Measurement system of a light source in space
First Claim
Patent Images
1. A measurement system comprising,at least one imaging device composed of a plurality of sensitive pixels disposed in at least one dimension;
- at least one punctual light source;
at least one component configured to cast a shadow on the imaging device, the position of the component being fixed with respect to the imaging device, the component being composed of repetitive patterns realized on a planar surface including a distinctive element, the component being configured to cast a shadow made of repetitive patterns and made of a distinctive element, the imaging device being configured to record an image of said shadow; and
computation means;
wherein the repetitive patterns are repeated at regular space intervals, and the computation means is configured to compute the elevation of the light source from the position of the distinctive element present in said image, andwherein the computation means is configured to modify the computed elevation of the light source from the position of the repetitive patterns present in said image.
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Abstract
A system measures the position of a light source in space using an imager and transparent surface with a pattern on top. The pattern consists of a repetitive pattern and a distinctive element. The system achieves sub-micron precision. It also handles the measurement of several light sources simultaneously, and the measurement of the position of a retroreflector instead of the light.
18 Citations
25 Claims
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1. A measurement system comprising,
at least one imaging device composed of a plurality of sensitive pixels disposed in at least one dimension; -
at least one punctual light source; at least one component configured to cast a shadow on the imaging device, the position of the component being fixed with respect to the imaging device, the component being composed of repetitive patterns realized on a planar surface including a distinctive element, the component being configured to cast a shadow made of repetitive patterns and made of a distinctive element, the imaging device being configured to record an image of said shadow; and computation means; wherein the repetitive patterns are repeated at regular space intervals, and the computation means is configured to compute the elevation of the light source from the position of the distinctive element present in said image, and wherein the computation means is configured to modify the computed elevation of the light source from the position of the repetitive patterns present in said image. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17)
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18. A method for the measurement of the position of a light source, for implementing a measurement system including
at least one imaging device composed of a plurality of sensitive pixels disposed in at least one dimension, at least one punctual light source, at least one component configured to cast a shadow on the imaging device, the position of the component being fixed with respect to the imaging device, the component being composed of repetitive patterns realized on a planar surface including a distinctive element, the component being configured to cast a shadow made of repetitive patterns and made of a distinctive element, and computation means, the method comprising: -
recording, by the imaging device, the image of the shadow; and computing, using the image of the shadow, the position of the shadow with respect to the component, wherein the repetitive patterns are repeated at regular space intervals, the computation means are configured to compute the elevation of the light source from the position of the distinctive element present in said image, the computation means being configured to modify the computed elevation of the light source from the position of the repetitive patterns present in said image, the imaging device is composed of a plurality of sensitive pixels disposed in two dimensions, the computation means are configured to compute the elevation along the first dimension and the elevation along the second dimension of the light source from the repetitive patterns and from the distinctive element present in said image, the computation of the elevation value along the first dimension or the elevation value along the second dimension, or both at the same time, uses at least 80% of said pixels that record said image of the shadow, and the elevation of the light source or of a retroreflector along the first dimension and along the second dimension of the imaging device is computed using the position of the shadow. - View Dependent Claims (19, 20, 21, 22, 23, 24, 25)
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Specification