Method for scan testing three-dimensional chip

• US 9,103,878 B2
• Filed: 04/17/2013
• Issued: 08/11/2015
• Est. Priority Date: 04/17/2012
• Status: Expired due to Fees

• Current Assignee: Tsinghua University
• Original Assignee: Tsinghua University
• Inventors: Xiang, Dong, Shen, Kele
• Primary Examiner(s): Parihar, Suchin
• Application Number:
  US14/394,296
• Publication Number:
  US 20150074478A1
• Time in Patent Office: 846 Days
• Field of Search: 716/136
• US Class Current: 1/1
• CPC Class Codes: G01R 31/3173 Marginal testing
• CPC Class Codes: G01R 31/318513 Test of Multi-Chip-Moduls
• CPC Class Codes: G01R 31/318536 Scan chain arrangements, e.g. connections, test bus, analog signals

Abstract

A method for scan testing a three-dimensional chip, comprising: establishing a scan forest structure for the three-dimensional chip; generating a first test set and a plurality of test periods, and dividing the first test set into a plurality of test subsets; distributing test vectors in the plurality of test subsets into the plurality of test periods; obtaining a current hotspot of the three-dimensional chip; ranking the plurality of test subsets in accordance with an order of temperature rising values from small to large to obtain a test vector strategy; selecting the test subsets corresponding to the temperature rising values less than a temperature threshold from the plurality of test subsets according to the test vector strategy, so as to generate a second test set; and applying the second test set to the scan forest structure, and updating the current hotspot of the three-dimensional chip.

Claims

1. A method for scan testing a three-dimensional chip, comprising steps of:

establishing a scan forest structure for the three-dimensional chip, wherein the scan forest structure comprises a plurality of scan input ports and a plurality of scan tree structures corresponding to the plurality of scan input ports, each of the plurality of scan tree structures comprises a plurality of scan chains, and scan triggers in a same scan chain have different successors;

generating a first test set and a plurality of test periods, and dividing the first test set into a plurality of test subsets;

distributing test vectors in the plurality of test subsets into the plurality of test periods;

obtaining a current hotspot of the three-dimensional chip;

obtaining a plurality of temperature rising values of the current hotspot corresponding to the plurality of test subsets respectively according to the scan forest structure, and ranking the plurality of test subsets in accordance with an order of the temperature rising values from small to large to obtain a test vector strategy;

selecting the test subsets corresponding to the temperature rising values less than a temperature threshold from the plurality of test subsets according to the test vector strategy, so as to generate a second test set; and

applying the second test set to the scan forest structure for scan testing the three-dimensional chip, and updating the current hotspot of the three-dimensional chip.

2. The method according to claim 1, wherein establishing the scan forest structure comprises:

dividing the three-dimensional chip into a plurality of sub-circuits, in which each of the plurality of sub-circuits is corresponding to each layer of the scan forest structure;

setting a scan input port of the scan forest structure, a depth of the scan forest structure and a number of the scan tree structures; and

creating the plurality of scan tree structures according to the scan input port, the depth of the scan forest structure and the number of the scan tree structures.

3. The method according to claim 2, wherein establishing the plurality of scan tree structures comprises:

setting levels and layers of each of the plurality of scan tree structures;

setting the scan trigger for each level of the scan tree structure, in which each layer of the scan tree structure comprises a plurality of levels of scan triggers, adjacent levels of scan triggers are connected correspondingly, and adjacent layers of scan triggers are connected through Si vias.

4. The method according to claim 3, wherein each scan input port is configured to drive some of the plurality of scan chains, in which each of the plurality of scan chains have a plurality of scan triggers and the scan triggers of each scan chain are in a same layer of the scan tree structure.

5. The method according to claim 4, wherein a first level of scan trigger in the scan tree structure is the scan trigger nearest to the scan input port.

6. The method according to claim 1, wherein the test vector strategy comprises a pre-binding test strategy and a post-binding test strategy.

7. The method according to claim 6, wherein when the test vector strategy is the pre-binding test strategy, generating a second test set comprises:

obtaining a first scan input power consumption, a first scan output power consumption and a first capture period power consumption;

calculating a first test power consumption according to the first scan input power consumption, the first scan output power consumption and the first capture period power consumption;

setting a first preset temperature threshold according to the first test power consumption and ranking the plurality of test subsets in accordance with the order of the temperature rising values of the hotspot from small to large; and

selecting the test subsets corresponding to the temperature rising values less than the first preset temperature threshold to generate the second test set.

8. The method according to claim 6, wherein when the test vector strategy is the post-binding test strategy, generating the second test set comprises:

obtaining a second scan input power consumption, a second scan output power consumption and a second capture period power consumption;

calculating a second test power consumption according to the second scan input power consumption, the second scan output power consumption and the second capture period power consumption;

setting a second preset temperature threshold according to the second test power consumption and ranking the test vectors in each layer of test subset in the scan tree structure in accordance with the order of temperature rising values of the hotspot from small to large;

selecting the test vectors corresponding to the temperature rising values less than the second preset temperature threshold to generate the second test set.

9. The method according to claim 7, wherein a number of the plurality of test periods is determined by a running time of a central processing unit of the three-dimensional chip and the current hotspot.

10. The method according to claim 1, further comprising:

obtaining an initial temperature of the three-dimensional chip by a temperature analyzer.

11. The method according to claim 8, wherein a number of the plurality of test periods is determined by a running time of a central processing unit of the three-dimensional chip and the current hotspot.