a rigid mounting member connected to the flexible mounting member; and a plurality of radiation sources, a spectral detector, and an electronic processor mounted to the rigid mounting member, wherein the plurality of radiation sources comprises a short-distance source positioned at a distance of 9 mm or less from the detector, and at least two long-distance sources positioned at a different distances at least 10 mm from the detector; and wherein during operation of the sensor, the electronic processor is configured to; select one of the at least two long-distance sources by; (i) exposing the sample to incident radiation produced by one of the long-distance sources; (ii) measuring reflected or transmitted radiation from the sample using the spectral detector; (iii) repeating (i) and (ii) for each of the long-distance sources to generate spectral information corresponding to each of the long-distance sources; (iv) comparing the spectral information for each of the long-distance sources to expected peak information to determine which ones of the long-distance sources are suitable for illumination of the sample; and (v) selecting one of the suitable long-distance sources from (iv) based on acquisition times associated with the spectral information corresponding to each of the suitable long-distance sources; expose the sample to incident radiation from the short-distance source and from the selected long-distance source and use the spectral detector to measure radiation from the sample corresponding to illumination by the short-distance source and the selected long-distance source; and analyze the measured radiation to determine one or more properties of the sample. - View Dependent Claims (13, 14)
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15. A method for measuring one or more sample properties, the method comprising:
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selecting one of a plurality of long-distance radiation sources of a sensor, wherein each of the long-distance sources is positioned at a different distance at least 10 mm from a detector of the sensor, wherein the selecting comprises; (i) exposing the sample to incident radiation produced by one of the long-distance sources; (ii) measuring reflected or transmitted radiation from the sample; (iii) repeating (i) and (ii) for each of the long-distance sources to generate spectral information corresponding to each of the long-distance sources; (iv) comparing the spectral information for each of the long-distance sources to expected peak information to determine which ones of the long-distance sources are suitable for illumination of the sample; and (v) selecting one of the suitable long-distance sources from (iv) based on acquisition times associated with the spectral information corresponding to each of the suitable long-distance sources; exposing the sample to incident radiation from a short-distance source positioned at a distance of 9 mm or less from the detector and from the selected long-distance source, and measuring radiation from the sample corresponding to illumination by the short-distance source and the selected long-distance source; and analyzing the measured radiation to determine one or more sample properties. - View Dependent Claims (16, 17, 18, 19, 20)
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Specification