Method for operating non-volatile memory device and memory controller

• US 9,117,536 B2
• Filed: 11/25/2013
• Issued: 08/25/2015
• Est. Priority Date: 12/05/2012
• Status: Active Grant

• Current Assignee: Samsung Electronics Co. Ltd.
• Original Assignee: Samsung Electronics Co. Ltd.
• Inventors: Yoon, Hyun Jun, Jeong, Jaeyong, Choi, Myung-Hoon, Park, Kitae
• Primary Examiner(s): Tran, Michael
• Application Number:
  US14/088,511
• Publication Number:
  US 20140153330A1
• Time in Patent Office: 638 Days
• Field of Search: 365/185.03, 365/185.24
• US Class Current: 1/1
• CPC Class Codes: G11C 11/5642 Sensing or reading circuits; Data output circuits
• CPC Class Codes: G11C 16/0483 comprising cells having several storage transistors connected in series
• CPC Class Codes: G11C 16/26 Sensing or reading circuits; Data output circuits
• CPC Class Codes: G11C 16/3404 Convergence or correction of memory cell threshold voltages; Repair or recovery of overerased or overprogrammed cells
• CPC Class Codes: G11C 16/3422 Circuits or methods to evaluate read or write disturbance in nonvolatile memory, without steps to mitigate the problem

Abstract

An operating method for a non-volatile memory device includes applying first and second read voltages to a first word line to perform a read operation; counting first memory cells each having a threshold voltage belonging to a first voltage range between the first read voltage and the second read voltage; applying a third read voltage to the first word line sequentially after applying the second read voltage to count second memory cells each having a second threshold voltage belonging to a voltage range between the second read voltage and the third read voltage; comparing the number of first memory cells counted and the number of second memory cells counted; determining a fourth read voltage based on a result of the comparing; and applying the fourth read voltage to the first word line sequentially after applying the third read voltage.

Claims

1. A method of operating a non-volatile memory device, the method comprising:

employing a voltage generator to apply first and second read voltages to a first word line of the memory device to perform a read operation;

counting first memory cells of the memory device each having a threshold voltage belonging to a first voltage range between the first read voltage and the second read voltage;

employing the voltage generator to apply a third read voltage to the first word line sequentially after applying the second read voltage to count second memory cells of the memory device each having a threshold voltage belonging to a second voltage range between the second read voltage and the third read voltage;

comparing a number of the first memory cells counted and a number of the second memory cells counted;

determining a fourth read voltage based on a result of the comparing; and

employing the voltage generator to apply the fourth read voltage to the first word line sequentially after applying the third read voltage.

2. The method of claim 1, wherein when the number of the second memory cells is less than the number of the first memory cells, the fourth read voltage is determined to be less than the third read voltage.

3. The method of claim 1, further comprising:

employing the voltage generator to apply a fifth read voltage, less than the fourth read voltage, to the first word line after applying of the fourth read voltage.

4. The method of claim 3, further comprising:

employing the voltage generator to apply a sixth read voltage, less than the fifth read voltage, to the first word line after applying of the fifth read voltage.

5. The method of claim 1, wherein when the number of the second memory cells is more than the number of the first memory cells, the fourth read voltage is determined to be greater than the third read voltage.

6. The method of claim 5, further comprising:

employing the voltage generator to apply a fifth read voltage, greater than the fourth read voltage, to the first word line after applying of the fourth read voltage.

7. The method of claim 6, further comprising:

employing the voltage generator to apply a sixth read voltage, greater than the fifth read voltage, to the first word line after applying of the fifth read voltage.

8. A method of controlling a memory device, the method comprising:

counting first memory cells of the memory device each having a threshold voltage belonging to a first voltage range between a first read voltage and a second read voltage;

counting second memory cells of the memory device each having a threshold voltage belonging to a second voltage range between the second read voltage and a third read voltage;

comparing a number of the first memory cells counted and a number of the second memory cells counted; and

determining a fourth read voltage to be applied to memory cells of the memory device sequentially after the third read voltage based on a comparison result.

9. The method of claim 8, wherein when the number of the second memory cells is less than the number of the first memory cells, the fourth read voltage is determined to be less than the third read voltage.

10. The method of claim 9,

wherein when the fourth read voltage is determined to be less than the third read voltage, a fifth read voltage to be applied sequentially after the fourth read voltage is determined to be less than the fourth read voltage.

11. The method of claim 8, wherein when the number of the second memory cells is more than the number of the first memory cells, the fourth read voltage is determined to be greater than the third read voltage.

12. The method of claim 11, wherein if the fourth read voltage is determined to be greater than the third read voltage, a fifth read voltage to be applied sequentially after the fourth read voltage is determined to be greater than the fourth read voltage.

13. The method of claim 8, wherein the number of the first memory cells is counted by performing a logical operation on a read result by using the first read voltage and a read result by using the second read voltage.

14. A method, comprising:

counting first memory cells of a memory device each having a threshold voltage belonging to a first voltage range between a first read voltage and a second read voltage;

counting second memory cells of the memory device each having a threshold voltage belonging to a second voltage range between the second read voltage and a third read voltage;

comparing a number of the first memory cells counted and a number of the second memory cells counted to produce a comparison result; and

determining, based on the comparison result, a third voltage range for counting memory cells of the memory device having a threshold voltage belonging to the third voltage range.

15. The method of claim 14, wherein when the third read voltage is less than the first read voltage and the number of the second memory cells is less than the number of the first memory cells, then the third voltage range is determined to span a set of voltages which are less than the second read voltage, and when the third read voltage is less than the first read voltage and the number of the second memory cells is greater than the number of the first memory cells, then the third voltage range is determined to span a set of voltages which are greater than the second read voltage.

16. The method of claim 14, wherein when the third read voltage is greater than the first read voltage and the number of the second memory cells is less than the number of the first memory cells, then the third voltage range is determined to span a set of voltages which are greater than the second read voltage, and when the third read voltage is greater than the first read voltage and the number of the second memory cells is greater than the number of the first memory cells, then the third voltage range is determined to span a set of voltages which are less than the second read voltage.

17. The method of claim 14, wherein the counting the first memory cells each having a threshold voltage belonging to the first voltage range between the first read voltage and the second read voltage comprises:

employing a voltage generator to apply the first read voltage to the memory cells and reading first data values from each of the memory cells;

employing a voltage generator to apply the second read voltage to the memory cells and reading second data values from each of the memory cells;

exclusive OR-ing the first data values and the second data values to produce an output indicating whether threshold voltages of each of the memory cells are between the first read voltage and the second read voltage.

18. The method of claim 14, further comprising finding a valley in a threshold voltage distribution of the memory cells by iteratively changing voltage ranges and counting numbers of memory cells each having a threshold voltage belonging to each of the changed voltage ranges.