Systems and methods for improved power control in millimeter wave transceivers

• US 9,103,873 B1
• Filed: 03/01/2013
• Issued: 08/11/2015
• Est. Priority Date: 03/01/2013
• Status: Active Grant

• Current Assignee: Anritsu Corporation
• Original Assignee: Anritsu Corporation
• Inventors: Tu, Jamie, Martens, Jon S, Noujeim, Karam M, Roberts, Thomas H
• Primary Examiner(s): Koval, Melissa
• Assistant Examiner(s): Farrow, Felicia
• Application Number:
  US13/782,707
• Time in Patent Office: 893 Days
• Field of Search: 324538-727, 324 7639- 7663, 342368-374
• US Class Current: 1/1
• CPC Class Codes: G01R 27/28 Measuring attenuation, gain, phase shift or derived characteristics of electric four pole networks, i.e. two-port networks; Measuring transient response in line transmission systems H04B3/46
• CPC Class Codes: G01R 31/28 Testing of electronic circuits, e.g. by signal tracer EMC, EMP or similar testing of electronic circuits G01R31/002; testing for short-circuits, discontinuities, leakage or incorrect line connection G01R31/50; checking computers or computer components G06F11/00; checking static stores for correct operation G11C29/00 ; testing receivers or transmitters of transmission systems H04B17/00

Abstract

In an embodiment, a system for measuring high frequency response of a DUT having improved power leveling includes a signal source, a modulator, an upconverter, and a leveling loop having dynamic gain adjustment. The signal source generates a test signal and the modulator modulates the amplitude of the generated test signal to target a requested power. The converter multiplies a frequency of the test signal. The leveling loop is configured to detect an intermediate frequency (IF) signal generated in response to the upconverted test signal. Modulation of the amplitude of the generated test signal by the modulator is adjustable based on the IF signal detected by the leveling loop.

Claims

1. A system for measuring high frequency response of a device under test having improved power leveling, comprising:

a signal source configured to generate a test signal comprising a radio frequency (RF) signal; and

a fine modulator configured to modulate an amplitude of the generated test signal, wherein the amplitude of the test signal is targeted based on a requested power;

an upconverter configured to multiply a frequency of the test signal;

a fine leveling loop configured to detect an intermediate frequency (IF) signal generated in response to the upconverter test signal, wherein modulation of the amplitude of the generated test signal by the modulator is adjustable based on the IF signal detected by the leveling loop; and

wherein the leveling loop includes dynamic gain adjustment; and

a coarse modulator; and

a coarse leveling loop configured to detect the modulated test signal propagating between the modulator and the upconverter, wherein the modulation of the amplitude of the generated test signal by the coarse modulator is adjustable based on power of the modulated test signal detected by the coarse leveling loop;

wherein the signal source is connectable with one or both of the coarse modulator and the fine modulator to modulate the generated test signal.

2. The system of claim 1, wherein the dynamic gain adjustment includes a nonlinear element allowing loop gain to change with controlled signal amplitude.

3. The system of claim 1, wherein the leveling loop includes a downconverter configured to downconvert the upconverted test signal to the IF signal detected by the fine leveling loop.

4. A system for measuring high frequency response of a device under test having improved power leveling, comprising:

a signal source configured to generate a test signal comprising a radio frequency (RF) signal; and

a modulator configured to modulate an amplitude of the generated test signal,

wherein the amplitude of the test signal is targeted based on a requested power;

an upconverter configured to multiply a frequency of the test signal;

a fine leveling loop configured to detect an intermediate frequency (IF) signal generated in response to the upconverted test signal, wherein modulation of the amplitude of the generated test signal by the modulator is adjustable based on the IF signal detected by the fine leveling loop; and

wherein the fine leveling loop includes dynamic gain adjustment; and

a coarse leveling loop configured to detect the modulated test signal propagating between the modulator and the upconverter, wherein modulation of the amplitude of the generated test signal by the modulator is adjustable based on power of the modulated test signal detected by the coarse leveling loop; and

wherein the coarse leveling loop includes dynamic gain adjustment.

5. The system of claim 4, wherein the coarse leveling loop is connectable with the modulator to initially level the amplitude of the generated test signal, and wherein the fine leveling loop is connectable with the modulator and the coarse leveling loop is disconnectable from the modulator to subsequently level the amplitude of the generated test signal.

6. The system of claim 4, wherein the coarse leveling loop is connectable with the modulator in a first mode to level the amplitude of the generated test signal for a frequency-converting device under test, and the fine leveling loop is connectable with the modulator in a second mode to level the amplitude of the generated test signal for a non-frequency-converting device under test.

