Method for manufacturing semiconductor device using oxide semiconductor
First Claim
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1. A method for manufacturing a semiconductor device, comprising the steps of:
- forming an insulating film;
forming an amorphous oxide semiconductor film over the insulating film;
performing a first heat treatment on the amorphous oxide semiconductor film;
forming a gate insulating film over the amorphous oxide semiconductor film;
adding oxygen into the amorphous oxide semiconductor film on which the first heat treatment is performed by an ion implantation method, an ion doping method, or a plasma immersion ion implantation method wherein the oxygen is added to the amorphous oxide semiconductor film through the gate insulating film;
forming an aluminum oxide film over the amorphous oxide semiconductor film containing added oxygen; and
performing a second heat treatment on the amorphous oxide semiconductor film containing added oxygen to form an oxide semiconductor film including a crystal,wherein the amorphous oxide semiconductor film has a more uniform amorphous state by the step of adding the oxygen.
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Abstract
Stable electrical characteristics and high reliability are provided to a semiconductor device including an oxide semiconductor. In a process of manufacturing a transistor including an oxide semiconductor film, an amorphous oxide semiconductor film is formed, and oxygen is added to the amorphous oxide semiconductor film, so that an amorphous oxide semiconductor film containing excess oxygen is formed. Then, an aluminum oxide film is formed over the amorphous oxide semiconductor film, and heat treatment is performed thereon to crystallize at least part of the amorphous oxide semiconductor film, so that a crystalline oxide semiconductor film is formed.
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Citations
11 Claims
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1. A method for manufacturing a semiconductor device, comprising the steps of:
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forming an insulating film; forming an amorphous oxide semiconductor film over the insulating film; performing a first heat treatment on the amorphous oxide semiconductor film; forming a gate insulating film over the amorphous oxide semiconductor film; adding oxygen into the amorphous oxide semiconductor film on which the first heat treatment is performed by an ion implantation method, an ion doping method, or a plasma immersion ion implantation method wherein the oxygen is added to the amorphous oxide semiconductor film through the gate insulating film; forming an aluminum oxide film over the amorphous oxide semiconductor film containing added oxygen; and performing a second heat treatment on the amorphous oxide semiconductor film containing added oxygen to form an oxide semiconductor film including a crystal, wherein the amorphous oxide semiconductor film has a more uniform amorphous state by the step of adding the oxygen. - View Dependent Claims (2, 3, 4, 5)
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6. A method for manufacturing a semiconductor device, comprising the steps of:
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forming an insulating film; forming an amorphous oxide semiconductor film over the insulating film; performing a first heat treatment on the amorphous oxide semiconductor film; forming an aluminum oxide film over the amorphous oxide semiconductor film; adding oxygen into the amorphous oxide semiconductor film on which the first heat treatment is performed through the aluminum oxide film by an ion implantation method, an ion doping method, or a plasma immersion ion implantation method; and performing a second heat treatment on the amorphous oxide semiconductor film containing added oxygen to form an oxide semiconductor film including a crystal, wherein the amorphous oxide semiconductor film has a more uniform amorphous state by the step of adding the oxygen. - View Dependent Claims (7, 8, 9, 10, 11)
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