DC-DC converter switching transistor current measurement technique

• US 9,124,174 B2
• Filed: 06/10/2013
• Issued: 09/01/2015
• Est. Priority Date: 06/30/2005
• Status: Active Grant

• Current Assignee: Micron Technology, Inc.
• Original Assignee: Micron Technology, Inc.
• Inventors: Schrom, Gerhard, Hazucha, Peter, De, Vivek K., Karnik, Tanay
• Primary Examiner(s): Zweizig, Jeffrey
• Application Number:
  US13/914,358
• Publication Number:
  US 20130271105A1
• Time in Patent Office: 813 Days
• US Class Current: 1/1
• CPC Class Codes: G01R 19/0092 measuring current only all subgroups of G01R19/00 take precedence
• CPC Class Codes: H02M 1/0009 Devices or circuits for detecting current in a converter
• CPC Class Codes: H02M 3/155 using semiconductor devices only

Abstract

A method is described comprising conducting a first current through a switching transistor. The method also comprises conducting a second current through a pair of transistors whose conductive channels are coupled in series with respect to each other and are together coupled in parallel across the switching transistor'"'"'s conductive channel. The second current is less than and proportional to the first current.

Claims

1. An apparatus, comprising:

a direct-current to direct-current (DC-to-DC) converter circuit including

a current measurement circuit having a first pair of transistors with respective channels of the first pair of transistors coupled in series, a drain of a first transistor of the first pair of transistors coupled to a first end of a conductive channel of a switching transistor, and a source of a second transistor of the first pair of transistors coupled to a second end of the channel of the switching transistor;

an amplifier having a measurement leg coupled to a node between the first pair of transistors; and

a second pair of transistors with respective channels of the second pair of transistor being coupled in parallel, a node between the second pair of transistors being coupled to a reference leg of the amplifier.

2. The apparatus of claim 1, further comprising one or more processors coupled to an output of the measurement leg of the amplifier to monitor current of the DC-to-DC converter circuit.

3. The apparatus of claim 2, wherein the one or more processors and the direct-current to direct-current converter circuit are formed on a single integrated circuit chip.

4. The apparatus of claim 1, wherein a first of the second pair of transistors has a gate coupled to both a gate of the first transistor of the first pair of transistors and a gate of the switching transistor.

5. The apparatus of claim 1, wherein a source of each of the second pair of transistors is tied to the switching transistor through a ground connection and the drains of each of the second pair of transistors are tied together.

6. The apparatus of claim 1, wherein the first pair of transistors and the second pair of transistors have similar doping profiles and gate lengths as the switching transistor.

7. The apparatus of claim 1, wherein the first pair of transistors and the second pair of transistors have different gate widths than the switching transistor.

8. The apparatus of claim 1, wherein the switching transistor is comprised of a parallel coupling of a plurality of similar small transistors.

9. The apparatus of claim 8, wherein the first pair of transistors and the second pair of transistors are implemented using four of the plurality of small transistors.

10. The apparatus of claim 1, wherein the first transistor of the first pair of transistors and a first transistor of the second pair of transistors each impose substantially the same resistance in the DC-to-DC converter circuit, the resistance being greater than a resistance imposed by a second transistor of the second pair of transistors.

11. A method, comprising:

conducting a first current through a switching transistor of a direct-current to direct-current (DC-to-DC) converter circuit; and

conducting a second current through a pair of transistors that are coupled to the switching transistor, the second current being less than and proportional to the first current, a common node of the pair of transistors being coupled to a measurement leg of an amplifier to produce an output signal for monitoring the first current.

12. The method of claim 11, further comprising selecting a proportionality constant between the second current through the pair of transistors and the first current through the switching transistor to be less than 1.

13. The method of claim 12, wherein the proportionality constant is selected to be within a range from about 0.0001 to about 0.01.

14. The method of claim 11, further comprising using one or more processors coupled to the measurement leg of the amplifier to monitor the first current through the switching transistor.

15. The method of claim 11, further comprising coupling a common node of a second pair of transistors to a reference input leg of the amplifier, the second pair of transistors being coupled to the source of the switching transistor.

16. The method of claim 11, wherein the pair of transistors has serially-coupled conductive channels, the pair of transistors passing the second current through the conductive channels, the pair of transistors being coupled in parallel across a conductive channel of the switching transistor.

17. The method of claim 11, wherein the first current is monitored without the use of a series resistance coupled in series with the switching transistor.

18. The method of claim 11, wherein the proportional second current through the first transistor of the pair of transistors affects an output signal on the measurement leg of the amplifier in proportion to the current through the switching transistor.

19. An apparatus to monitor current, the apparatus comprising:

a direct-current to direct-current (DC-to-DC) converter circuit including

one or more processors to monitor a current of the direct-current to direct-current converter circuit;

a current measurement circuit having a pair of transistors with respective channels of the pair of transistors coupled in series, a drain of a first transistor of the pair of transistors coupled to a first end of a conductive channel of a switching transistor, and a source of a second transistor of the pair of transistors coupled to a second end of a channel of the switching transistor; and

an amplifier having a measurement leg coupled to a node between the pair of transistors to receive a current from the pair of transistors that is smaller than and proportional to a drain-to-source current flowing through the switching transistor.

20. The apparatus of claim 19, further comprising a second pair of transistors having their respective conductive channels coupled in parallel, a source of each of the second pair of transistors being tied to the switching transistor through a ground connection, a node between the second pair of transistors being coupled to a reference leg of the amplifier.