7. A system for measuring high frequency response of a device under test having improved power leveling, comprising:

a transceiver including a signal source configured to generate a test signal comprising a radio frequency (RF) signal;

a modulator configured to modulate an amplitude of the test signal, wherein the amplitude of the test signal is targeted based on a requested power;

an upconverter configured to multiply a frequency of the test signal;

a first signal path between the transceiver and the upconverter;

a second signal path between the upconverter and a port connectable with the device under test;

a first leveling loop connectable with the modulator and configured to detect the modulated test signal as the modulated test signal propagates along the first signal path, wherein when connected to the first leveling loop, the modulator adjusts the amplitude of the generated test signal based on a comparison of power of the modulated test signal detected by the first leveling loop with the requested power; and

a second leveling loop connectable with the modulator and configured to detect an intermediate frequency (IF) signal generated in response to the upconverted test signal as the upconverted test signal propagates along the second signal path, wherein when connected to the second leveling loop, the modulator adjusts the amplitude of the generated test signal based on the IF signal detected by the second leveling loop;

wherein the first leveling loop and the second leveling loop each include dynamic gain adjustment.

8. The system of claim 7, wherein the first leveling loop is connectable with the modulator to initially adjust the modulation of the generated test signal, and wherein the first leveling loop is disconnectable from the modulator and the second leveling loop is connectable with the modulator to subsequently adjust the modulation of the generated test signal.

9. The system of claim 7, wherein the first leveling loop is connectable with the modulator in a first mode to adjust the modulation of the generated test signal for a frequency converting device under test, and the second leveling loop is connectable with the modulator in a second mode to adjust the modulation of the generated test signal for a non-frequency converting device under test.

10. The system of claim 7, wherein the second leveling loop includes a downconverter configured to downconvert the upconverted test signal so that modulation of the amplitude of the generated test signal is adjustable based on a comparison of power of the downconverted signal with the requested power.

11. The system of claim 7, wherein the first leveling loop detects the modulated test signal by coupling the modulated test signal to the first leveling loop along the first signal path;

and wherein the second leveling loop detects the IF signal by coupling the upconverted test signal to the second leveling loop along the second signal path.

12. The system of claim 7, wherein the dynamic gain adjustment of the first leveling loop and the second leveling loop includes a nonlinear element allowing loop gain to change with controlled signal amplitude.

13. The system of claim 7, wherein the upconverter includes at least one multiplier.

14. A method of leveling power in a system having a signal source, at least one modulator, and an upconverter for measuring high frequency response of a device under test, comprising:

generating a test signal comprising a radio frequency (RF) signal using the signal source, wherein an amplitude of the generated test signal is targeted based on a requested power;

modulating the amplitude of the generated test signal;

detecting the modulated test signal using a coarse leveling loop;

adjusting the modulation of the generated test signal based on a comparison of power of the modulated test signal as detected by the coarse leveling loop with the requested power;

upconverting the modulated test signal using an upconverter;

detecting an intermediate frequency (IF) signal generated in response to the upconverted test signal using a fine leveling loop; and

refining the adjustment of the modulation of the generated test signal based on a comparison of power of the IF signal as detected by the fine leveling loop with the requested power.

15. The method of claim 14, further comprising:

connecting the coarse leveling loop to a coarse modulator;

coupling the modulated test signal to the coarse leveling loop;

adjusting the modulation of the generated test signal by the coarse modulator based on a comparison of power of the modulated test signal as detected by the coarse leveling loop with the requested power;

connecting the fine leveling loop to a fine modulator;

coupling the upconverted test signal to the fine leveling loop; and

downconverting the upconverted test signal to the IF signal using a downconverter;

adjusting the modulation of the generated test signal by the fine modulator based on a comparison of power of the IF signal as detected by the fine leveling loop with the requested power.

16. A method of leveling power in a system for measuring high frequency response of a device under test, comprising:

generating a test signal using a transceiver, wherein an amplitude of the generated test signal is targeted based on a requested power;

modulating the amplitude of the generated test signal using a modulator;

upconverting the modulated test signal to a millimeter wave frequency using an upconverter;

for a first type of device under test

connecting a first leveling loop to the modulator,

detecting the modulated test signal using the first leveling loop, and

adjusting the amplitude of the generated test signal based on a comparison of power of the modulated test signal as detected by the first leveling loop with the requested power; and

for a second type of device under test

connecting a second leveling loop to the modulator,

detecting an intermediate frequency (IF) signal generated in response to the upconverted test signal using the second leveling loop, and

adjusting the amplitude of the generated test signal based on the IF signal.

17. The method of claim 16, wherein the first type of device under test is a frequency converting device under test and the second type of device under test is a non-frequency converting device under test.